Dynamic models of external capacitors to perform accurate EMC and ESD simulations

This paper presents a method to model external capacitors behavior face to continuous and transient events. Temperature and the physical dimensions of the capacitors have been considered in order to predict Electromagnetic Compatibility performances of an equipment or a system. The different tests were performed on ceramic capacitor series X7R from Murata. A model has been developed in Verilog-A. A correlation study between measurements and simulations have been carried out to ensure the accuracy of the model.