The design of current probe in the IEC conducted emission measurement above 1 GHz

A current probe based on IEC standard 61967-4 is proposed to investigate the conducted electromagnetic emission of IC above 1 GHz. The 1 Ω method in direct coupling method is revisited, and the concern for extending frequency range is discussed. The critical resistive network of 1 Ω probe is realized by a semiconductor process instead of the SMD resistors. With the advantage of reduced parasitic effect, the applicable bandwidth can be extended to 2.4 GHz. The proposed 1 Ω probe is verified to fulfill the EMI measurement of IC with operating frequency higher than 1 GHz.