Planar stochastic sources localization algorithm in EMC problems

A two dimensional localization algorithm for stochastic EMI sources based on time domain measurements of electromagnetic near-field tangential components is presented. The autocorrelation and cross-correlation functions obtained by using the two-point planar scanning system are used for the characterization of stochastic field distribution. The simulation and experimental data are processed for a spatial localization of equivalent point sources. The estimated field distributions and patterns are presented.