Characterization of scattered radiation profile in volumetric 64 slice CT scanner: Monte Carlo study using GATE

It is commonly understood that scattered radiation in X-ray computed tomography (CT) reduces the CT number and degrades the quality of reconstructed images. This effect is more pronounced in multi detector CT scanners with extended detector aperture mostly using cone-beam configurations, which are much less immune to scatter than fan-beam and single-slice CT scanners. To perform accurate scatter correction, it is essential to characterize scattered radiation in Volumetric CT. As characterization of scattered radiation behavior using experimental measurement is a difficult and time consuming approach, Monte Carlo simulation can be an ideal method. In this study we used Geant4-based simulation package, GATE, to model x-ray photon interactions in the phantom and detector. The Monte Carlo simulation was validated through comparison with experimental measurement data. Thereafter, the effect of different parameters such as tube voltage and phantom material on the scatter profile and Scatter to Primary Ratio (SPR) was calculated. We also compared the simulated SPR curves with experimental data which was measured with array blocker method. The experimental technique assumed to be the gold standard technique. The comparison between simulation and experimental data in SPR showed error less than 5 %. The results indicate that the GATE Monte Carlo code is a useful tool for investigation of scattered radiation characterization in CT scanners. Moreover, there is a possibility of take advantage of GATE for simulation of PET and CT scanners in order to simultaneously asses the contribution of scattered radiation in PET/CT scanners.