CMOS Silicon Physical Unclonable Functions Based on Intrinsic Process Variability | IEEE Journals & Magazine | IEEE Xplore

CMOS Silicon Physical Unclonable Functions Based on Intrinsic Process Variability


Abstract:

This paper presents an extreme-low-power mixed-signal CMOS integrated circuit for product identification and anti-counterfeiting, which implements a physical unclonable f...Show More

Abstract:

This paper presents an extreme-low-power mixed-signal CMOS integrated circuit for product identification and anti-counterfeiting, which implements a physical unclonable function operating with a challenge-response scheme. We devise a series of circuits and algorithmic solutions based on the use of a process monitor and on the prediction of the erratic response bits which allow to suppress the effects of temperature, voltage supply and process variations in order to obtain a robust and reliable behavior.
Published in: IEEE Journal of Solid-State Circuits ( Volume: 46, Issue: 6, June 2011)
Page(s): 1456 - 1463
Date of Publication: 29 April 2011

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