Effect of metal routing on the ESD robustness of dual-direction silicon controlled rectifier

Effect of metal routing on the robustness of silicon controlled rectifier (SCR) is studied for bi-direction electrostatic discharge (ESD) protection applications. Depending on the type of metal routing, different failure currents It2 can exist in the positive and negative directions due to the asymmetrical current conductions in the multi-finger dual-direction SCR. Transmission line pulsing (TLP) results are included in support of the analysis.