Direct measurement of the sensitivity distribution of magnetoresistive heads by the SXM technique

The sensitivity distribution of a magnetoresistive (MR) head was obtained by using a scanning probe microscope (SXM) technique. This technique made it possible to map with submicron resolution the sensitivity distribution on the air-bearing surface of the MR head in relation to the head structure. It was observed that the shape and location of the sensitivity distribution varied with changes in the sense current. Comparison with microtrack measurements showed qualitatively good agreements.<
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