Bunch Tracing by Bunch by Bunch Measurement System in HLS

In this paper, we introduce a bunch tracing system which is based on a bunch-by-bunch (BxB) measurement system in Hefei Light Source (HLS), and present the analysis of the experiment results. Using an in-phase gate signal and a double balance mixer to control an external trigger of ADC, we test the reliability of the BxB system. By this system, we can trace all marked bunches in a set time slot or in manual burst mode. We can record all bunches’ data during the injection, ramping, wiggler excitation and normal operation, and provide a powerful facility for machine study.