Influence of tilted geometries on critical current in superconducting thin films

We present measurements of the angular dependent critical current (J/sub c/) of DyBa/sub 2/Cu/sub 3/O/sub 7/ on single crystal SrTiO/sub 3/ and YBa/sub 2/Cu/sub 3/O/sub 7/ on tilted Ion Beam Assisted Deposition MgO substrate. These experiments demonstrate that J/sub c/ angular dependences of tilted defects are a useful tool to detect misalignments between the internal and applied magnetic fields. The results show that, in order to understand vortex pinning in thin anisotropic samples below certain value of magnetic field, this misalignment must be taken into account.