Issue 6 • Date Dec. 1988
Filter Results
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1988 IEEE Annual Conference on Nuclear and Space Radiation Effects Conference
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PDF (98 KB)
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Pulse power heating of the D-region
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PDF (800 KB)
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Dose and energy dependence of interface trap formation in cobalt-60 and X-ray environments
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PDF (452 KB)
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From substrate to VLSI: investigation of hardened SIMOX without epitaxy, for dose, dose rate and SEU phenomena
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PDF (460 KB)
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The susceptibility of electrodeless quartz crystal BVA resonators to proton ionization effects
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PDF (396 KB)
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An SEU-hardened CMOS data latch design
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PDF (440 KB)
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Radiation environment of HERMES III
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PDF (512 KB)
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Measurements of off-axis energy deposition form 100 MeV electrons traversing water and liquid nitrogen
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PDF (356 KB)
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Interface-state measurement on SOS using the charge-pumping technique on gated-diode test structures
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PDF (544 KB)
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The state-of-the-art in SOI technology
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PDF (252 KB)
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Annealing of total dose damage: redistribution of interface state density on [100], [110] and [111] orientation silicon
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PDF (476 KB)
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Generic impulse response function for MOS systems and its application to linear response analysis
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PDF (764 KB)
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A radiation hard frequency reference IC
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PDF (260 KB)
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Aims & Scope
IEEE Transactions on Nuclear Science focuses on all aspects of the theory and application of nuclear science and engineering, including instrumentation, high-energy physics,reactor controls, and radiation effects.
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Editor-in-Chief
Paul Dressendorfer
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Albuquerque, NM 87111 USA


