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IEEE Transactions on Reliability

Issue 2 • Date Jun 1995

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Displaying Results 1 - 25 of 27
  • Estimating the number of errors in a system using a martingale approach

    Publication Year: 1995, Page(s):322 - 326
    Cited by:  Papers (4)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (308 KB)

    A new, efficient procedure estimates the number of errors in a system. A known number of seeded errors are inserted into a system. The failure intensities of the seeded and real errors are allowed to be different and time dependent. When an error is detected during the test, it is removed from the system. The testing process is observed for a fixed amount of time τ. Martingale theory is used t... View full abstract»

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  • Vertex cutsets of undirected graphs

    Publication Year: 1995, Page(s):347 - 353
    Cited by:  Papers (7)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (520 KB)

    This paper deals with the enumeration of all minimal s-t vertex cutsets separating two vertices (source and terminal) in an undirected graph. The problem is handled by direct-enumeration based on a necessary and sufficient condition for a set of vertices to be a minimal vertex cutset. The algorithm thus does not enumerate paths or basic paths as a first step. This approach has yielded an algorithm... View full abstract»

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  • Self-repairing processor modules

    Publication Year: 1995, Page(s):327 - 332
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (500 KB)

    A processor is any self-contained computer of at least personal-computer capability. The paper explores how much the processor mean time-to-failure can be improved by replacing it with an N-processor module, where each processor in the module consists of a copy of the original processor augmented with a communication protocol unit. The copy of the original processor is faulty with probability, p View full abstract»

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  • A note on state-space decomposition methods for analyzing stochastic flow networks

    Publication Year: 1995, Page(s):354 - 357
    Cited by:  Papers (12)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (336 KB)

    Consider a flow network with single source s and single sink t with demand d>0. Assume that the nodes do not restrict flow transmission and the arcs have finite random discrete capacities. This paper has two objectives: (1) it corrects errors in well-known algorithms by Doulliez and Jamoulle (1972) for (a) computing the probability that the demand is satisfied (or network reliability), (b) the ... View full abstract»

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  • Mean time to finish a randomly disturbed 2-phase mission

    Publication Year: 1995, Page(s):310 - 314
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (240 KB)

    This paper shows the average time to finish a mission consisting of a sequence of two noninterruptible phases of deterministic, given lengths, when after a short disturbance the interrupted phase has to be restarted. Disturbances, e.g., intermittent faults, are modeled according to a renewal point-process. In order to overcome limitations of Markov modeling, this point process need not be Poisson.... View full abstract»

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  • A system approach to reliability and life-cycle cost of process safety-systems

    Publication Year: 1995, Page(s):179 - 186
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (696 KB)

    An analytic method, PDS, allows the designer to assess the cost effectiveness of computer-based process safety-systems based on a quantification of reliability and life-cycle cost. Using PDS in early system design, configurations and operating philosophies can be identified in which the reliability of field devices and logic control units is balanced from a safety and an economic point of view. Wh... View full abstract»

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  • Quality engineering (Taguchi methods) for the development of electronic circuit technology

    Publication Year: 1995, Page(s):225 - 229
    Cited by:  Papers (24)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (372 KB)

    Most technology development engineers use traditional reliability engineering methods to calibrate the objective functions of their new systems to meet various marketing requirements. These methods are marginally effective in reducing failure rates. To fundamentally improve quality, the engineers need to focus on improving the robustness of the basic functions of their new product or process techn... View full abstract»

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  • Genetic algorithms in optimization of system reliability

    Publication Year: 1995, Page(s):172 - 178
    Cited by:  Papers (58)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (580 KB)

    After initial production, improvements are often made to components of a system, to upgrade system performance; for example, when designing a later version or release. This paper presents an optimization model that identifies the types of component improvements and the level of effort spent on those improvements to maximize one or more performance measures (e.g., system reliability or availability... View full abstract»

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  • Homogeneity tests for scale parameters of 2-parameter exponential populations under time censoring

    Publication Year: 1995, Page(s):297 - 301
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (304 KB)

    Comparing two or more scale parameters of exponential distributions is often important in life-testing problems. This paper considers tests for the equality of several exponential scale parameters in presence of unspecified location parameters based on time-censored data. Using a conditional approach, various test statistics are derived. The Monte Carlo studies were carried out for comparing the p... View full abstract»

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  • Best linear unbiased estimator of the Rayleigh scale parameter based on fairly large censored samples

    Publication Year: 1995, Page(s):302 - 309
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (656 KB)

    This paper tabulates: coefficients and relative s-efficiency of the best linear unbiased estimator (BLUE) of the scale parameter of the Rayleigh distribution for type II censored samples of size N=20(5)40, r=0(1)4 (number of observations censored from the left) and s=0(1)4 (number of observations censored from the right); and ranks, coefficients, variances, and relative s-efficiencies of the BLUE ... View full abstract»

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  • A combined fuzzy-logic and physics-of-failure approach to reliability prediction

    Publication Year: 1995, Page(s):237 - 242
    Cited by:  Papers (5)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (384 KB)

    An original reliability prediction procedure is presented. The physics of failure accounts for the failure mechanisms involved (a lognormal distribution was presumed); the interactions (synergies) between the technology factors depending on the manufacturing techniques are considered. The basis of this methodology (called SYRP=synergetic reliability prediction) is the assessment of failure-risk co... View full abstract»

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  • Optimal design of flexible and reliable process systems

    Publication Year: 1995, Page(s):243 - 250
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (560 KB)

    In the design and operation of chemical process systems, two categories of uncertainty are important: (1) realization of continuous process parameters (product demands, feedstock qualities, reaction kinetics); and (2) discrete states (typically related to equipment availability). This paper presents a general framework for incorporating both types of uncertainty in process system design. A combine... View full abstract»

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  • Using statistically designed experiments to improve reliability and to achieve robust reliability

    Publication Year: 1995, Page(s):206 - 215
    Cited by:  Papers (7)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (788 KB)

    This tutorial explains statistically designed experiments which provide a proactive means to improve reliability as advocated by Genichi Taguchi. That is, by systematic experimentation, the important parameters (factors) affecting reliability can be identified along with parameter values that yield reliability gains. In addition to improving reliability, Taguchi's robust design can be used to achi... View full abstract»

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  • Designing-in of quality through axiomatic design

    Publication Year: 1995, Page(s):256 - 264
    Cited by:  Papers (13)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (720 KB)

    Decisions made during the design stage of product and process development profoundly affect product quality and process productivity. To aid in design decision making, a theoretical framework is advanced; the axiomatic approach to design. Axiomatic design consists of: (1) domains in the design world; (2) mapping between these domains; (3) characterization of a design by a vector in each domain; (4... View full abstract»

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  • Reliability-estimation and stopping-rules for software testing, based on repeated appearances of bugs

    Publication Year: 1995, Page(s):315 - 321
    Cited by:  Papers (5)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (512 KB)

    Software-testing (debugging) is one of the most important components in software development. An important question in the debugging process is, when to stop. The choice is usually based on one of two decision criteria: (1) when the reliability has reached a given threshold, and (2) when the gain in reliability cannot justify the testing cost. Various stopping rules and software reliability models... View full abstract»

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  • Reliability analysis of accelerated life-test data from a repairable system

    Publication Year: 1995, Page(s):337 - 346
    Cited by:  Papers (5)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (720 KB)

    This paper analyzes accelerating testing of a repairable item modeled by a nonhomogeneous Poisson process with covariates. We extensively analyze a single accelerating variable with two stress levels, and derive closed-form maximum likelihood (ML) solutions. These closed-form solutions provide: (1) an easier way to obtain point estimates of the unknown parameters under usual operating conditions, ... View full abstract»

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  • Designing for high performance of a command, control, communication and information network

    Publication Year: 1995, Page(s):230 - 236
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (580 KB)

    The design of effective communication and information networks (CIN) is important to the supported command and control (C2) structure. The Command, Control, Communication and Information Network Analysis Tool (C3INAT) allows experts in different fields to develop sub-models independently, thus allowing analysts to compare various communication networks under the same C2 struc... View full abstract»

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  • Corrosion of metallic materials

    Publication Year: 1995, Page(s):271 - 278
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1112 KB)

    Corrosion processes are important in the degradation of electronic components. By nature of thin and closely-spaced metallic sections, electronic components are prone to corrosion failures even in the presence of traces of moisture and contaminants. Atmospheric corrosion, an electrochemical process under the influence of thin-film electrolytes, is primarily responsible for corrosion damage in elec... View full abstract»

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  • Unreplicated experimental designs in reliability growth programs

    Publication Year: 1995, Page(s):199 - 205
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (624 KB)

    Reliability-growth programs are usually implemented through repairs and modifications aimed at lengthening the system times-between-failures. The many factors that affect system performance suggest that a rational alternative to the common tweaking approach to reliability growth is experimental design techniques. However, economic and time constraints generally impose unreplicated experiments wher... View full abstract»

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  • From product-oriented development to technology-oriented development

    Publication Year: 1995, Page(s):220 - 224
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (508 KB)

    In product-oriented development, customer requirements are developed first. The product is then designed to meet the requirements. This process is inefficient. In technology-oriented development, functional robustness of a product technology is first developed at the early stage of the process. The developed robust technology is then tuned to meet the requirements as they become available. This pr... View full abstract»

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  • Statistical tools for the rapid development and evaluation of high-reliability products

    Publication Year: 1995, Page(s):187 - 198
    Cited by:  Papers (22)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1096 KB)

    Today's manufacturers face increasingly intense global competition. To remain profitable, they are challenged to design, develop, test, and manufacture high reliability products in ever-shorter product-cycle times and, at the same time, remain within stringent cost constraints. Design, manufacturing, and reliability engineers have developed an impressive array of tools for producing reliable produ... View full abstract»

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  • Characterization of some concepts of aging

    Publication Year: 1995, Page(s):285 - 290
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (364 KB)

    The theory of functions of regular variation has been used to delineate the relationships between the family of age-smoothed distributions and the classical reliability classes of distributions with aging properties. Explicit characterizations of distributions which are IFRA, NBU, and DMRL were given, and the characterizations were used to prove that the class of age-smoothed distribution function... View full abstract»

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  • Reliability of a linear connected-(r,s)-out-of-(m,n):F lattice system

    Publication Year: 1995, Page(s):333 - 336
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (240 KB)

    A linear connected-(r,s)-out-of-(m,n):F lattice system has its components ordered like the elements of a (m,n)-matrix such that the system fails if all components in a connected (r,s)-submatrix fail. This paper proposes a recursive algorithm, named Yamamoto-Miyakawa (YM), for the system reliability. The YM algorithm requires O(sm-r·m2·r·n) computing time.... View full abstract»

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  • A changing paradigm in quality

    Publication Year: 1995, Page(s):265 - 270
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (428 KB)

    Intense competition in the marketplace is forcing a change in the paradigm in quality. It has sensitized customers to new and higher level of expectation. Thus the focus of quality has begun to shift from product defects to product functions. Competition is also demanding fast response to market. Because the traditional approach of assessing, monitoring, and controlling uncertainty involves activi... View full abstract»

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  • Logic synthesis for reliability: an early start to controlling electromigration and hot-carrier effects

    Publication Year: 1995, Page(s):251 - 255
    Cited by:  Papers (8)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (384 KB)

    Designing reliable CMOS chips involves careful circuit design, with attention directed to some of the potential reliability problems such as electromigration and hot-carrier effects. This paper considers logic synthesis to optimize, early in the design phase, against electromigration and hot-carrier degradation. The electromigration and hot-carrier effects are estimated at the gate level using sig... View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu