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IEEE Transactions on Reliability

Issue 1 • Date March 1995

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Displaying Results 1 - 24 of 24
  • Comment on: "Component relevancy in multistate reliability models"

    Publication Year: 1995, Page(s):95 - 96
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (174 KB)

    The author comments on the paper by A.M. Abouammoh and M.A. Al-Kadi (see ibid., vol.40, p.370-4, 1991) which discusses various notions of component relevancy for multistate systems and suggests a unified form of relevancy. The paper contains many misprints, some wrong examples, and several results that need clarification. The most important are mentioned.<> View full abstract»

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  • Comment on: Reliability of k-out-of-n:G systems with imperfect fault-coverage

    Publication Year: 1995, Page(s):137 - 138
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (162 KB)

    This note comments on the paper "Reliability of k-out-of-n:G systems with imperfect fault-coverage" by S. Akhtar (1994). An alternative probability argument can be used to obtain the MTBF (mean time between failures) and MTTF (mean time to failure) for such systems. This has the advantage that higher moments of such failure times can also be determined.<> View full abstract»

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  • Sensitivity and uncertainty analysis of Markov-reward models

    Publication Year: 1995, Page(s):147 - 154
    Cited by:  Papers (12)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (604 KB)

    Markov-reward models are often used to analyze the reliability and performability of computer systems. One difficult problem therein is the quantification of the model parameters. If they are available, e.g., from measurement data collected by manufacturers, they are: (a) generally regarded as confidential; and (b) difficult to access. This paper addresses two ways of dealing with uncertain parame... View full abstract»

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  • Assembly-level reliability: a methodology for effective manufacturing of IC packages

    Publication Year: 1995, Page(s):14 - 18
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (432 KB)

    This paper discusses the general methodology of assembly level reliability (ALR) as part of a corporate effort at designing reliability into the whole assembly process of integrated circuit (IC) packages. Semiconductor packages with assembly-induced defects sometimes do escape detection due to a variety of reasons. Trying to eliminate this problem by approaching it piecemeal may result only in sin... View full abstract»

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  • Time-varying failure rates in the availability and reliability analysis of repairable systems

    Publication Year: 1995, Page(s):155 - 160
    Cited by:  Papers (17)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (276 KB)

    This paper combines time varying failure rates and Markov chain analysis to obtain a hybrid reliability and availability analysis. However, combining these techniques can, depending on the size of the system, result in solutions of the Markov chain differential matrix equations that are intractable. This paper identifies solutions that are tractable, These form the analytical baseline for the reli... View full abstract»

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  • Effect of testing techniques on software reliability estimates obtained using a time-domain model

    Publication Year: 1995, Page(s):97 - 103
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (568 KB)

    Since the early 1970s, researchers have proposed several models to estimate software-reliability as testing progresses. Among these, the time-domain models are the most common. We present empirical evidence to show that the testing method does affect the reliability estimates using one of these models, viz, the Musa basic execution-time model. The evidence suggests that: (1) reliability models nee... View full abstract»

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  • Weibull accelerated life testing with unreported early failures

    Publication Year: 1995, Page(s):31 - 36
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (380 KB)

    Situations arise in life testing where early failures go unreported, e.g. a technician believes an early failure is “his fault” or “premature” and must not be recorded. Consequently, the reported data come from a truncated distribution and the number of unreported early failures is unknown. Inferences are developed for a Weibull accelerated life-testing model in which trans... View full abstract»

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  • Reliability analysis of complex models using SURE bounds

    Publication Year: 1995, Page(s):46 - 53
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (728 KB)

    As computer and communication systems become more complex it becomes increasingly more difficult to analyze their hardware reliability, because simple models can fail to adequately-capture subtle but important features. This paper describes several ways the authors have addressed this problem for analyses based upon White's SURE theorem. They show: how reliability analysis based on SURE mathematic... View full abstract»

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  • Survey of reliability studies of consecutive-k-out-of-n:F and related systems

    Publication Year: 1995, Page(s):120 - 127
    Cited by:  Papers (29)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (664 KB)

    The consecutive-k-out-of-n:F and related systems have caught the attention of many researchers since the early 1980s. The studies of these systems lead to better understanding of the reliability of general series systems, In computation and structure. This paper is mainly a chronological survey of computing the reliability of these systems View full abstract»

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  • An O(n·(log2(n))2) algorithm for computing the reliability of k-out-of-n:G and k-to-l-out-of-n:G systems

    Publication Year: 1995, Page(s):132 - 136
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (356 KB)

    This paper presents the RAFFT-GFP (Recursively Applied Fast Fourier Transform for Generator Function Products) algorithm as a computationally superior algorithm for expressing and computing the reliability of k-out-of-n:G and k-to-l-out-of-n:G systems using the fast Fourier transform. Originally suggested by Barlow and Heidtmann (1984), generating functions provide a clear, concise method for comp... View full abstract»

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  • Computation in faulty stars [hypercube networks]

    Publication Year: 1995, Page(s):114 - 119
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (508 KB)

    The question of simulating a completely healthy hypercube with a degraded one (one with some faulty processors) has been considered by several authors. We consider the question for the star-graph interconnection network. With suitable assumptions on the fault probability, there is, with high probability, a bounded distance embedding of Kn×Sn-1 in a degraded S... View full abstract»

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  • Electrical overstress and electrostatic discharge

    Publication Year: 1995, Page(s):2 - 5
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (400 KB)

    Semiconductor devices have a limited ability to sustain electrical overstress (EOS). The device susceptibility to EOS increases as the device is scaled down to submicron feature size. At present, EOS is a major cause for IC failures. Published reports indicate that nearly 40% of IC failures can be attributed to EOS events. Hence, EOS threats must be considered early in the design process. For semi... View full abstract»

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  • A new framework for part failure-rate prediction models

    Publication Year: 1995, Page(s):139 - 146
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (624 KB)

    This paper presents a framework for developing part failure-rate models. It is a partial result of an effort sponsored by the US Air Force for the development of reliability prediction models for military avionics. Published data show that the existing reliability prediction methods fall far short of providing the required accuracy. One of the problems in the existing methods is the exclusion of c... View full abstract»

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  • Modeling and maximizing burn-in effectiveness

    Publication Year: 1995, Page(s):19 - 25
    Cited by:  Papers (3)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (404 KB)

    System burn-in can get rid of many residual defects left from component and subsystem burn-in since incompatibility exists not only among components but also among different subsystems and at the system level. Even if system, subsystem, and component burn-in are performed, the system reliability often does not achieve the requirement. In this case, redundancy is a good way to increase system relia... View full abstract»

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  • Dependent and multimode failures in reliability evaluation of extra-stage shuffle-exchange MINs

    Publication Year: 1995, Page(s):73 - 86
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1028 KB)

    Previous reliability evaluations for multistage interconnection networks (MINs) assumed that “all failures are statistically-independent and that no degraded operational modes exist for switches”, though these assumptions are not realistic. For example, researchers have described instances of statistically-dependent failures, or fault side-effects, in some MINs. This paper presents eff... View full abstract»

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  • Demonstrated reliability of plastic-encapsulated microcircuits for missile applications

    Publication Year: 1995, Page(s):8 - 13
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (508 KB)

    For the past decade, overall reliability improvement and product availability have enabled plastic encapsulated microcircuits (PEM) to move from consumer electronics beyond the relatively large and reliability-conscious automotive market, into the military market. Based on the analysis of the worst-case PEM scenario for military applications, demonstrating the moisture reliability under long-term ... View full abstract»

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  • Determining the duration of a demonstration life-test before all units fail

    Publication Year: 1995, Page(s):26 - 30
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (360 KB)

    Two small samples of electrodes insulated with the standard and modified designs were put on a high-stress voltage-endurance life-test. The objective was to compare the life distributions of these insulation designs. During the test, the design engineer suspected that the modified design was an improvement (longer lasting) over the standard design. There were still unfailed electrodes in the modif... View full abstract»

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  • Fault-tree analysis: a knowledge-engineering approach

    Publication Year: 1995, Page(s):37 - 45
    Cited by:  Papers (10)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (752 KB)

    This paper deals with the application of knowledge engineering and a methodology for the assessment and measurement of reliability, availability, maintainability, and safety of industrial systems using fault-tree representation. Object oriented structures, production rules representing the expert's heuristics, algorithms, and database structures are the basic elements of the system. The blackboard... View full abstract»

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  • An O(k3·log(n/k)) algorithm for the consecutive-k-out-of-n:F system

    Publication Year: 1995, Page(s):128 - 131
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (240 KB)

    The fastest generally-recognized algorithms for computing the reliability of consecutive-k-out-of-n:F systems require O(n) time, for both the linear and circular systems. The authors' new algorithm requires O(k3·log(n/k)) time. The algorithm can be extended to yield an O(n·max{k3·log(n/k), log(n))} total time procedure for solving the combinatorial proble... View full abstract»

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  • Genetic-algorithm-based reliability optimization for computer network expansion

    Publication Year: 1995, Page(s):63 - 72
    Cited by:  Papers (27)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (760 KB)

    This paper explains the development and implementation of a new methodology for expanding existing computer networks. Expansion is achieved by adding new communication links and computer nodes such that reliability measures of the network are optimized within specified constraints. A genetic algorithm-based computer network expansion methodology (GANE) is developed to optimize a specified objectiv... View full abstract»

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  • Reliability comparisons for plastic-encapsulated microcircuits

    Publication Year: 1995, Page(s):6 - 7
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (140 KB)

    This paper briefly compares reliability test data obtained from plastic encapsulated microcircuits (PEM) purchased from various manufacturers. Tests include biased humidity, temperature cycling, autoclave, and life tests. The results indicate differences in reliability associated with PEM from the various manufacturers. These data highlight the need for a thorough understanding of supplier quality... View full abstract»

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  • A reliability model for real-time rule-based expert systems

    Publication Year: 1995, Page(s):54 - 62
    Cited by:  Papers (1)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (780 KB)

    This paper uses two modeling tools to analyze the reliability of real-time expert systems: (1) a stochastic Petri net (SPN) for computing the conditional response time distribution given that a fixed number of expert system match-select-act cycles are executed, and (2) a simulation search tree for computing the distribution of expert system match-select-act cycles for formulating a control strateg... View full abstract»

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  • A combinatorial approach to modeling imperfect coverage

    Publication Year: 1995, Page(s):87 - 94
    Cited by:  Papers (29)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (576 KB)

    A new algorithm combines a coverage model with a combinatorial model to compute system unreliability. Its advantage is that for a class of computer systems, it is simpler than current algorithms. The method applies to combinatorial models which can generate cutsets for the system. This set of cutsets is augmented with cutsets representing the uncovered failures of the system. The resulting set is ... View full abstract»

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  • Mixture models for reliability of software with imperfect debugging: identifiability of parameters

    Publication Year: 1995, Page(s):104 - 113
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (652 KB)

    A class of software-reliability mixture-type models is introduced in which individual bugs come with i.i.d. random failure-causation rates λ, and have conditional hazard function φ(t|λ) for software failure times. The models allow the possibility of imperfect debugging, in that at each failure a new bug (possibly with another rate-parameter λ) is introduced, statistically ... View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu