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Circuits and Devices Magazine, IEEE

Issue 6 • Date Nov. 1994

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Displaying Results 1 - 4 of 4
  • Polymers make the OEIC connection

    Page(s): 8 - 13
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (752 KB)  

    Improving plastics expand their domain in digital, microwave, and electrooptic systems.<> View full abstract»

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  • Wavelets and filter banks. A signal processing perspective

    Page(s): 14 - 18
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (416 KB)  

    Wavelets are a relative newcomer to signal decomposition, and offer a flexible analog transform to provide multiresolution signal decomposition. Their advantages over Fourier and short-time Fourier transforms (STFTs) are significant, and the linkages and practical commonalities of these two transform techniques have generated interdisciplinary research activities among mathematicians, physicists and electrical engineers. This article presents the fundamentals of wavelet transform theory. In this context, the subject's mathematical rigor is avoided. We discuss the differences between the conventional STFT and wavelet transforms from a time-frequency "tiling" point of view. Then, we highlight the significant role of discrete-time filter banks in wavelet theory, and assess the practicality of wavelets in signal processing applications.<> View full abstract»

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  • Balanced probe extends high-frequency measurements

    Page(s): 19 - 23
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (419 KB)  

    The balanced coaxial probe is a valuable high frequency measurement tool that avoids the limitations of conventional probes, active and passive. Its resistive input impedance and balanced design are the keys to making clean measurements in the 1 to 500 MHz range. In fact, this probe represents an extremely effective method to accurately measure a high frequency voltage between nodes a few inches apart, as the required lead lengths for such measurements cause severe overshoots for "normal" probes with capacitive input impedances.<> View full abstract»

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  • 40th IEDM stands high on tradition and technology

    Page(s): 24 - 27
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (488 KB)  

    Entering its fifth decade, conference remains the leader for showcasing the latest in IC and electron devices Circuits and devices for low-voltage, low-power portable machines, and novel work in both gigabit-scale DRAM technology and high-density flash memories, are among the highlights of the 40th Annual IEEE International Electron Devices Meeting (IEDM) at the San Francisco Hilton on December 11-14.<> View full abstract»

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Aims & Scope

IEEE Circuits and Devices Magazine (1985-2006) covers the design, implementation, packaging, and manufacture of micro-electronic and photonic devices, circuits and systems

 

This Magazine ceased publication in 2006.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Dr. Ronald W. Waynant
r.waynant@ieee.org