IEEE Design & Test

Issue 5 • Oct. 2016

Filter Results

Displaying Results 1 - 25 of 26
  • Front Cover

    Publication Year: 2016, Page(s): C1
    Request permission for commercial reuse | |PDF file iconPDF (484 KB)
    Freely Available from IEEE
  • Cover 2

    Publication Year: 2016, Page(s): C2
    Request permission for commercial reuse | |PDF file iconPDF (354 KB)
    Freely Available from IEEE
  • IEEE Design&Test publication information

    Publication Year: 2016, Page(s): 1
    Request permission for commercial reuse | |PDF file iconPDF (77 KB)
    Freely Available from IEEE
  • Table of Contents

    Publication Year: 2016, Page(s):2 - 3
    Request permission for commercial reuse | |PDF file iconPDF (282 KB)
    Freely Available from IEEE
  • New Directions in Analog/Mixed-Signal Design and Test

    Publication Year: 2016, Page(s): 4
    Request permission for commercial reuse | |PDF file iconPDF (95 KB)
    Freely Available from IEEE
  • Guest Editors' Introduction Challenges and Opportunities in Analog/Mixed-Signal CAD

    Publication Year: 2016, Page(s):5 - 6
    Cited by:  Papers (1)
    Request permission for commercial reuse | |PDF file iconPDF (69 KB)
    Freely Available from IEEE
  • Retention Testing Methodology for STTRAM

    Publication Year: 2016, Page(s):7 - 15
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (1189 KB)

    Spin-torque transfer RAM (STTRAM) is a promising memory technology due to its low power, high speed, and robustness. However, the shift of retention time from a few years to a few microseconds due to temperature, thermal, statistical, and stochastic variations makes retention testing nontrivial and time consuming. This article analyzes the impact of process variation, temperature, and disturb curr... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Efficient Global Optimization of Analog Circuits Using Predictive Response Surface Models on Discretized Design Space

    Publication Year: 2016, Page(s):16 - 27
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (1879 KB)

    Analog circuit optimization is an important-yet-challenging problem, because accurately evaluating circuit performance by transistor-level simulation within the optimization loop is extremely expensive. This article addresses the grand challenge by adopting two novel techniques: first, discretizing the continuous design space with respect to the variability-induced correlation, making the total nu... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Using Presilicon Knowledge to Excite Nonlinear Failure Modes in Large Mixed-Signal Circuits

    Publication Year: 2016, Page(s):28 - 34
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (1340 KB)

    With the continuous growing of analog circuit complexity, identifying critical failure modes is of great importance today. This article develops an information-theoretic framework to rank important parameters based on presilicon data. The proposed framework is further used to design the optimal test set that maximizes the probability of observing out-of-specification failures. A phase-locked loop ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Verifying Inevitability of Oscillation in Ring Oscillators Using the Deductive SOS-QE Approach

    Publication Year: 2016, Page(s):35 - 43
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (929 KB)

    This article presents a deductive numeric-symbolic approach, using sum of squares (SOS) programming and quantifier elimination (QE). The authors take ring oscillator as an example to verify that it can start oscillating from all possible initial voltages. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Design of Mixed-Signal Systems With Asynchronous Control

    Publication Year: 2016, Page(s):44 - 55
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (930 KB)

    This paper presents a novel workflow for the design of mixed-signal systems with asynchronous control. Current methods rely on synchronous control logic and full-system simulation, which might lead to suboptimal results and even project respins due to critical errors. Asynchronous circuits can provide greater robustness, reactivity, and power efficiency. The proposed workflow aims to combine state... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • EM-Based On-Chip Aging Sensor for Detection of Recycled ICs

    Publication Year: 2016, Page(s):56 - 64
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (9123 KB)

    Counterfeiting integrated circuits (ICs), especially recycled ICs, have become a major security threat for commercial and military systems. This paper proposes a new lightweight on-chip aging sensor, which is based on electromigration-induced aging effects for fast detection and prevention of recycled ICs. Compared to other existing aging sensors, the proposed sensor can provide more accurate pred... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Mixed Criticality Systems—A History of Misconceptions?

    Publication Year: 2016, Page(s):65 - 74
    Cited by:  Papers (2)
    Request permission for commercial reuse | |PDF file iconPDF (216 KB)
    Freely Available from IEEE
  • Cybersecurity for Control Systems: A Process-Aware Perspective

    Publication Year: 2016, Page(s):75 - 83
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (753 KB)

    Modern industrial control systems and other complex cyber-physical systems such as smart grid, unmanned vehicles, manufacturing plants, chemical plants, and nuclear reactors are complex interconnected systems with extensive cyber and physical components, necessitating robust cyber-security techniques. These systems are complex interconnected combinations of heterogeneous hardware and software comp... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Creating a Successful Partnership Between Industry, Academia, and Government

    Publication Year: 2016, Page(s):84 - 91
    Request permission for commercial reuse | |PDF file iconPDF (301 KB)
    Freely Available from IEEE
  • Introducing IEEE Collabratec

    Publication Year: 2016, Page(s): 92
    Request permission for commercial reuse | |PDF file iconPDF (542 KB)
    Freely Available from IEEE
  • Recap of the 53rd Design Automation Conference (DAC)

    Publication Year: 2016, Page(s):93 - 95
    Request permission for commercial reuse | |PDF file iconPDF (84 KB)
    Freely Available from IEEE
  • Open Access

    Publication Year: 2016, Page(s): 96
    Request permission for commercial reuse | |PDF file iconPDF (400 KB)
    Freely Available from IEEE
  • Together, we are advancing technology

    Publication Year: 2016, Page(s): 97
    Request permission for commercial reuse | |PDF file iconPDF (363 KB)
    Freely Available from IEEE
  • CEDA Currents

    Publication Year: 2016, Page(s):98 - 99
    Request permission for commercial reuse | |PDF file iconPDF (133 KB)
    Freely Available from IEEE
  • Expand your network, get rewarded

    Publication Year: 2016, Page(s): 100
    Request permission for commercial reuse | |PDF file iconPDF (417 KB)
    Freely Available from IEEE
  • Test Technology TC Newsletter

    Publication Year: 2016, Page(s):101 - 103
    Request permission for commercial reuse | |PDF file iconPDF (188 KB)
    Freely Available from IEEE
  • Half-Page ad

    Publication Year: 2016, Page(s): 103
    Request permission for commercial reuse | |PDF file iconPDF (44 KB)
    Freely Available from IEEE
  • Where Are We Going?

    Publication Year: 2016, Page(s): 104
    Request permission for commercial reuse | |PDF file iconPDF (69 KB)
    Freely Available from IEEE
  • Cover 3

    Publication Year: 2016, Page(s): C3
    Request permission for commercial reuse | |PDF file iconPDF (1489 KB)
    Freely Available from IEEE

Aims & Scope

IEEE Design & Test offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy efficient design, electronic design automation tools, practical technology, and standards.  

It was published as IEEE Design & Test of Computers between 1984 and 2012.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Joerg Henkel
Chair for Embedded Systems (CES)
Karlsruhe Institute of Technology (KIT)