IEEE Design & Test

Issue 1 • Feb. 2016

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Displaying Results 1 - 23 of 23
  • Front Cover

    Publication Year: 2016, Page(s): C1
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  • Cover 2

    Publication Year: 2016, Page(s): C2
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  • Masthead

    Publication Year: 2016, Page(s): 1
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  • Table of Contents

    Publication Year: 2016, Page(s):2 - 3
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  • Approximate Computing: Solving Computing's Inefficiency Problem?

    Publication Year: 2016, Page(s):4 - 5
    Cited by:  Papers (3)
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  • Guest Editors' Introduction: Approximate Computing

    Publication Year: 2016, Page(s):6 - 7
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  • Approximate Computing: A Survey

    Publication Year: 2016, Page(s):8 - 22
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (721 KB) | HTML iconHTML

    As one of the most promising energy-efficient computing paradigms, approximate computing has gained a lot of research attention in the past few years. This paper presents a survey of state-of-the-art work in all aspects of approximate computing and highlights future research challenges in this field. View full abstract»

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  • An eDRAM-Based Approximate Register File for GPUs

    Publication Year: 2016, Page(s):23 - 31
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (897 KB)

    GPUs require large register files for fast context switching. This paper presents a high-density and energy-efficient approximate register file architecture based on embedded DRAM with lowered refresh rate to the low-order bits of register entries. View full abstract»

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  • Mitigating the Memory Bottleneck With Approximate Load Value Prediction

    Publication Year: 2016, Page(s):32 - 42
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1017 KB)

    Limited memory bandwidth and long access latency are serious GPU performance bottlenecks. For emerging applications that are inherently error resilient, this paper proposes to predict the values of safe-to-approximate loads and drop a certain fraction of the cache misses with predicted values to improve performance and energy efficiency. View full abstract»

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  • Quality Control for Approximate Accelerators by Error Prediction

    Publication Year: 2016, Page(s):43 - 50
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (655 KB)

    How to ensure the output quality is one of the most critical challenges in approximate computing. This paper presents an online quality management system in an approximate-accelerator-based computing environment that can effectively detect and correct large approximation errors. View full abstract»

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  • Exploring the Precision Limitation for RRAM-Based Analog Approximate Computing

    Publication Year: 2016, Page(s):51 - 58
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (463 KB)

    RRAM-based approximate computing systems are significantly more energy efficient than many digital approximate computing systems, but their accuracy is less easily controlled and quantified. This paper analyzes the precision limitation for such systems and highlights the importance of RRAM device resolution in low-resistance states. View full abstract»

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  • Architecture of a Reusable BIST Engine for Detection and Autocorrection of Memory Failures and for IO Debug, Validation, Link Training, and Power Optimization on 14-nm SoC

    Publication Year: 2016, Page(s):59 - 67
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (884 KB)

    This paper presents the hardware and software architecture of a reusable BIST engine for 3D stacked 14-nm SoC, which also includes software-assisted autorepair of memory defects. Silicon results presented demonstrate the features of such engine such as easy silicon debug, validation time reduction by 3x, detection and repair of memory cell defects, etc. This solution has been successfully designed... View full abstract»

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  • Adapt&Cap: Coordinating System- and Application-Level Adaptation for Power-Constrained Systems

    Publication Year: 2016, Page(s):68 - 76
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1359 KB)

    The paper proposes an adaptive framework for modern data centers that jointly manages application- and system-level (dynamic voltage and frequency scaling) adaptation to improve energy efficiency of multicore servers. The results of applying this framework show that significant power savings and performance improvements are possible with respect to current data center management techniques. View full abstract»

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  • Test: Wisdom From the Giants, Visions for the Future—Part 2

    Publication Year: 2016, Page(s):77 - 84
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  • Recap of the ITC15 Test Conference

    Publication Year: 2016, Page(s):85 - 86
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  • From the Heart of Silicon Valley to the Hill Country—Highlights of ICCAD 2015

    Publication Year: 2016, Page(s):87 - 88
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  • Report on MECO'2015

    Publication Year: 2016, Page(s):89 - 90
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  • CEDA Currents

    Publication Year: 2016, Page(s):91 - 92
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  • Test Technology TC Newsletter

    Publication Year: 2016, Page(s):93 - 94
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  • My IEEE

    Publication Year: 2016, Page(s): 95
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  • Good Enough Computing

    Publication Year: 2016, Page(s): 96
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  • Cover 3

    Publication Year: 2016, Page(s): C3
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  • Cover 4

    Publication Year: 2016, Page(s): C4
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Aims & Scope

IEEE Design & Test offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy efficient design, electronic design automation tools, practical technology, and standards.  

It was published as IEEE Design & Test of Computers between 1984 and 2012.

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Meet Our Editors

Editor-in-Chief
Joerg Henkel
Chair for Embedded Systems (CES)
Karlsruhe Institute of Technology (KIT)