IEEE Electromagnetic Compatibility Magazine

Issue 3 • 3rd Quarter 2015

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Displaying Results 1 - 25 of 35
  • Front cover

    Publication Year: 2015, Page(s): c1
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  • Contents

    Publication Year: 2015, Page(s): 3
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  • Letter from the editor

    Publication Year: 2015, Page(s):4 - 5
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  • President's message

    Publication Year: 2015, Page(s):6 - 9
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  • Announcing a new journal jointly created by the IEEE AP, MTT, and EMC societies: IEEE journal on multiscale and multiphysics computational techniques (JMMCT)

    Publication Year: 2015, Page(s): 8
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  • Chapter chatter

    Publication Year: 2015, Page(s):10 - 21
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  • Education committee

    Publication Year: 2015, Page(s): 22
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  • IEEE and HKN - Perfect together

    Publication Year: 2015, Page(s):23 - 24
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  • Announcing new EMC society senior members

    Publication Year: 2015, Page(s): 24
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  • EMC personality profile

    Publication Year: 2015, Page(s): 25
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  • EMC society history

    Publication Year: 2015, Page(s): 26
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  • 50-25-10 years ago: A review of EMC society newsletters

    Publication Year: 2015, Page(s):26 - 28
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  • Quasies and peaks

    Publication Year: 2015, Page(s):29 - 30
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  • Founders and past-president's Luncheon - Dresden, Germany

    Publication Year: 2015, Page(s):30 - 32
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  • "Stiffed" in Melk

    Publication Year: 2015, Page(s): 32
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  • Electrical design of through silicon via (lee, m., et al; 2014) [book review]

    Publication Year: 2015, Page(s): 33
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  • The 2015 Asia-Pacific international symposium on electromagnetic compatibility

    Publication Year: 2015, Page(s):36 - 40
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  • Practical papers, articles and application notes

    Publication Year: 2015, Page(s): 41
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  • Design, simulation and experimental results of UWB rectangular anechoic chamber

    Publication Year: 2015, Page(s):41 - 51
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (3378 KB) | HTML iconHTML

    Anechoic Chambers are used in many applications in the field of Electrical Engineering. They became very important infrastructure in antenna characterization, EMI/EMC testing and calibration of different types of electronic systems. Many varieties of anechoic chambers were installed by industry in the world to meet their testing requirements. Though the indoor testing of electromagnetic radiating ... View full abstract»

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  • Linking circuit simulation with full-wave solver for board-level EMC design

    Publication Year: 2015, Page(s):52 - 58
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (3553 KB) | HTML iconHTML

    In the fast paced electronics world, simulation has become an indispensable tool for every designer in recent years. In this paper, we present a guide to setting up a coupled simulation method from a SPICE-like circuit simulation and a full wave 3D simulation. This coupling offers the possibility to calculate the field distribution in a structure considering the effects of an attached circuit by a... View full abstract»

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  • RF interference in hearing aids from cellphones part 1: Near-field cellphone emissions measurements and the effects of hands

    Publication Year: 2015, Page(s):59 - 66
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (7151 KB) | HTML iconHTML

    Cellular telephones (cellphones) are currently categorized for hearing aid compatibility based on a calculated value (metric) obtained from the measurement of near-field, radio-frequency emissions according to a procedure described in ANSI Standard C63.19 “Measurement of Compatibility between Wireless Communications Devices and Hearing Aids”. There has been a lack of documentation, h... View full abstract»

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  • Technical theme topics

    Publication Year: 2015, Page(s): 67
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  • Near-field scanning for EM emission characterization

    Publication Year: 2015, Page(s):67 - 73
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2201 KB) | HTML iconHTML

    This tutorial reviews a few important issues when using the near-field scanning technique for EM emission characterization. Calibration of field probes is introduced first to eliminate or reduce the errors in the measurement of EM field components. Then, methodologies to obtain the phase information in near-field scanning are discussed. For characterizing radiators in free space in terms of far-fi... View full abstract»

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  • Equivalent dipole models of electromagnetic emissions from near-field scanning

    Publication Year: 2015, Page(s):74 - 78
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2709 KB) | HTML iconHTML

    This paper gives an introduction to the concept of equivalent dipole modelling of the emissions of electronic equipment. To simplify the computation of emissions from electronic devices an equivalent model of the device based on a dipole array is derived using the measured emissions in the near field. The requirements for the near field scanner and the methodology for deriving the equivalent dipol... View full abstract»

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  • Near-field measurement of stochastic electromagnetic fields

    Publication Year: 2015, Page(s):79 - 85
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2143 KB) | HTML iconHTML

    Stochastic electromagnetic fields with Gaussian amplitude probability distribution can be fully described by auto- and cross correlation spectra of the field components. The cross correlation spectra have to be known for the pairs of field components taken at different spatial points. Integrated electric dipole and magnetic loop probes together with active electronics in AlGaAs/GaAs-HEMT and SiGe:... View full abstract»

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Aims & Scope

IEEE Electromagnetic Compatibility Magazine informs readers of activities in the IEEE EMC Society and educates members via practical technical papers and design tips.

 

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Janet Nichols O’Neil
ETS-Lindgren