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IEEE Design & Test of Computers

Issue 2 • Date April 1989

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  • The V compiler: automatic hardware design

    Publication Year: 1989, Page(s):8 - 17
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (758 KB)

    The V language describes VLSI systems concisely through the use of sequential algorithmic descriptions. Because V includes high-level constructs such as queues, asynchronous calls, and cycle-blocks, designs are more readily described and optimized into efficient hardware implementations. The implementations can then be tuned for space, time, or other objectives using annotations. From the input de... View full abstract»

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  • A testability strategy for microprocessor architecture

    Publication Year: 1989, Page(s):18 - 34
    Cited by:  Papers (10)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1321 KB)

    The authors present a method for fully testing chips designed using synthesis and silicon compilation. The method is targeted for a multiprocessor architecture that implements low-speed to medium-speed signal-processing algorithms. By taking advantage of the specific properties of the architecture, the method allows a chip to be partitioned into several functional units. The authors use the C-test... View full abstract»

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  • A synthesis environment for designing DSP systems

    Publication Year: 1989, Page(s):35 - 44
    Cited by:  Papers (24)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (791 KB)

    The authors describe a high-level synthesis tool that addresses the broad range of throughput requirements inherent in all DSP (digital signal processor) systems. The primary role of this system, called FACE (flexible architecture compilation environment), is to provide a set of algorithms that adequately support architecturally specific hardware synthesis for a class of DSP applications. They fir... View full abstract»

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This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

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