IEEE Design & Test

Issue 2 • April 2015

Filter Results

Displaying Results 1 - 12 of 12
  • Front Cover

    Publication Year: 2015, Page(s): C1
    Request permission for commercial reuse | PDF file iconPDF (1304 KB)
    Freely Available from IEEE
  • Masthead

    Publication Year: 2015, Page(s): 1
    Request permission for commercial reuse | PDF file iconPDF (57 KB)
    Freely Available from IEEE
  • Table of Contents

    Publication Year: 2015, Page(s): 2
    Request permission for commercial reuse | PDF file iconPDF (60 KB)
    Freely Available from IEEE
  • Departments [Table of Contents]

    Publication Year: 2015, Page(s): 3
    Request permission for commercial reuse | PDF file iconPDF (231 KB)
    Freely Available from IEEE
  • A Look at Trojan Attack, Pruning, and Dependability

    Publication Year: 2015, Page(s):4 - 5
    Request permission for commercial reuse | PDF file iconPDF (85 KB) | HTML iconHTML
    Freely Available from IEEE
  • How Secure Are Printed Circuit Boards Against Trojan Attacks?

    Publication Year: 2015, Page(s):7 - 16
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2323 KB) | HTML iconHTML

    Hardware Trojan attacks at the integrated circuit (IC) level have been studied extensively in recent times. Researchers have analyzed the impact of these attacks and explored possible countermeasures for ICs. However, vulnerability with respect to hardware Trojan attacks at higher levels of system abstraction, e.g., at printed circuit board (PCB) level, have not been reported earlier. Previous stu... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Dependable Multicore Architectures at Nanoscale: The View From Europe

    Publication Year: 2015, Page(s):17 - 28
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (362 KB) | HTML iconHTML

    This article presented a survey of dependability issues faced by multi-core architectures at nanoscale technology nodes. Existing solutions against these challenges were also discussed, describing their scope of application, from technology level methodologies, to design approaches to the metrics required to evaluate the overall dependability of a system. In the future, the constant reduction of t... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • DVFS Pruning for Wireless NoC Architectures

    Publication Year: 2015, Page(s):29 - 38
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (449 KB) | HTML iconHTML

    The millimeter wave small world network on a chip is an emerging paradigm to design low power and high-bandwidth massive multicore chips. By reducing the hop count between largely separated communicating cores, wireless shortcuts in mSWNoC have been shown to carry a significant amount of the overall traffic within the network. The amount of traffic detoured in this way is substantial and the low p... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • The Future of Automotive Design and the Road to Get There

    Publication Year: 2015, Page(s):40 - 47
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (175 KB) | HTML iconHTML

    Presents an interview that addresses future automotive engineernig technologies and products. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Test Technology TC Newsletter

    Publication Year: 2015, Page(s):49 - 50
    Request permission for commercial reuse | PDF file iconPDF (83 KB) | HTML iconHTML
    Freely Available from IEEE
  • CEDA Currents

    Publication Year: 2015, Page(s):52 - 53
    Request permission for commercial reuse | PDF file iconPDF (135 KB)
    Freely Available from IEEE
  • Getting Credit

    Publication Year: 2015, Page(s): 56
    Request permission for commercial reuse | PDF file iconPDF (75 KB) | HTML iconHTML
    Freely Available from IEEE

Aims & Scope

IEEE Design & Test offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy efficient design, electronic design automation tools, practical technology, and standards.  

It was published as IEEE Design & Test of Computers between 1984 and 2012.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Joerg Henkel
Chair for Embedded Systems (CES)
Karlsruhe Institute of Technology (KIT)