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Reliability, IEEE Transactions on

Issue 1 • Date March 1994

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Displaying Results 1 - 25 of 26
  • Comment on "Cut set analysis of networks using basic minimal paths and network decomposition"

    Publication Year: 1994 , Page(s): 59 - 60
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (212 KB)  

    The authors argue that the network decomposition suggested by Jasmon (1985) fails to give all basic minimal paths of the network, depending on the number of nodes split. Consequently, some minimal node cut sets are not generated. Even those generated using these basic minimal paths need not be minimal node cut sets.<> View full abstract»

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  • MetaPrime: an interactive fault-tree analyzer

    Publication Year: 1994 , Page(s): 121 - 127
    Cited by:  Papers (18)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (576 KB)  

    The performances of almost all available fault tree analysis tools are limited by the performance of their prime implicant computation procedure. All these procedures manipulate the prime implicants of the fault trees in extension, so that the analysis costs are directly related to the number of prime implicants to be generated, which in practice makes these tools difficult to apply on fault trees... View full abstract»

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  • The number of working periods of a repairable Markov system during a finite time interval

    Publication Year: 1994 , Page(s): 163 - 169
    Cited by:  Papers (1)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (432 KB)  

    In reliability analysis, continuous parameter homogeneous irreducible finite Markov processes are used to model repairable systems with time-independent transition rates between individual states. The state space is then partitioned into the set of up states and the set of down states. The number of completed repair events during a finite time interval is an important (undiscounted) cost measure f... View full abstract»

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  • Customer-driven reliability models for multistate coherent systems

    Publication Year: 1994 , Page(s): 46 - 50
    Cited by:  Papers (26)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (412 KB)  

    Reliability models for multistate coherent systems require customer interaction. The customer defines the distinctive component and system states. Knowing the component states, the authors estimate the probability distribution for each component. The customer specifies when a change in the state of any component forces a change in the state of the system. From this, the authors present a methodolo... View full abstract»

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  • Failure mechanism models for material aging due to interdiffusion

    Publication Year: 1994 , Page(s): 2 - 10
    Cited by:  Papers (5)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (708 KB)  

    This tutorial illustrates design situations where material aging due to interdiffusion in some components can compromise system performance over time, thereby acting as a wearout failure mechanism. Microstructural diffusion mechanisms, continuum diffusion models, and interdiffusion analysis techniques are presented to design against such failures. An example illustrates the application of the mech... View full abstract»

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  • Bayes estimation of the piece-wise exponential distribution

    Publication Year: 1994 , Page(s): 128 - 131
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (296 KB)  

    A Bayes method to infer an unknown failure time distribution is presented. The method is based on the piecewise exponential distribution and a relationship between values of the failure rate in successive intervals; it provides smooth estimates of the survival and hazard functions of the distribution. This is accomplished in a model-based framework without resorting to smoothing procedures that re... View full abstract»

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  • Shunt capacitor effect on electrical distribution system reliability

    Publication Year: 1994 , Page(s): 170 - 176
    Cited by:  Papers (4)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (420 KB)  

    To improve the security and reliability of a distribution system, as much power as feasible must go through a given transmission line. This can be achieved by using shunt capacitors as compensators. These shunt capacitive compensators improve the load carrying capability of the line by controlling the reactive power flow. Consequently, the capacitor existence cannot be ignored in evaluating system... View full abstract»

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  • Implementing a relational database for an accelerated-life-test facility

    Publication Year: 1994 , Page(s): 11 - 21
    Cited by:  Patents (2)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (964 KB)  

    This paper describes the design of a relational database and associated command structure for an accelerated-life-test facility. The primary goals of the design were to: (1) improve data integrity, and (2) provide a complete and consistent historical record of reliability test results. The intended reader is the engineer who wants to understand the issues involved in automating the reliability-dat... View full abstract»

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  • Process characterization and optimization based on censored data from highly fractionated experiments

    Publication Year: 1994 , Page(s): 145 - 155
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (852 KB)  

    Censored data resulting from life-test of durable products, coupled with complicated structures of screening experiments, makes process characterization very difficult. Existing methods can be inadequate for modeling such data because important effects and factor levels might be identified wrongly. This article presents an expectation-modeling-maximization (EMM) algorithm, where censored data are ... View full abstract»

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  • Network s-t reliability bounds using a 2-dimensional reliability polynomial

    Publication Year: 1994 , Page(s): 39 - 45
    Cited by:  Papers (4)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (540 KB)  

    Computing the reliability of a generic network is computationally difficult, and an exact solution is unattainable for many problems. Faced with this computational difficulty, two compromises are usually made: (1) be content with reliability bounds instead of exact reliability; and (2) simplify analysis by assuming that all but 1 component-type are perfectly reliable. This paper relaxes the assump... View full abstract»

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  • The nature of defect patterns on integrated-circuit wafer maps

    Publication Year: 1994 , Page(s): 22 - 29
    Cited by:  Papers (1)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (620 KB)  

    The history of IC-yield models dates from those based on the simple Poisson distribution to current models based on the families of compound and generalized Poisson distributions. The latter are more complex because the IC chips have grown larger in area and circuit density, thereby unveiling the clustering (aggregation) properties of defects on wafers. These clustering properties are reflected by... View full abstract»

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  • Bayes credibility intervals for reliability of series systems with very reliable components

    Publication Year: 1994 , Page(s): 132 - 137
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (428 KB)  

    An asymptotic expansion for the posterior Cdf of the reliability of series systems with very reliable components is obtained. This result allows us not only to calculate the Cdf easily but to estimate the magnitude of error when the infinite series expansion is truncated. Numerical results show that the asymptotic expansion converges very rapidly. Consequently, the computation of Bayes credibility... View full abstract»

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  • Reliability of k-out-of-n:G systems with imperfect fault-coverage

    Publication Year: 1994 , Page(s): 101 - 106
    Cited by:  Papers (1)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (340 KB)  

    k-out-of-n:G systems are modeled to determine their reliability and availability. Markov models are obtained to examine the fault-tolerant operation of the system. From the Markov chains, reliability and availability measures are found as state probabilities. Recursive expressions for mean time-between-failures and mean time-to-failure are obtained for repairable systems, considering perfect and i... View full abstract»

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  • Reliability of a standby system with beta-distributed component lives

    Publication Year: 1994 , Page(s): 71 - 75
    Cited by:  Papers (2)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (296 KB)  

    The exact distribution of the sum of 2 independent beta variables is presented. It is applied to a standby system with beta-distributed component lives and permits the calculation of its exact reliability when the exact parameters-values are known. It appreciably improves the current approximate method View full abstract»

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  • Improvement, deterioration, and optimal replacement under age-replacement with minimal repair

    Publication Year: 1994 , Page(s): 156 - 162
    Cited by:  Papers (4)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (388 KB)  

    Improvement and deterioration for a repairable system are studied, in particular in terms of the effect of ageing on the distribution of the time to first failure under a nonhomogeneous Poisson process. For a repairable system undergoing minimal repair, the optimal replacement time under the age replacement policy is discussed View full abstract»

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  • Reliability polynomials and link importance in networks

    Publication Year: 1994 , Page(s): 51 - 58
    Cited by:  Papers (19)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (628 KB)  

    The reliability polynomial is a graph invariant which is of interest where graphs are used as models of systems such as communication networks, computer networks, and transportation networks. This paper examines the use of reliability polynomials to rank the edges in a graph in terms of overall importance to graph reliability. For a given edge e in the graph G, G-e and G*e denote the graph with th... View full abstract»

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  • Power-supply current diagnosis of VLSI circuits

    Publication Year: 1994 , Page(s): 30 - 38
    Cited by:  Papers (11)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (736 KB)  

    This paper presents a technique based upon the power supply current signature (PSCS) which allows testing of mixed-signal systems, in situ. The PSCS contains important information concerning the operational status of the system; such information can be extracted using approaches based on statistical signal detection theory. The fault-detection performance of these techniques is superior to that ac... View full abstract»

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  • Computer-assisted fault-tree construction using a knowledge-based approach

    Publication Year: 1994 , Page(s): 112 - 120
    Cited by:  Papers (2)  |  Patents (2)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (688 KB)  

    This paper presents a knowledge-based approach to analyzing fault trees of engineering systems. This approach can be used to build a fault tree from a graphical functional block diagram (using reduction for replicated events), to compute minimal cut sets, and to analyze the system for redesign suggestions. An implementation of this approach in a rule-based language is presented. The results are co... View full abstract»

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  • Structures of systems with exponential life and HNBUE components

    Publication Year: 1994 , Page(s): 97 - 100
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (188 KB)  

    Structures of systems with exponential life and HNBUE (harmonic new better than used in expectation) components are studied. If a monotonic system with independent HNBUE components has exponential life then it is essentially a series system with exponential components. Thus the surmise of Ahmed and Alzaid (1988) is correct. Further, without the assumption of independence, the author derives a simi... View full abstract»

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  • Bayes reliability estimation using multiple sources of prior information: binomial sampling

    Publication Year: 1994 , Page(s): 138 - 144
    Cited by:  Papers (4)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (480 KB)  

    The authors develop Bayes estimators for the true binomial survival probability when there exist multiple sources of prior information. For each source of prior information, incomplete (partial) prior information is assumed to exist in the form of either a stated prior mean of p or a stated prior credibility interval on p; p is the parameter about which there is a degree of belief regarding its un... View full abstract»

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  • Reliability of a large consecutive-k-out-of-r-from-n:F system with unequal component-reliability

    Publication Year: 1994 , Page(s): 107 - 111
    Cited by:  Papers (7)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (296 KB)  

    For a consecutive-k-out-of-r-from-n:F system with unequal component reliability: (1) upper and lower reliability bounds are obtained; and (2) a limit formula and a life distribution for the reliability of a large system are derived under certain conditions. Many previous results on the reliability of the consecutive-k-out-of-n:F system are special cases of this paper View full abstract»

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  • Average type-II censoring times for the 2-parameter Weibull distribution

    Publication Year: 1994 , Page(s): 91 - 96
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (392 KB)  

    The average experiment-time under a type-ll censoring plan, when the lifetime follows a 2-parameter Weibull distribution, is expressed here in computable form. The formulae can be used to compute ratios of average experiment times under type-II censoring and complete sampling plans. The ratios provide information on how much experiment time can be saved by using a type-II censoring plan instead of... View full abstract»

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  • A class of subset selection procedures for Weibull populations

    Publication Year: 1994 , Page(s): 65 - 70
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (388 KB)  

    Among distributions that represent component and system life, the Weibull family is presented. Goodness of a Weibull population is defined in terms of the shape parameter. A class of subset selection-procedures based on the U-statistic (derived via the concept of convex ordering) is proposed for two cases: (1) selecting a subset from k Weibull populations which contains the population with the lar... View full abstract»

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  • The Lorenz and the scaled total-time-on-test transform curves: a unified approach

    Publication Year: 1994 , Page(s): 76 - 84
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (572 KB)  

    The strong relationship between the Lorenz and scaled total time-on-test transform curves allows measures devised separately for the fields of economics and reliability to be applied to the other field as well. This article shows that, more accurately, the Gini-index and Pietra-ratio can be useful in reliability analysis and that several other questions remain to be explored. Associated graphical ... View full abstract»

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  • Simultaneous confidence intervals for all ratios to the best: the exponential distribution

    Publication Year: 1994 , Page(s): 61 - 64
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (220 KB)  

    Consider k independent exponential populations with different scale and location (possibly unknown) parameters. A set of simultaneous upper confidence intervals for all ratios to the largest scale parameter is derived. The data are assumed to be: (1) complete; or (2) incomplete with type-II censoring. The cases of known and unknown location parameters are treated separately View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Way Kuo
City University of Hong Kong