IEEE Design & Test

Issue 3 • June 2014

Filter Results

Displaying Results 1 - 25 of 26
  • [Front cover]

    Publication Year: 2014, Page(s): C1
    Request permission for commercial reuse | |PDF file iconPDF (1016 KB)
    Freely Available from IEEE
  • [Front inside cover]

    Publication Year: 2014, Page(s): C2
    Request permission for commercial reuse | |PDF file iconPDF (351 KB)
    Freely Available from IEEE
  • IEEE Design & Test of Computers publication information

    Publication Year: 2014, Page(s): 1
    Request permission for commercial reuse | |PDF file iconPDF (58 KB)
    Freely Available from IEEE
  • Table of contents

    Publication Year: 2014, Page(s): 2
    Request permission for commercial reuse | |PDF file iconPDF (63 KB)
    Freely Available from IEEE
  • Departments [Table of Contents]

    Publication Year: 2014, Page(s): 3
    Request permission for commercial reuse | |PDF file iconPDF (160 KB)
    Freely Available from IEEE
  • The Internet of Things

    Publication Year: 2014, Page(s):4 - 5
    Request permission for commercial reuse | |PDF file iconPDF (80 KB) | HTML iconHTML
    Freely Available from IEEE
  • Guest Editors' Introduction: Cloud Computing for Embedded Systems

    Publication Year: 2014, Page(s):6 - 7
    Request permission for commercial reuse | |PDF file iconPDF (54 KB) | HTML iconHTML
    Freely Available from IEEE
  • The Swarm at the Edge of the Cloud

    Publication Year: 2014, Page(s):8 - 20
    Cited by:  Papers (25)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (670 KB) | HTML iconHTML

    The paper explains how to use sensors as the eyes, ears, hands, and feet for the cloud. This paper describes the opportunities and challenges when integrating sensors and cloud computing. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Middleware for IoT-Cloud Integration Across Application Domains

    Publication Year: 2014, Page(s):21 - 31
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (536 KB) | HTML iconHTML

    This paper presents a middleware connecting the Internet of Things and the Cloud for better security. The implementation demonstrates the proof of concept of this approach. It is an example showing how to integrate embedded systems and cloud computing. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Cloud-Aided Design for Distributed Embedded Systems

    Publication Year: 2014, Page(s):32 - 40
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (584 KB) | HTML iconHTML

    This paper presents how to use cloud computing for designing distributed embedded systems. The cloud is used as a simulation platform. The simulation environment targets the design and testing of distributed embedded systems executing applications that can access cloud services. A networked VP can run on a cloud through the infrastructure as a service (IaaS) model. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Discover more. IEEE Educational Activities [advertisement]

    Publication Year: 2014, Page(s): 41
    Request permission for commercial reuse | |PDF file iconPDF (441 KB)
    Freely Available from IEEE
  • An Analysis of Industrial SRAM Test Results—A Comprehensive Study on Effectiveness and Classification of March Test Algorithms

    Publication Year: 2014, Page(s):42 - 53
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (1222 KB) | HTML iconHTML

    This paper deals with efficient test algorithm identification of embedded SRAMs. The approach is based on silicon test results of automotive microcontroller devices, which tries to identify efficient tests by removing unnecessary test patterns that cover the same subset of faults. Results of an industrial case under 29 test algorithms and a large amount of chips are obtained; among them, efficient... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Wireless NoC Platforms With Dynamic Task Allocation for Maximum Likelihood Phylogeny Reconstruction

    Publication Year: 2014, Page(s):54 - 64
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (997 KB) | HTML iconHTML

    Maximum likelihood (ML) phylogeny is an important statistical approach in computational biology that estimates the most likely evolutionary relationship among a given set of species. This paper demonstrates how wireless network-on-chip (WiNoC)-based multicore platforms can be employed to achieve faster time-to-solution ML phylogeny reconstruction. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Information-Theoretic Framework for Evaluating and Guiding Board-Level Functional-Fault Diagnosis

    Publication Year: 2014, Page(s):65 - 75
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (1125 KB) | HTML iconHTML

    This paper describes an information-theoretic framework for evaluating the effectiveness of and providing guidance to a reasoning-based functional fault diagnosis system. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Designing Fault-Tolerant Photovoltaic Systems

    Publication Year: 2014, Page(s):76 - 84
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (1044 KB) | HTML iconHTML

    PV systems are subject to PV cell faults, which lower the output power and shorten the lifespan of the system. This paper presents the design principles and runtime control algorithms of a fault-tolerant PV system which can detect and bypass PV cell faults in situ without any manual interventions. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • IEEE Was Here: IEEE Global History Network [advertisement]

    Publication Year: 2014, Page(s): 85
    Request permission for commercial reuse | |PDF file iconPDF (1273 KB)
    Freely Available from IEEE
  • Are you keeping up with technology - or falling behind? [ieee proceedings advertisement]

    Publication Year: 2014, Page(s): 86
    Request permission for commercial reuse | |PDF file iconPDF (586 KB)
    Freely Available from IEEE
  • CEDA Currents

    Publication Year: 2014, Page(s):1 - 2
    Request permission for commercial reuse | |PDF file iconPDF (151 KB)
    Freely Available from IEEE
  • Can new uses for phaser data measurements prevent blackouts? [advertisement]

    Publication Year: 2014, Page(s): 89
    Request permission for commercial reuse | |PDF file iconPDF (797 KB)
    Freely Available from IEEE
  • Can semantic technologies make the web truly worldwide? [advertisement]

    Publication Year: 2014, Page(s): 90
    Request permission for commercial reuse | |PDF file iconPDF (1671 KB)
    Freely Available from IEEE
  • Test Technology TC Newsletter

    Publication Year: 2014, Page(s):91 - 92
    Request permission for commercial reuse | |PDF file iconPDF (83 KB) | HTML iconHTML
    Freely Available from IEEE
  • Open Access Publishing

    Publication Year: 2014, Page(s): 93
    Request permission for commercial reuse | |PDF file iconPDF (732 KB)
    Freely Available from IEEE
  • myIEEE

    Publication Year: 2014, Page(s): 94
    Request permission for commercial reuse | |PDF file iconPDF (530 KB)
    Freely Available from IEEE
  • Hey, you, get onna my cloud [The Last Byte]

    Publication Year: 2014, Page(s):95 - 96
    Request permission for commercial reuse | |PDF file iconPDF (77 KB) | HTML iconHTML
    Freely Available from IEEE
  • [Back inside cover]

    Publication Year: 2014, Page(s): C3
    Request permission for commercial reuse | |PDF file iconPDF (1487 KB)
    Freely Available from IEEE

Aims & Scope

IEEE Design & Test offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy efficient design, electronic design automation tools, practical technology, and standards.  

It was published as IEEE Design & Test of Computers between 1984 and 2012.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Joerg Henkel
Chair for Embedded Systems (CES)
Karlsruhe Institute of Technology (KIT)