IEEE Design & Test

Issue 2 • April 2014

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  • [Front cover]

    Publication Year: 2014, Page(s): C1
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  • [Front inside cover]

    Publication Year: 2014, Page(s): C2
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  • IEEE Design & Test of Computers publication information

    Publication Year: 2014, Page(s): 1
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  • Table of contents

    Publication Year: 2014, Page(s): 2
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  • Departments [Table of Contents]

    Publication Year: 2014, Page(s): 3
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  • Revisiting DAC's 50th Anniversary

    Publication Year: 2014, Page(s):4 - 5
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  • Guest Editors' Introduction: Highlights of the 50th DAC

    Publication Year: 2014, Page(s):6 - 8
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  • The Greatest “Tech-Onomic Push-Pull” in Human History

    Publication Year: 2014, Page(s):9 - 12
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (208 KB) | HTML iconHTML

    This article is based on a visionary talk presented at the 50th DAC. With a stimulating push-pull analogy, the article pleasantly compares the evolution of key industries from past, current and future eras, and underline the fundamental role of EDA in the high tech industry. View full abstract»

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  • The Problem With EDA is ... DAC 50th Anniversary - Visionary Talk

    Publication Year: 2014, Page(s):13 - 15
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  • DAC2013 Visionary Talk

    Publication Year: 2014, Page(s):16 - 18
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  • DAC 50th Anniversary Keynote

    Publication Year: 2014, Page(s):19 - 21
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  • Driving the Internet of Things

    Publication Year: 2014, Page(s):22 - 27
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  • The Design Automation Conference and the Early Days of EDA

    Publication Year: 2014, Page(s):28 - 31
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (547 KB) | HTML iconHTML

    This paper is based on an invited talk presented at the 50th DAC. Using superb examples, it portrays the early days of Electronic Design Automation field and the formation of the Design Automation Conference. View full abstract»

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  • DAC at 50: The Second 25 Years

    Publication Year: 2014, Page(s):32 - 39
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  • The Next 25 Years in EDA: A Cloudy Future?

    Publication Year: 2014, Page(s):40 - 46
    Cited by:  Papers (1)
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  • Looking into the Crystal Ball: From Transistors to the Smart Earth

    Publication Year: 2014, Page(s):47 - 55
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  • Opportunities and Challenges for Smarter Mobile Devices

    Publication Year: 2014, Page(s):56 - 60
    Request permission for commercial reuse | Click to expandAbstract |PDF file iconPDF (967 KB) | HTML iconHTML

    This article is based on a keynote address presented by the author at the 50th DAC. It discusses the state-of-the-art in semiconductor technology and its interaction with smart mobile devices, wide I/O memory access and flexible displays. View full abstract»

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  • IEEE Educational Activities

    Publication Year: 2014, Page(s): 61
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  • Test Technology TC Newsletter

    Publication Year: 2014, Page(s):62 - 63
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  • IEEE Phaser Data

    Publication Year: 2014, Page(s): 64
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  • IEEE Semantic Technology

    Publication Year: 2014, Page(s): 65
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  • CEDA Currents

    Publication Year: 2014, Page(s):66 - 68
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  • IEEE Was Here

    Publication Year: 2014, Page(s): 69
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  • IEEE Proceedings [advertisement]

    Publication Year: 2014, Page(s): 70
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  • 50 Years of DAC Moments

    Publication Year: 2014, Page(s):71 - 72
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Aims & Scope

IEEE Design & Test offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy efficient design, electronic design automation tools, practical technology, and standards.  

It was published as IEEE Design & Test of Computers between 1984 and 2012.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Joerg Henkel
Chair for Embedded Systems (CES)
Karlsruhe Institute of Technology (KIT)