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IEEE Journal of the Electron Devices Society This IEEE Publication is an Open Access only journal. Open Access provides unrestricted online access to peer-reviewed journal articles.

Issue 9 • Date Sept. 2013

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  • Table of contents

    Publication Year: 2013, Page(s): C1
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  • IEEE Journal of the Electron Devices Society publication information

    Publication Year: 2013, Page(s): C2
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  • Modeling the Performance of Single-Bit and Multi-Bit Quanta Image Sensors

    Publication Year: 2013, Page(s):166 - 174
    Cited by:  Papers (17)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (8732 KB) | HTML iconHTML

    Imaging performance metrics of single-bit and multi-bit photo-electron-counting quanta image sensors (QIS) are analyzed using Poisson arrival statistics. Signal and noise as a function of exposure are determined. The D-log H characteristic of single-bit sensors including overexposure latitude is quantified. Linearity and dynamic range are also investigated. Read-noise-induced bit-error rate is ana... View full abstract»

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  • IEEE Journal of the Electron Devices Society information for authors

    Publication Year: 2013, Page(s): C3
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Aims & Scope

The IEEE Journal of the Electron Devices Society (J-EDS) is an open access, fully electronic scientific journal publishing papers ranging from fundamental to applied research that are scientifically rigorous and relevant to electron devices.

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Editor-In-Chief
Dr. Renuka P. Jindal