IEEE Design & Test of Computers

Issue 1 • Spring 1994

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Displaying Results 1 - 5 of 5
  • ScanBist: a multifrequency scan-based BIST method

    Publication Year: 1994, Page(s):7 - 17
    Cited by:  Papers (33)  |  Patents (16)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1034 KB)

    The authors present ScanBist, a low-overhead, scan-based built-in self-test method, along with its performance in several designs. A novel clock synchronization scheme allows at-speed testing of circuits. This design allows the testing of circuits operating at more than one frequency while retaining the combinational character of the circuit to be analyzed. We can therefore apply scan patterns tha... View full abstract»

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  • Design validation: comparing theoretical and empirical results of design error modeling

    Publication Year: 1994, Page(s):18 - 26
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (783 KB)

    To use simulation for design verification, designers need a confidence measure for a given set of simulation patterns, specifically for cases in which only a subset of the possible patterns is used. The authors derive a measure of design verification coverage based on the number of design errors detected in a theoretical analysis of a circuit. To verify the theoretical analysis, they simulate erro... View full abstract»

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  • Quantifying design quality through design experiments

    Publication Year: 1994, Page(s):27 - 37
    Cited by:  Papers (12)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1909 KB)

    The authors present a model for design quality metrics, discuss its relevance, and give some examples of use. Design experiments demonstrate error data extraction and analysis. Using a model of the design process for electronic products that emphasizes the resulting quality of the design, the authors demonstrated that they can quantify design quality. They can best express the probability of an er... View full abstract»

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  • Analyzing multichip module testing strategies

    Publication Year: 1994, Page(s):40 - 52
    Cited by:  Papers (26)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1361 KB)

    Incorporating test and fault diagnosis as critical design requirements is necessary to achieve high-quality, cost-effective multichip systems. However, evaluating where and when to test, and deciding upon the best test method and level, take considerable study. The authors explore the trade-offs between various MCM test and rework strategies, then analyze the impact of cost, yield, and test effect... View full abstract»

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  • Progress in design for test: a personal view

    Publication Year: 1994, Page(s):53 - 59
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (737 KB)

    The author discusses the history and benefits of design for test. He describes common arguments against it and gives convincing rebuttals to each. In addition, he provides a glimpse into the future of DFT. The problem is that we do not have a measurable parameter that expresses the incremental gain in product quality arising from the addition of some specific DFT technique, compared to its cost of... View full abstract»

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This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

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Editor-in-Chief
Krishnendu Chakrabarty