Design & Test of Computers, IEEE
Issue 6 • Date Dec. 2012
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[Front cover]
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PDF (1229 KB)
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IEEE Xplore Digital Library [advertisement]
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PDF (1624 KB)
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IEEE Design & Test of Computers publication information
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PDF (68 KB)
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Table of Contents
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PDF (65 KB)
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Departments
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PDF (235 KB)
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Towards more digital content in wireless systems [From the EiC]
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PDF (99 KB)
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Guest Editors' Introduction: Digitally Enhanced Wireless Transceivers
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PDF (58 KB)
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Digitally Intensive Wireless Transceivers
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PDF (1098 KB)
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Pioneering in Asia With the US Venture Capital Model
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PDF (174 KB)
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IEEE Xplore [advertisement]
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PDF (1671 KB)
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Bringing Up a Chip on the Cheap
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PDF (655 KB)
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Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection
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PDF (664 KB)
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Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits
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PDF (1047 KB)
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OpenDFM Bridging the Gap Between DRC and DFM
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PDF (621 KB)
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IEEE Advancing Technology [advertisement]
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PDF (136 KB)
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Predicting the future of information technology and society [The Road Ahead]
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PDF (95 KB)
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Discover more. IEEE Educational Activities [advertisement]
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PDF (441 KB)
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Multicore madness, many-core dreams [Book Reviews]
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PDF (102 KB)
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Can new uses for phaser data measurements prevent blackouts? [advertisement]
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PDF (797 KB)
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CEDA Currents
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PDF (139 KB)
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IEEE Was Here [advertisement]
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PDF (1273 KB)
Aims & Scope
IEEE Design & Test of Computers was published between 1984 and 2012. The latest title for this publication is IEEE Design & Test.
Meet Our Editors
Editor-in-Chief
Krishnendu Chakrabarty
