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IEEE Design & Test of Computers

Issue 6 • Date Dec. 2012

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Displaying Results 1 - 25 of 28
  • [Front cover]

    Publication Year: 2012, Page(s): C1
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  • IEEE Xplore Digital Library [advertisement]

    Publication Year: 2012, Page(s): C2
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  • IEEE Design & Test of Computers publication information

    Publication Year: 2012, Page(s): 1
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  • Table of contents

    Publication Year: 2012, Page(s): 2
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  • Departments [Table of Contents]

    Publication Year: 2012, Page(s): 3
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  • Towards more digital content in wireless systems [From the EiC]

    Publication Year: 2012, Page(s): 4
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  • Guest Editors' Introduction: Digitally Enhanced Wireless Transceivers

    Publication Year: 2012, Page(s):5 - 6
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  • Digitally intensive wireless transceivers

    Publication Year: 2012, Page(s):7 - 18
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1098 KB) | HTML iconHTML

    In this review article, the author revisits the digitization journey of wireless systems and the motivations that have driven this research field, gives a brief yet concise summary of state-of-the-art solutions, and offers insights for future developments. View full abstract»

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  • Digitally intensive receiver design: opportunities and challenges

    Publication Year: 2012, Page(s):19 - 26
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (858 KB) | HTML iconHTML

    This article discusses the trade-offs involved in the implementation of a highly digital receiver and then describes a direct-sampling architecture which provides a wide range of runtime adaptability by varying parameters such as sample rate, filter order, and interpolation factor. View full abstract»

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  • Mixed-Signal SoCs With In Situ Self-Healing Circuitry

    Publication Year: 2012, Page(s):27 - 39
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1556 KB) | HTML iconHTML

    This article discusses the goals and recent achievements of the HEALICs program. The program's aim is to enhance wireless systems with sensors, actuators, and mixed-signal control loops in order to improve their performance yield. View full abstract»

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  • Dual-Control Self-Healing Architecture for High-Performance Radio SoCs

    Publication Year: 2012, Page(s):40 - 51
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1270 KB) | HTML iconHTML

    This article discusses a self-healing 60-GHz transceiver architecture which employs information collected from on-chip sensors to intelligently adjust various tuning knobs and significantly improve the post-healing performance yield. View full abstract»

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  • Pioneering in Asia With the US Venture Capital Model

    Publication Year: 2012, Page(s):52 - 55
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  • IEEE Xplore [advertisement]

    Publication Year: 2012, Page(s): 56
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  • Bringing up a chip on the cheap

    Publication Year: 2012, Page(s):57 - 65
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (655 KB) | HTML iconHTML

    Booting and debugging the functionality of silicon samples are known to be challenging and time-consuming tasks, even more so in cost-constrained environments. The authors describe their creative solutions used to bring up Stanford Smart Memories (SSM), a 55-million transistor research chip. View full abstract»

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  • Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection

    Publication Year: 2012, Page(s):66 - 73
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (664 KB) | HTML iconHTML

    Intermittent faults, being serious concerns for deep-submicron integrated circuits, are not well studied in the literature. This paper performs fault injection simulation to analyze the impact of intermittent faults, which is an important step towards the development of mitigation techniques for such threats. View full abstract»

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  • Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits

    Publication Year: 2012, Page(s):74 - 83
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1047 KB) | HTML iconHTML

    Analog circuits designed in submicrometer nodes suffer from process variations, typically requiring calibration in order to center their performance parameters and to recover yield loss. This article presents a design flow to find appropriate tuning knob settings to compensate for different process variation scenarios. View full abstract»

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  • OpenDFM Bridging the Gap Between DRC and DFM

    Publication Year: 2012, Page(s):84 - 90
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (621 KB) | HTML iconHTML

    This paper presents the details of a standard, named OpenDFM, which describes an efficient method to ensure manufacturability of integrated circuits that are designed at advanced technology nodes of today and one that can scale to address similar issues at future nodes as well. OpenDFM uses a meta-language format to capture and improve critical patterns that must be tested to ensure correct manufa... View full abstract»

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  • Employing the STDF V4-2007 Standard for Scan Test Data Logging

    Publication Year: 2012, Page(s):91 - 99
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (623 KB) | HTML iconHTML

    This paper focuses on the V4-2007 extension of the Standard Test Data Format (STDF). STDF has been used as the standard representation for logging test data from automatic test equipment (ATE). This format however lacked a key capability, i.e., storing scan test results. The V4-2007 extension of this standard, as described in this paper, provides details on its ability in efficiently storing scan ... View full abstract»

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  • IEEE Advancing Technology [advertisement]

    Publication Year: 2012, Page(s): 100
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  • Predicting the future of information technology and society [The Road Ahead]

    Publication Year: 2012, Page(s):101 - 102
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  • Discover more. IEEE Educational Activities [advertisement]

    Publication Year: 2012, Page(s): 103
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  • Multicore madness, many-core dreams [Book Reviews]

    Publication Year: 2012, Page(s):104 - 106
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  • Can new uses for phaser data measurements prevent blackouts? [advertisement]

    Publication Year: 2012, Page(s): 107
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  • CEDA Currents

    Publication Year: 2012, Page(s):108 - 109
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  • IEEE Was Here [advertisement]

    Publication Year: 2012, Page(s): 110
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Aims & Scope

This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Krishnendu Chakrabarty