By Topic

Instrumentation & Measurement Magazine, IEEE

Issue 1 • Date February 2013

Filter Results

Displaying Results 1 - 18 of 18
  • IEEE Instrumentation & Measurement Magazine - Front cover

    Publication Year: 2013 , Page(s): c1
    Request Permissions | PDF file iconPDF (814 KB)  
    Freely Available from IEEE
  • Table of contents

    Publication Year: 2013 , Page(s): 2
    Request Permissions | PDF file iconPDF (141 KB)  
    Freely Available from IEEE
  • Table of contents

    Publication Year: 2013 , Page(s): 2
    Request Permissions | PDF file iconPDF (141 KB)  
    Freely Available from IEEE
  • Coping with Uncertainty [From the Editor's Bench]

    Publication Year: 2013 , Page(s): 4 - 6
    Request Permissions | PDF file iconPDF (220 KB) |  | HTML iconHTML  
    Freely Available from IEEE
  • AUTOTESTCON 2013 [Call for Papers]

    Publication Year: 2013 , Page(s): 7
    Request Permissions | PDF file iconPDF (507 KB)  
    Freely Available from IEEE
  • Looking back and ahead [President's Perspectives]

    Publication Year: 2013 , Page(s): 6
    Request Permissions | PDF file iconPDF (199 KB) |  | HTML iconHTML  
    Freely Available from IEEE
  • Calendar

    Publication Year: 2013 , Page(s): 7
    Request Permissions | PDF file iconPDF (94 KB)  
    Freely Available from IEEE
  • Officers' reports

    Publication Year: 2013 , Page(s): 8 - 13
    Request Permissions | PDF file iconPDF (484 KB)  
    Freely Available from IEEE
  • Forensic metrology: a new application field for measurement experts across techniques and ethics

    Publication Year: 2013 , Page(s): 14 - 17
    Request Permissions | Click to expandAbstract | PDF file iconPDF (183 KB) |  | HTML iconHTML  

    The identification of the culprit of a crime has always represented a challenge, not only for the police, the jury and the judge, but also for the general public. It is not by chance that thrillers have always been very popular and successful books, especially those reporting the exploits of detectives who identify the culprit by means of strict logic, scientific knowledge, and careful observation... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • The theory of evidence: a new promising approach to the evaluation and expression of measurement uncertainty

    Publication Year: 2013 , Page(s): 18 - 23
    Request Permissions | Click to expandAbstract | PDF file iconPDF (893 KB) |  | HTML iconHTML  

    The concept of measurement uncertainty is quite new. It was proposed for the first time by the International Vocabulary of Metrology (VIM) [1] in its first edition in 1984, and it was then encompassed by the Guide to the Expression of Uncertainty in Measurements (GUM) in 1993, that represents the actual reference document [2]. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Measuring image similarity: an overview of some useful applications

    Publication Year: 2013 , Page(s): 24 - 28
    Cited by:  Papers (1)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (788 KB) |  | HTML iconHTML  

    Why is measuring image similarity useful? There are abundant computer imaging applications requiring some kind of similarity measurement as part of their processes. Although the applications are quite varied, and the implementation details of each solution are unique, all share the common thread in that features or attributes of the image (in each specific application) are measured and then compar... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • IEEE I&M Society Technical Committee Listing

    Publication Year: 2013 , Page(s): 29
    Request Permissions | PDF file iconPDF (105 KB)  
    Freely Available from IEEE
  • Introduction to load-pull systems and their applications

    Publication Year: 2013 , Page(s): 30 - 36
    Cited by:  Papers (1)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (1368 KB) |  | HTML iconHTML  

    Large-signal or non-linear characterization of transistor devices is essential for determining their performance in such non-linear applications as power amplifiers (PAs), considering the limitations of linear S-parameter characterization techniques in such applications. Load-pull is one of the most frequently used techniques for estimating and optimizing device performance in the non-linear domai... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Selected problems of power sources for wireless sensors networks [instrumentation notes]

    Publication Year: 2013 , Page(s): 37 - 43
    Request Permissions | Click to expandAbstract | PDF file iconPDF (1272 KB) |  | HTML iconHTML  

    The issue of using renewable energy sources to generate electrical power for wireless sensor networks has been the subject of extensive research for at least a decade. The main reason for the dynamic development of this research was the need to supply operating power for wireless sensor networks deployed in areas without access to the electrical grid. Power required to supply each node of the netw... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • New products

    Publication Year: 2013 , Page(s): 44 - 49
    Request Permissions | PDF file iconPDF (700 KB) |  | HTML iconHTML  
    Freely Available from IEEE
  • Membership notes

    Publication Year: 2013 , Page(s): 50 - 51
    Request Permissions | PDF file iconPDF (716 KB)  
    Freely Available from IEEE
  • Society news

    Publication Year: 2013 , Page(s): 52 - 55
    Request Permissions | PDF file iconPDF (591 KB)  
    Freely Available from IEEE
  • The 2013 IEEE Instrumentation & Measurement Society

    Publication Year: 2013 , Page(s): 56
    Request Permissions | PDF file iconPDF (137 KB)  
    Freely Available from IEEE

Aims & Scope

The magazine is a bimonthly publication.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Prof. Wendy Van Moer

wendy.w.vanmoer@ieee.org
IandMMagazineEIC@ieee.org