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Circuits and Devices Magazine, IEEE

Issue 2 • Date March 1987

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Displaying Results 1 - 25 of 41
  • Front cover

    Publication Year: 1987 , Page(s): c1
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  • [Inside front cover]

    Publication Year: 1987 , Page(s): c2
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  • [Advertisements]

    Publication Year: 1987 , Page(s): 1
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  • Cambridge University Press [advertisement]

    Publication Year: 1987 , Page(s): 2
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  • Contents

    Publication Year: 1987 , Page(s): 3
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  • List of staffs

    Publication Year: 1987 , Page(s): 4
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  • Division I director's column

    Publication Year: 1987 , Page(s): 5
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  • Editor in chief

    Publication Year: 1987 , Page(s): 6
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  • Guest editors' column

    Publication Year: 1987 , Page(s): 6
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  • Electron devices editor

    Publication Year: 1987 , Page(s): 7
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  • Effect of surface contamination on electric contact performance

    Publication Year: 1987 , Page(s): 8 - 20
    Cited by:  Papers (12)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (28692 KB)  

    Surface contamination is one of the most serious causes of failure of connectors, relays, switches, slip rings, and other devices. The most common types of contamination are oxide and corrosion products, particulates, films formed by thermal diffusion processes, debris produced by mechanical wear and fretting, outgassing and condensation on contact surfaces of volatiles from noncontact materials, ... View full abstract»

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  • Automating electronics manufacturing

    Publication Year: 1987 , Page(s): 21 - 32
    Cited by:  Papers (1)
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    The automation of electronics manufacturing is crucial to its competitiveness and technological evolution. Advanced electronics products require advanced manufacturing technologies to produce them. Both the physical manufacturing process and the data handling process must be automated to make the manufacture of such products practical. Computer-automated manufacturing is the key to the future of e... View full abstract»

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  • Surface mount technology — The future of electronic assembly

    Publication Year: 1987 , Page(s): 33 - 41
    Cited by:  Papers (1)
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    The transition made over the last 20 years from vacuum tubes to integrated circuits will probably never be matched as far as a significant size reduction. But, the competitive nature of the semiconductor industry has continuously driven vendors to minimize the size of electronic components so that more functions can be achieved in a given volume. In addition, improved electrical performance, decre... View full abstract»

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  • Radial yield variations in semiconductor wafers

    Publication Year: 1987 , Page(s): 42 - 47
    Cited by:  Papers (13)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (22340 KB)  

    Detailed examination of yield data from several different products in two different technologies and two different wafer sizes has shown a pronounced radial dependence. In all cases, the yield profile has a distinct knee starting at about 10 mm from the wafer periphery, dropping steeply within the final 5 mm. The similarity in yield profile near the periphery across all the products examined sugge... View full abstract»

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  • Integrated data base for computer-integrated manufacturing

    Publication Year: 1987 , Page(s): 48 - 54
    Cited by:  Papers (3)
    Save to Project icon | Request Permissions | Click to expandAbstract | PDF file iconPDF (11814 KB)  

    Integrating islands of information is key to integrating islands of automation. The concepts of computer-integrated manufacturing (CIM) and shared data bases are reviewed. TRWs prototype CIM Data Engine (CDE) is described to illustrate the concept. The CDE uses a hybrid data distribution strategy and ties together a heterogenous hardware, database management systems, and applications environment. View full abstract»

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  • Free-electron lasers

    Publication Year: 1987 , Page(s): 55 - 64
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    A review of the rapidly changing field of free-electron lasers (FELs) is presented. Recent advances in increasing the power, improving the efficiency, and operating at shorter wavelengths have pushed the FEL to the forefront in the quest for ultrahigh power lasers. The tunability of FELs, long recognized as a major advantage, is beginning to be exploited in a new wave of devices that will be used ... View full abstract»

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  • The PC in electrical engineering [advertisement]

    Publication Year: 1987 , Page(s): 65
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  • CHMT column

    Publication Year: 1987 , Page(s): 66
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  • EDS column

    Publication Year: 1987 , Page(s): 67
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  • CAS column

    Publication Year: 1987 , Page(s): 67 - 71
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  • LEOS column

    Publication Year: 1987 , Page(s): 72 - 79
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  • News and events

    Publication Year: 1987 , Page(s): 80 - 85
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  • Book reviews

    Publication Year: 1987 , Page(s): 86 - 88
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  • Conferences and meetings

    Publication Year: 1987 , Page(s): 89
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  • Call for papers

    Publication Year: 1987 , Page(s): 89 - 90
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Aims & Scope

IEEE Circuits and Devices Magazine (1985-2006) covers the design, implementation, packaging, and manufacture of micro-electronic and photonic devices, circuits and systems

 

This Magazine ceased publication in 2006.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Dr. Ronald W. Waynant
r.waynant@ieee.org