Issue 4 • Date Dec. 1993
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Displaying Results 1 - 7 of 7
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Trends in silicon-on-silicon multichip modules
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PDF (1205 KB)
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High-performance MCM routing
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PDF (1204 KB)
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A new framework for designing: built-in test multichip modules with pipelined test strategy
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PDF (1316 KB)
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Design issues in parallel simulation languages
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PDF (1397 KB)
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A fault-tolerant digital artificial neuron
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PDF (607 KB)
Aims & Scope
IEEE Design & Test of Computers was published between 1984 and 2012. The latest title for this publication is IEEE Design & Test.
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Editor-in-Chief
Krishnendu Chakrabarty


