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# IEEE Transactions on Reliability

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Displaying Results 1 - 23 of 23

Publication Year: 2011, Page(s): C1
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• ### IEEE Transactions on Reliability publication information

Publication Year: 2011, Page(s): C2
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• ### Quantitative Evaluation of Human-Reliability Based on Fuzzy-Clonal Selection

Publication Year: 2011, Page(s):517 - 527
Cited by:  Papers (10)
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Human reliability analysis (HRA) is necessary for system safety assessment as well as equipment reliability analysis. The cognitive reliability and error analysis method (CREAM) as a representative HRA method provides nine common performance conditions (CPCs) to represent the contextual conditions under which a given action is performed. With a scarcity of empirical data, a high uncertainty in ana... View full abstract»

• ### Reliability Analysis of H-Tree Random Access Memories Implemented With Built in Current Sensors and Parity Codes for Multiple Bit Upset Correction

Publication Year: 2011, Page(s):528 - 537
Cited by:  Papers (5)
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This paper presents an efficient technique for designing high defect tolerance Static Random Access Memories (SRAMs) with significantly low power consumption. The new approach requires drastically lower area overhead, simpler encoding and decoding algorithms, and zero fault-detection latency time for multiple error detection when compared to conventional techniques. The approach is based on the us... View full abstract»

• ### Using Bayesian Networks to Accurately Calculate the Reliability of Complementary Metal Oxide Semiconductor Gates

Publication Year: 2011, Page(s):538 - 549
Cited by:  Papers (16)
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Scaling complementary metal oxide semiconductor (CMOS) devices has been a method used very successfully over the last four decades to improve the performance and the functionality of very large scale integrated (VLSI) designs. Still, scaling is heading towards several fundamental limits as the feature size is being decreased towards 10 nm and less. One of the challenges associated with scaling is ... View full abstract»

• ### Lifetime Decrease of Halogen Lamps for Automotive by Duty Cycle Stress

Publication Year: 2011, Page(s):550 - 556
Cited by:  Papers (2)
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We analyze the effect of input voltage and interruption processes that frequently occur while driving, and how they decrease the lifetimes of halogen lamps used in automotive headlights. First, we established estimated lifetimes of halogen lamps regarding short-term use, taking accelerator use into consideration. Through failure analysis, we discovered that the main cause of failure in open haloge... View full abstract»

• ### Accelerated Life Tests for Weibull Series Systems With Masked Data

Publication Year: 2011, Page(s):557 - 569
Cited by:  Papers (20)
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This article introduces a p-stage step-stress accelerated life test on n system products, where each system contains ms-independent non-identical components connected in series, and it fails if any component has broken down. Due to cost considerations or environmental restrictions, masked causes of system failures and type-I censored observations might occur in the collected data. The t... View full abstract»

• ### Goodness-of-Fit Test Based on Kullback-Leibler Information for Progressively Type-II Censored Data

Publication Year: 2011, Page(s):570 - 579
Cited by:  Papers (24)
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We express the joint entropy of progressively Type-II censored order statistics in terms of an incomplete integral of the hazard function, and use it to develop a simple estimate of the joint entropy of progressively Type-II censored data, considered earlier by Balakrishnan , IEEE Trans. Reliability, vol. 56, pp. 349-356. We then construct a goodness-of-fit test statistic based on the Kullback-Lei... View full abstract»

• ### Optimal Replacement in the Proportional Hazards Model With Semi-Markovian Covariate Process and Continuous Monitoring

Publication Year: 2011, Page(s):580 - 589
Cited by:  Papers (6)  |  Patents (3)
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Motivated by the increasing use of condition monitoring technology for electrical transformers, this paper deals with the optimal replacement of a system having a hazard function that follows the proportional hazards model with a semi-Markovian covariate process, which we assume is under continuous monitoring. Although the optimality of a threshold replacement policy to minimize the long-run avera... View full abstract»

• ### Approximate Zero-Variance Importance Sampling for Static Network Reliability Estimation

Publication Year: 2011, Page(s):590 - 604
Cited by:  Papers (19)
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We propose a new Monte Carlo method, based on dynamic importance sampling, to estimate the probability that a given set of nodes is connected in a graph (or network) where each link is failed with a given probability. The method generates the link states one by one, using a sampling strategy that approximates an ideal zero-variance importance sampling scheme. The approximation is based on minimal ... View full abstract»

• ### Modeling Parameters of a Load-Sharing System Through Link Functions in Sequential Order Statistics Models and Associated Inference

Publication Year: 2011, Page(s):605 - 611
Cited by:  Papers (13)
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In a multi-sample experiment, we model the parameters of an equal load-sharing system by means of link functions in sequential order statistics models, and then discuss the estimation of these parameters based on a given link function. Different link functions are examined along with the corresponding maximum likelihood estimators, and their properties are studied both analytically and through Mon... View full abstract»

• ### A Sequential Decomposition Method for Estimating Flow in a Multi-Commodity, Multistate Network

Publication Year: 2011, Page(s):612 - 621
Cited by:  Papers (10)
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The weighted multi-commodity multistate unreliable network (WMMUN) is an extension of the multistate network. It is a new network composed of multistate unreliable components (such as arcs and nodes) with various weight capacities which is able to transmit different types of commodities. Currently, the method used to calculate the direct WMMUN reliability is derived from algorithms based on D View full abstract»

• ### Hardware Error Likelihood Induced by the Operation of Software

Publication Year: 2011, Page(s):622 - 639
Cited by:  Papers (2)
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The influence of the software, and its interaction and interdependency with the hardware in the creation and propagation of hardware failures, are usually neglected in reliability analyses of safety critical systems. The software operation is responsible for the usage of semiconductor devices along the system lifetime. This usage consists of voltage changes and current flows that steadily degrade ... View full abstract»

• ### Linear $m$ -Consecutive $k$ -out-of-$r$ -From- $n:{rm F}$ Systems

Publication Year: 2011, Page(s):640 - 646
Cited by:  Papers (5)
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This paper proposes a new model that generalizes the linear consecutive k-out-of-r-from-n system to the case of m consecutive runs of r elements. In this model, the system consists of n linearly ordered statistically independent elements, and fails iff in each of at least m consecutive overlapping groups of r consecutive elements at least ... View full abstract»

• ### Reliability Analysis of $M$-for- $N$ Shared Protection Systems With General Repair-Time Distributions

Publication Year: 2011, Page(s):647 - 657
Cited by:  Papers (5)
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In this paper, we investigate the user perceived reliability of M-for-N shared protection systems. The M-for-N shared protection system is a general type of the fault-tolerant configuration with shared backup units. We assume that there are N working units each serving a single group of users and M shared protection (spare) units in the system. We also assume that the time to failure of the unit i... View full abstract»

• ### Reliability and Availability Analysis of a Repairable $k$-out-of-$n:G$ System With $R$ Repairmen Subject to Shut-Off Rules

Publication Year: 2011, Page(s):658 - 666
Cited by:  Papers (18)
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The k-out-of-n:G system is widely used in reliability and maintenance engineering. We consider a general k-out-of-n:G system which has identical components with identical repair time and lifetime distributions. There are R identical repairmen in the system. The shut-off rules of suspended animation, continuous operation, ... View full abstract»

• ### System Reliability Optimization Considering Uncertainty: Minimization of the Coefficient of Variation for Series-Parallel Systems

Publication Year: 2011, Page(s):667 - 674
Cited by:  Papers (14)
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System reliability optimization models considering uncertainty are described, and new algorithms are proposed to minimize the coefficient of variation of the system reliability estimate. This is a realistic, important formulation because the reliability of most components is not known with certainty, and decision-makers are often risk averse, preferring a system with a slightly lower estimated rel... View full abstract»

• ### Schedulability Analysis for Hard Network Lifetime Wireless Sensor Networks With High Energy First Clustering

Publication Year: 2011, Page(s):675 - 688
Cited by:  Papers (9)
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Network lifetime predictability is an essential system requirement for the type of wireless sensor network (WSN) used in safety-critical and highly-reliable applications. All sensor nodes in these time-critical WSNs should meet the lifetime constraint at any time instance, else it may cause severe consequences that involve economic losses, or even fatalities. In the literature, clustering sensors ... View full abstract»

• ### Exact Reliability of a Linear Connected-$(r,s)$-out-of-$(m,n)$: F System

Publication Year: 2011, Page(s):689 - 698
Cited by:  Papers (5)
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A linear connected-(r, s)-out-of-(m, n) : F system consists of m×n components arranged in m rows by n columns, and it fails iff there exists a r × s subsystem in which all components are failed. The linear connected-(r, s)-out-of-(m, n) : F system can be used for modeling engineering systems such as temperature feeler systems, supervision systems, etc. In this paper, a general method... View full abstract»

• ### Institutional listings

Publication Year: 2011, Page(s): 699
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• ### Why we joined ... [advertisement]

Publication Year: 2011, Page(s): 700
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• ### IEEE Transactions on Reliability institutional listings

Publication Year: 2011, Page(s): C3
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• ### IEEE Transactions on Reliability institutional listings

Publication Year: 2011, Page(s): C4
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## Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

## Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu