IBM Journal of Research and Development
Issue 4 • Date July-Aug. 2011
Cathode Lens Microscopy for Nanoscience
This issue of the IBM journal describes recent advances in the field of nanoscience, with an emphasis on cathode lens-based microscopy methods, including LEEM (low-energy electron microscopy), PEEM (photoemission electron microscopy), and other related analytical approaches. Papers highlight scientific advances and instrumental developments on topics that include thin films, organic films, surface chemistry, magnetism, time-resolved methods, and various novel applications of microscopy in material science.
This issue of the IBM journal describes recent advances in the field of nanoscience, with an emphasis on cathode lens-based microscopy methods, including LEEM (low-energy electron microscopy), PEEM (photoemission electron microscopy), and other related analytical approaches. Papers highlight scientific advances and instrumental developments on topics that include thin films, organic films, surface chemistry, magnetism, time-resolved methods, and various novel applications of microscopy in material science.
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Displaying Results 1 - 18 of 18
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Cover 1
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Table of Contents
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Preface: Cathode Lens Microscopy for Nanoscience
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Partial secondary electron-yield NEXAFS spectromicroscopy with an energy-filtered X-PEEM
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PDF (2140 KB)
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In adsorption on Si(112) and its impact on Ge growth
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Direct metallographic analysis of an iron meteorite using hard x-ray photoelectron emission microscopy
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Diffusion and submonolayer growth of para-sexiphenyl on Ir(111) and Ir(111)-supported graphene
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PDF (3518 KB)
Aims & Scope
The IBM Journal of Research and Development is a peer-reviewed technical journal, published bimonthly, which features the work of authors in the science, technology and engineering of information systems.
Meet Our Editors
Editor-in-Chief
John J. Ritsko
IBM T. J. Watson Research Center
