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IBM Journal of Research and Development

Issue 4 • Date July-Aug. 2011

Cathode Lens Microscopy for Nanoscience

This issue of the IBM journal describes recent advances in the field of nanoscience, with an emphasis on cathode lens-based microscopy methods, including LEEM (low-energy electron microscopy), PEEM (photoemission electron microscopy), and other related analytical approaches. Papers highlight scientific advances and instrumental developments on topics that include thin films, organic films, surface chemistry, magnetism, time-resolved methods, and various novel applications of microscopy in material science.

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Aims & Scope

The IBM Journal of Research and Development is a peer-reviewed technical journal, published bimonthly, which features the work of authors in the science, technology and engineering of information systems.

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Meet Our Editors

Clifford A. Pickover
IBM T. J. Watson Research Center

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