Issue 1 • Date Feb. 1989
Filter Results
Displaying Results 1 - 25 of 28
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A built-in Hamming code ECC circuit for DRAMs
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PDF (595 KB)
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High-speed CMOS circuit technique
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PDF (1003 KB)
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A compact thermal noise model for the investigation of soft error rates in MOS VLSI digital circuits
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PDF (1022 KB)
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A framework to evaluate technology and device design enhancements for MOS integrated circuits
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PDF (925 KB)
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A process-parameter-based circuit simulation model for ion-implanted MOSFETs and MESFETs
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PDF (624 KB)
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CMOS stuck-open fault testability
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PDF (223 KB)
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Large-swing CMOS buffer amplifier
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PDF (460 KB)
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Aims & Scope
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits.
Meet Our Editors
Editor-in-Chief
Un-Ku Moon
Oregon State University, EECS


