IEEE Journal on Emerging and Selected Topics in Circuits and Systems

Issue 1 • March 2011

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Displaying Results 1 - 14 of 14
  • Table of contents

    Publication Year: 2011, Page(s): C1
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  • IEEE Journal on Emerging and Selected Topics in Circuits and Systems publication information

    Publication Year: 2011, Page(s): C2
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  • Inaugural Editorial

    Publication Year: 2011, Page(s):1 - 3
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  • Guest Editorial

    Publication Year: 2011, Page(s): 4
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  • Overcoming Variations in Nanometer-Scale Technologies

    Publication Year: 2011, Page(s):5 - 18
    Cited by:  Papers (31)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (848 KB) | HTML iconHTML

    Nanometer-scale circuits are fundamentally different from those built in their predecessor technologies in that they are subject to a wide range of new effects that induce on-chip variations. These include effects associated with printing finer geometry features, increased atomic-scale effects, and increased on-chip power densities, and are manifested as variations in process and environmental par... View full abstract»

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  • Containing the Nanometer “Pandora-Box”: Cross-Layer Design Techniques for Variation Aware Low Power Systems

    Publication Year: 2011, Page(s):19 - 29
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1105 KB) | HTML iconHTML

    The demand for richer multimedia services, multifunctional portable devices and high data rates can only been visioned due to the improvement in semiconductor technology. Unfortunately, sub-90 nm process nodes uncover the nanometer Pandora-box exposing the barriers of technology scaling-parameter variations, that threaten the correct operation of circuits, and increased energy consumption, that li... View full abstract»

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  • Robust System Design to Overcome CMOS Reliability Challenges

    Publication Year: 2011, Page(s):30 - 41
    Cited by:  Papers (40)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1369 KB) | HTML iconHTML

    Today's mainstream electronic systems typically assume that transistors and interconnects operate correctly over their useful lifetime. With enormous complexity and significantly increased vulnerability to failures compared to the past, future system designs cannot rely on such assumptions. For coming generations of silicon technologies, several causes of hardware reliability failures, largely ben... View full abstract»

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  • CAS-FEST 2010: Mitigating Variability in Near-Threshold Computing

    Publication Year: 2011, Page(s):42 - 49
    Cited by:  Papers (19)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1377 KB) | HTML iconHTML

    Near threshold computing has recently gained significant interest due to its potential to address the prohibitive increase of power consumption in a wide spectrum of modern VLSI circuits. This tutorial paper starts by reviewing the benefits and challenges of near threshold computing. We focus on the challenge of variability and discuss circuit and architecture solutions tailored to three different... View full abstract»

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  • Computer-Aided Analog Circuit Design for Reliability in Nanometer CMOS

    Publication Year: 2011, Page(s):50 - 58
    Cited by:  Papers (42)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1179 KB) | HTML iconHTML

    Integrated analog circuit design in nanometer CMOS technologies brings forth new and significant reliability challenges. Ever-increasing process variability effects and transistor wear-out phenomena such as BTI, hot carrier degradation and dielectric breakdown force designers to use large design margins and to increase the uncertainty on the circuit lifetime. To help designers to tackle these prob... View full abstract»

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  • Process Compensation Loops for High Speed Ring Oscillators in Sub-Micron CMOS

    Publication Year: 2011, Page(s):59 - 70
    Cited by:  Papers (4)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1050 KB) | HTML iconHTML

    In this paper, we present two implementations of a closed-loop process compensation scheme for high speed ring oscillators-the comparator based and the switched capacitor based loops. We provide detailed discussion of the frequency accuracy, loop stability, and implementation cost for each design. More than 150 test chips from multiple wafer-runs in a 90 nm CMOS process verify that frequency accur... View full abstract»

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  • Why we joined

    Publication Year: 2011, Page(s): 71
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  • IEEE Journal on Emerging and Selected Topics in Circuits and Systems Information for authors

    Publication Year: 2011, Page(s): 72
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  • IEEE Circuits and Systems Society Information

    Publication Year: 2011, Page(s): C3
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  • Blank page [back cover]

    Publication Year: 2011, Page(s): C4
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Aims & Scope

The IEEE Journal on Emerging and Selected Topics in Circuits and Systems publishes special issues covering the entire Field of Interest of the IEEE Circuits and Systems Society and with particular focus on emerging areas.

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Meet Our Editors

Editor-in-Chief
Yen-Kuang Chen
Intel Corporation
Santa Clara, CA, USA
y.k.chen@ieee.org