Intel Corp., Chandler, AZ, USA
(1)
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
(1)
Dept. of Electr. & Comput. Eng., George Mason Univ., Fairfax, VA, USA
(1)
Dept. of Phys., Brown Univ., Providence, RI, USA
(1)
Army Res. Lab., Adelphi, MD, USA
(1)
Taiwan Semicond. Manuf. Co., Hsinchu, Taiwan
(1)
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
(1)
Inst. of Microelectron., Peking Univ., Beijing, China
(1)
Inst. of Electron. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
(1)
Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
(1)
Sch. of Electron. & Inf. Eng., South China Univ. of Technol., Guangzhou, China
(1)
Sch. of Eng., Univ. of Warwick, Coventry, UK
(1)
Fraunhofer Inst. for Microelectron. Circuits & Syst., Duisburg, Germany
(1)
Dept. of Aerosp. Eng. & Eng. Mech., Univ. of Texas, Austin, TX, USA
(1)
IBM Syst. & Technol. Group, Essex Junction, VT, USA
(1)
Dept. of Mater. Sci. & Eng., Univ. of Florida, Gainesville, FL, USA
(1)
Dept. of Photonics & Display Inst., Nat. Chiao Tung Univ., Hsinchu, Taiwan
(1)
Dept. of Electr. Eng., Nat. Univ. of Kaohsiung, Kaohsiung, Taiwan
(1)
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
(1)
Microelectron. & Nanotechnol. Div., Centre de Dev. des Technol. Av., Algiers, Algeria
(1)
NAVSEA Crane, Crane, IN, USA
(1)
Reliability Anal. Res. Center, Hanyang Univ., Seoul, South Korea
(1)
Electron. Eng. Dept., Univ. Autonoma de Barcelona, Bellaterra, Spain
(1)
LSI Res. Lab., Renesas Electron. Corp., Sagamihara, Japan
(1)
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
(1)
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