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IEEE Instrumentation & Measurement Magazine

Issue 1 • Date Feb. 2011

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Displaying Results 1 - 16 of 16
  • IEEE Instrumentation & Measurement Magazine - Front cover

    Publication Year: 2011, Page(s): C1
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  • Table of contents

    Publication Year: 2011, Page(s): 2
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  • I call it flexibility [From the Editor's Bench]

    Publication Year: 2011, Page(s): 4
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  • The challenge of measurement science [President's Perspectives]

    Publication Year: 2011, Page(s):6 - 7
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  • The right tools for the right measurement

    Publication Year: 2011, Page(s):8 - 13
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1013 KB) | HTML iconHTML

    As we begin to see what could be the end of the silicon revolution and a transition to a nanotechnology/carbon based electronics era, it is clear that we need to develop new measurement techniques and tools. The continued scaling of electronics creates new problems that must be measured and understood before any kind of commercialization and mass production can take place. Using the measurement tr... View full abstract»

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  • 1/f noise in advanced CMOS transistors

    Publication Year: 2011, Page(s):14 - 22
    Cited by:  Papers (15)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1951 KB) | HTML iconHTML

    This paper is a review of 1/f noise in state-of-the-art advanced MOSFETs, where the channel length has deep submicron or nano-scale dimensions. The origin of 1/f noise, models of 1/f noise, and ways of measuring 1/f noise are briefly reviewed. View full abstract»

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  • 2010 I2MTC - Call for presentations

    Publication Year: 2011, Page(s): 23
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  • Quantitatively analyzing the performance of integrated circuits and their reliability

    Publication Year: 2011, Page(s):24 - 31
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1504 KB) | HTML iconHTML

    In this paper the importance of microprocessor and IC device reliability is discussed and how modifying the operational parameters of these devices through over-and under-clocking can either reduce or improve overall reliability, respectively, and directly affect the lifetime of the system in which these devices are installed. View full abstract»

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  • Automatic noninvasive measurement of arterial blood pressure

    Publication Year: 2011, Page(s):32 - 37
    Cited by:  Papers (18)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (629 KB) | HTML iconHTML

    This paper discussed arterial blood pressure measurement. Because of the high rate of hypertension in the adult population and its harmful effects, the measurement of arterial blood pressure is of great clinical significance. Manual sphygmomanometry, developed more than a hundred years ago, is currently the most accurate non-invasive technique for arterial blood pressure measurement. Since manual ... View full abstract»

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  • Can ferrohydrodynamic instabilities be useful in transducers? [Instrumentation Notes]

    Publication Year: 2011, Page(s):38 - 45
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1551 KB) | HTML iconHTML

    Magnetic fluids are formed when magnetic particles are dispersed in a carrier liquid and suitably coated [1], [2]. Coating the particles provides an elastic shield which avoids particle friction, and it can be also used to implement bio-assay strategies. There are two types of magnetic fluids: magneto-rheological fluids and ferrofluids. The size of the dispersed particles is what distinguishes the... View full abstract»

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  • Newproducts

    Publication Year: 2011, Page(s):46 - 51
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  • Calendar

    Publication Year: 2011, Page(s): 52
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  • 2011 IEEE International Workshop on Medical Measurements and Applications - Call for Papers

    Publication Year: 2011, Page(s): 53
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  • IEEE I&M Society Technical Committee Listing

    Publication Year: 2011, Page(s): 54
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  • IEEE AUTOTESTCON 2011 - Call for Papers

    Publication Year: 2011, Page(s): 55
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  • The 2011 IEEE Instrumentation & Measurement Society

    Publication Year: 2011, Page(s): 56
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Aims & Scope

The magazine is a bimonthly publication.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Prof. Wendy Van Moer

wendy.w.vanmoer@ieee.org
IandMMagazineEIC@ieee.org