Design & Test of Computers, IEEE
Issue 6 • Date Nov.-Dec. 2010
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Displaying Results 1 - 22 of 22
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[Front cover]
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PDF (193 KB)
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[Front cover]
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PDF (59 KB)
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Contents
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PDF (374 KB)
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Increasing yield and reliability through postsilicon tuning
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PDF (120 KB)
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Call for Papers
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PDF (59 KB)
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Guest Editors' Introduction: Managing Uncertainty through Postfabrication Calibration and Repair
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PDF (81 KB)
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Runtime Thermal Management Using Software Agents for Multi- and Many-Core Architectures
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PDF (800 KB)
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Masthead
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PDF (53 KB)
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Conference Reports
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PDF (433 KB)
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About the power problem [review of "Power-Aware Testing and Test Strategies for Low Power Devices" (Girard, P., Eds., et.; 2010)]
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PDF (114 KB)
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CEDA Currents
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PDF (120 KB)
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Design Automation Technical Committee Newsletter
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PDF (358 KB)
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Test Technology TC Newsletter
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PDF (112 KB)
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Are you having fun yet?
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PDF (81 KB)
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[Advertisement - Back cover]
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PDF (787 KB)
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[Advertisement - Back cover]
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PDF (1243 KB)
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Annual Index
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PDF (108 KB)
Aims & Scope
IEEE Design & Test of Computers was published between 1984 and 2012. The latest title for this publication is IEEE Design & Test.
Meet Our Editors
Editor-in-Chief
Krishnendu Chakrabarty
