By Topic

IEEE Design & Test of Computers

Issue 6 • Date Nov.-Dec. 2010

Filter Results

Displaying Results 1 - 22 of 22
  • [Front cover]

    Publication Year: 2010, Page(s): c1
    Request permission for commercial reuse | PDF file iconPDF (193 KB)
    Freely Available from IEEE
  • Front Covers 
  • Table of Contents

    Publication Year: 2010, Page(s): c2
    Request permission for commercial reuse | PDF file iconPDF (59 KB)
    Freely Available from IEEE
  • Toc 
  • Departments [Table of Contents]

    Publication Year: 2010, Page(s): 1
    Request permission for commercial reuse | PDF file iconPDF (374 KB)
    Freely Available from IEEE
  • Increasing yield and reliability through postsilicon tuning

    Publication Year: 2010, Page(s): 2
    Request permission for commercial reuse | PDF file iconPDF (120 KB) | HTML iconHTML
    Freely Available from IEEE
  • Call for Papers

    Publication Year: 2010, Page(s): 3
    Request permission for commercial reuse | PDF file iconPDF (59 KB)
    Freely Available from IEEE
  • Guest Editors' Introduction: Managing Uncertainty through Postfabrication Calibration and Repair

    Publication Year: 2010, Page(s):4 - 5
    Cited by:  Papers (2)
    Request permission for commercial reuse | PDF file iconPDF (81 KB) | HTML iconHTML
    Freely Available from IEEE
  • Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems

    Publication Year: 2010, Page(s):6 - 17
    Cited by:  Papers (15)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1788 KB) | HTML iconHTML

    Tuning knobs are becoming common in analog and RF devices for postsilicon calibration for variation tolerance and compensation. This article presents a low-cost, hardware-iterative technique based on a steepest-descent-based gradient search algorithm and demonstrates its utility in performance tuning of a 2.4-GHz transmitter system. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies

    Publication Year: 2010, Page(s):18 - 25
    Cited by:  Papers (4)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (669 KB) | HTML iconHTML

    Despite their inherent self-healing nature, noise (jitter) in phase-locked loops is sensitive to process and environmental variation. This article discusses automatic frequency calibration and amplitude control techniques that rely on a negative feedback loop with a large emphasis on digitally assisted calibration. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Postsilicon Adaptation for Low-Power SRAM under Process Variation

    Publication Year: 2010, Page(s):26 - 35
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (869 KB) | HTML iconHTML

    Due to the high density requirement for embedded memories, such memories are highly vulnerable to process variation-induced failures. A conservative design approach can largely affect memory density and access performance. This article analyzes variation effects in SRAM and presents low-cost, adaptive postsilicon repair mechanisms. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • The Dawn of Predictive Chip Yield Design: Along and Beyond the Memory Lane

    Publication Year: 2010, Page(s):36 - 45
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1027 KB) | HTML iconHTML

    Statistical approaches for yield estimation and robust design are vital in the current variation-dominated design era. This article presents a mixture importance sampling methodology to enable yield-driven design and extends its application beyond memories to peripheral circuits and logic blocks. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A Built-in Method to Repair SoC RAMs in Parallel

    Publication Year: 2010, Page(s):46 - 57
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (852 KB) | HTML iconHTML

    Built-in-self-repair is an enabling approach for improving memory yield in system-on-chip designs. Reducing the overhead of repair circuits while minimizing the test and repair time is of prime importance. This article presents a fast parallel repair methodology for SoC memory cores and an associated automation framework. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Runtime Thermal Management Using Software Agents for Multi- and Many-Core Architectures

    Publication Year: 2010, Page(s):58 - 68
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (800 KB) | HTML iconHTML

    System-level runtime approaches provide a new dimension of variation tolerance in multi- and many-core systems. This article looks into a scalable system-level, dynamic thermal management solution using an agent-based, distributed-application-mapping approach. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • [Masthead]

    Publication Year: 2010, Page(s): 69
    Request permission for commercial reuse | PDF file iconPDF (53 KB)
    Freely Available from IEEE
  • Conference Reports

    Publication Year: 2010, Page(s):70 - 71
    Request permission for commercial reuse | PDF file iconPDF (433 KB) | HTML iconHTML
    Freely Available from IEEE
  • About the power problem [review of "Power-Aware Testing and Test Strategies for Low Power Devices" (Girard, P., Eds., et.; 2010)]

    Publication Year: 2010, Page(s):72 - 73
    Request permission for commercial reuse | PDF file iconPDF (114 KB) | HTML iconHTML
    Freely Available from IEEE
  • CEDA Currents

    Publication Year: 2010, Page(s):74 - 75
    Request permission for commercial reuse | PDF file iconPDF (120 KB) | HTML iconHTML
    Freely Available from IEEE
  • Design Automation Technical Committee Newsletter

    Publication Year: 2010, Page(s):76 - 77
    Request permission for commercial reuse | PDF file iconPDF (358 KB)
    Freely Available from IEEE
  • Test Technology TC Newsletter

    Publication Year: 2010, Page(s):78 - 79
    Request permission for commercial reuse | PDF file iconPDF (112 KB)
    Freely Available from IEEE
  • Are you having fun yet?

    Publication Year: 2010, Page(s): 80
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (81 KB) | HTML iconHTML

    Gordon Moore observed, 45 years ago, that the number of components in an IC had doubled every year since the IC's invention in 1958 and predicted this trend would continue. IC scaling has fueled the circuit design industry and the global economy by providing increased processing capabilities at lower costs in each successive technology generation. Somewhere between 65 nm and 45 nm, the industry en... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • [Advertisement - Back cover]

    Publication Year: 2010, Page(s): c3
    Request permission for commercial reuse | PDF file iconPDF (787 KB)
    Freely Available from IEEE
  • [Advertisement - Back cover]

    Publication Year: 2010, Page(s): c4
    Request permission for commercial reuse | PDF file iconPDF (1243 KB)
    Freely Available from IEEE
  • Annual Index

    Publication Year: 2010, Page(s): 0
    Request permission for commercial reuse | PDF file iconPDF (108 KB)
    Freely Available from IEEE

Aims & Scope

This Periodical ceased production in 2012. The current retitled publication is IEEE Design & Test.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Krishnendu Chakrabarty