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IBM Journal of Research and Development

Issue 5 • Sep. 1965

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Displaying Results 1 - 13 of 13
  • A Hard-Sphere Model to Simulate Alloy Thin Films

    Publication Year: 1965, Page(s):358 - 374
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1137 KB)

    A model is developed for the simulation of alloy thin films by forming a layer consisting of spheres of two different sizes mixed randomly in any desired proportion. Included in the model is the possibility for vibration to simulate low-temperature annealing, as well as the use of a “substrate” containing periodic grooves to simulate epitaxial growth. Optical (Fraunhofer) diffraction... View full abstract»

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  • Observations of “Clean” Surfaces of Si, Ge, and GaAs by Low-Energy Electron Diffraction

    Publication Year: 1965, Page(s):375 - 387
    Cited by:  Papers (1)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (598 KB)

    The {100}, {110} and {111} surfaces of silicon, germanium and gallium arsenide, cleaned in ultra-high vacuum by heat-treatments alone or by ion-bombardments followed by anneals, were studied with the display-type low-energy electron diffraction technique. Most surface structures reported in the literature by others could be reproduced, namely, Si(111)7, Ge... View full abstract»

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  • Simulation of the Catalytic Cracking Process for Styrene Production

    Publication Year: 1965, Page(s):388 - 399
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (588 KB)

    A mathematical model is presented for simulating the steady-state catalytic dehydrogenation of ethylbenzene to styrene and other associated side reactions. The various differential equations describing the material and energy balances were integrated using a fourth-order Runge-Kutta method on an IBM 7090. Several runs on the computer were made to study the effect of change in feed rates, feed-to-s... View full abstract»

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  • Junction Heating of GaAs Injection Lasers During Continuous Operation

    Publication Year: 1965, Page(s):400 - 404
    Cited by:  Papers (2)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (353 KB)

    The rise of the junction temperature during continuous operation of an injection laser has been measured as a function of current and is discussed for different cases. The dependence of the emitted light power on current is computed from the thermal data and compared with the experiment. The threshold current and the differential quantum efficiency for continuous operation are discussed. View full abstract»

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  • Solution of the Equation for Wave Propagation in Layered Slabs with Complex Dielectric Constants

    Publication Year: 1965, Page(s):405 - 411
    Cited by:  Papers (2)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (460 KB)

    A numerical procedure for solving the eigenvalue equation u″ = [V(x) − E]u, where V(x) is complex, is described. The number of eigenvalues, and their approximate location, can be determined by contour integration in the complex trial eigenvalue plane. Some general features of the solutions, and an example, are given. View full abstract»

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  • The Chain Magnetic Memory Element

    Publication Year: 1965, Page(s):412 - 417
    Cited by:  Papers (1)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (414 KB)

    Nondestructive reading of orthogonal-field memory elements, in particular metallic tape memory cores in which an interrogating current through the tape material is employed, has been described in the literature,1,2 and many workers have reported on other orthogonal field memory elements. The experimental element described in this paper differs in geometry from previously proposed orthog... View full abstract»

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  • Digital Pneumatic Logic Using Coded Tapes

    Publication Year: 1965, Page(s):418 - 421
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (360 KB)

    A number of exploratory studies have been made during the past five years on the use of fluid logic elements to replace conventional electronics in certain applications. IBM began to study fluid logic at the Zurich Research Laboratory about 1956. This work was initially directed toward using a spool valve to perform the logic function1 but was rapidly expanded to investigate other eleme... View full abstract»

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  • The Effective Carrier Ionization Rate in a p-n Junction at Avalanche Breakdown

    Publication Year: 1965, Page(s):422 - 423
    Cited by:  Papers (2)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (276 KB)

    A comparison between experiment and theory has indicated an inaccuracy in avalanche breakdown calculations for low voltage silicon p-n junctions. The source of this error has been located. It is shown that the published values of effective carrier ionization rate, at avalanche breakdown, do not apply for low values of avalanche breakdown voltage. This error results from an inadequate mathematical ... View full abstract»

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  • Technical Papers by IBM Authors Published Recently in Other Journals

    Publication Year: 1965, Page(s):424 - 435
    IEEE is not the copyright holder of this material | PDF file iconPDF (691 KB)
    Freely Available from IEEE
  • Recent IBM Patents

    Publication Year: 1965, Page(s):436 - 437
    IEEE is not the copyright holder of this material | PDF file iconPDF (244 KB)
    Freely Available from IEEE
  • Authors

    Publication Year: 1965, Page(s):438 - 439
    IEEE is not the copyright holder of this material | PDF file iconPDF (236 KB)
    Freely Available from IEEE
  • Contents of previous two issues

    Publication Year: 1965, Page(s):440 - 441
    IEEE is not the copyright holder of this material | PDF file iconPDF (214 KB)
    Freely Available from IEEE
  • Errata [Addendum to Volume 9, Number 4]

    Publication Year: 1965, Page(s): 441
    IEEE is not the copyright holder of this material | PDF file iconPDF (198 KB)
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The IBM Journal of Research and Development is a peer-reviewed technical journal, published bimonthly, which features the work of authors in the science, technology and engineering of information systems.

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Editor-in-Chief
Clifford A. Pickover
IBM T. J. Watson Research Center