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IBM Journal of Research and Development

Issue 6 • Date Nov. 1979

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Displaying Results 1 - 14 of 14
  • Survey of Computer-Aided Electrical Analysis of Integrated Circuit Interconnections

    Publication Year: 1979, Page(s):626 - 639
    Cited by:  Papers (71)  |  Patents (4)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1139 KB)

    In the last decade an important shift has taken place in the design of hardware with the advent of smaller and denser integrated circuits and packages. Analysis techniques are required to ensure the proper electrical functioning of this hardware. In this paper we give a coherent survey of the modeling and computer-aided design techniques applicable to solving these problems. Methods are considered... View full abstract»

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  • Potential Distribution and Multi-Terminal DC Resistance Computations for LSI Technology

    Publication Year: 1979, Page(s):640 - 651
    Cited by:  Papers (12)  |  Patents (2)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (818 KB)

    Computer time and storage requirements are the two main considerations in the design of a packaging analysis software tool for the problem of calculating the electric potential distribution in arbitrary geometrical shapes. The FEM (Finite Element Method) is the accepted approach for solving such problems. A new formulation for the linear triangular element is presented which is used to derive a ve... View full abstract»

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  • Resistive and Inductive Skin Effect in Rectangular Conductors

    Publication Year: 1979, Page(s):652 - 660
    Cited by:  Papers (126)  |  Patents (6)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (695 KB)

    A model based on network theory is presented for calculating the frequency-dependent resistance and inductance per unit length matrices for transmission line systems consisting of conductors with rectangular cross sections. The calculated results are compared with actual measurements. Excellent agreement is obtained over a wide range of frequencies, including the mid-range where neither dc values ... View full abstract»

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  • Three-Dimensional Inductance Computations with Partial Element Equivalent Circuits

    Publication Year: 1979, Page(s):661 - 668
    Cited by:  Papers (76)  |  Patents (3)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (496 KB)

    Inductance computations represent an important part in the design of hardware packages, especially for high performance computers. Partial element equivalent circuits (PEEC) are used in this paper to investigate two problems, viz., the inductance of ground plane connections and the reduction in inductance due to eddy currents set up in perpendicular crossing wires. The results from the PEEC models... View full abstract»

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  • Exploiting Symmetry in Electrical Packaging Analysis

    Publication Year: 1979, Page(s):669 - 674
    Cited by:  Papers (6)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (466 KB)

    Many properties of physical systems can be expressed by symmetric matrices of order n, where n is the number of components in the system. The computer storage requirement for inverting the most general symmetric matrix is n(n+1)/2 storage locations. For large values of n, the number of multiplications required is proportional to n3. If the physical system possesses certain geometrical s... View full abstract»

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  • Transient Analysis of Uniform Resistive Transmission Lines in a Homogeneous Medium

    Publication Year: 1979, Page(s):675 - 681
    Cited by:  Papers (48)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (511 KB)

    Transient analysis of resistive transmission lines has always been difficult. The need for this type of analysis, however, did not become critical until high-density circuit packaging became commonplace. This paper discusses a method for the transient analysis of resistive lines. It does not require a large number of equivalent circuit elements, and yet it can be used to represent a resistive line... View full abstract»

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  • Geometry Effects of Small MOSFET Devices

    Publication Year: 1979, Page(s):682 - 688
    Cited by:  Papers (5)  |  Patents (2)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (571 KB)

    The effects of diminishing MOS inversion channel length or width on device characteristics are discussed. As opposed to the geometric device size, an “electric device size” is established by normalizing all dimensions on an appropriately chosen depletion layer width. It is shown how this “electric size” governs the intensity of geometry effects. DC device modeling metho... View full abstract»

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  • Stability of Lateral pnp Transistors During Accelerated Aging

    Publication Year: 1979, Page(s):689 - 695
    Cited by:  Papers (1)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (438 KB)

    Lateral pnp devices stressed under accelerated temperature and voltage conditions show a degradation in the transistor breakdown voltage. These results and additional experiments that were conducted to better understand the mechanisms involved in the observed behavior are described. It was concluded that the degradation can be related to a negative surface charge in the base region of the transist... View full abstract»

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  • An Elementary Proof of Nonexistence of Isometries between ℓpk and ℓqk

    Publication Year: 1979, Page(s):696 - 699
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (268 KB)

    For k = 2, the two-dimensional coordinate spaces ℓ12 and ℓ2 are isometric. Consequently, results on computational complexity for one space can be transplanted to the other in a natural way. In this note, an elementary proof is given for the nonisometry between ℓpk and ℓqk for... View full abstract»

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  • Recent papers by IBM authors

    Publication Year: 1979, Page(s):700 - 705
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (572 KB)

    Reprints of the papers listed here may usually be obtained by writing directly to the authors. The authors' IBM divisions are identified as follows: CHQ is Corporate Headquarters; DPD, Data Processing Division; DSD, Data Systems Division; FED, Field Engineering Division; FSD, Federal Systems Division; GPD, General Products Division; GSD, General Systems Division; GTD, General Technology Division, ... View full abstract»

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  • Recent IBM patents

    Publication Year: 1979, Page(s):706 - 710
    IEEE is not the copyright holder of this material | PDF file iconPDF (368 KB)
    Freely Available from IEEE
  • Authors

    Publication Year: 1979, Page(s):711 - 712
    IEEE is not the copyright holder of this material | PDF file iconPDF (255 KB)
    Freely Available from IEEE
  • Author Index for papers in Volume 23

    Publication Year: 1979, Page(s):713 - 715
    IEEE is not the copyright holder of this material | PDF file iconPDF (197 KB)
    Freely Available from IEEE
  • Subject Index for papers in Volume 23

    Publication Year: 1979, Page(s):716 - 718
    IEEE is not the copyright holder of this material | PDF file iconPDF (237 KB)
    Freely Available from IEEE

Aims & Scope

The IBM Journal of Research and Development is a peer-reviewed technical journal, published bimonthly, which features the work of authors in the science, technology and engineering of information systems.

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Editor-in-Chief
Clifford A. Pickover
IBM T. J. Watson Research Center