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IBM Journal of Research and Development

Issue 2 • Date March 1989

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Displaying Results 1 - 10 of 10
  • Geometric tolerancing: I. Virtual boundary requirements

    Publication Year: 1989, Page(s):90 - 104
    Cited by:  Papers (7)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1266 KB)

    We examine the representation of geometric tolerances in solid-geometric models from the perspective of two classes of functional requirements. The first class deals with positioning of parts with respect to one another in an assembly, and the second with maintaining material bulk in critical portions of parts. Both are directly relatable to the geometry of the parts. Through examples, we demonstr... View full abstract»

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  • Geometric tolerancing: II. Conditional tolerances

    Publication Year: 1989, Page(s):105 - 124
    Cited by:  Papers (5)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1462 KB)

    In a companion paper, we examined the representation of geometric tolerances in solid models from the perspective of certain functional requirements. We showed that assembly and material bulk requirements can be specified as virtual boundary requirements (VBRs). Here, we study the related issue of deriving equivalent alternative specifications. Specifically, we first explore the reasons for conver... View full abstract»

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  • Conjugate-gradient subroutines for the IBM 3090 Vector Facility

    Publication Year: 1989, Page(s):125 - 135
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (952 KB)

    This paper describes a set of optimized subroutines for use in solving sparse, symmetric, positive definite linear systems of equations using iterative algorithms. The set has been included in the Engineering and Scientific Subroutine Library (ESSL) for the IBM 3090 Vector Facility (VF). The subroutines are based on the conjugate-gradient method, preconditioned by the diagonal or by an incomplete ... View full abstract»

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  • Lattice-gas hydrodynamics on the IBM 3090 Vector Facility

    Publication Year: 1989, Page(s):136 - 148
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1173 KB)

    After a brief review of the means for characterizing lattice gases using cellular automata rules, we discuss the implementation of the rules for simulating hydrodynamic phenomena which can be described by the Navier-Stokes equations. Special emphasis is placed on data-mapping strategies and implementation through the use of the high speed and large memory resources offered by vector multiprocessor... View full abstract»

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  • A method for generating weighted random test patterns

    Publication Year: 1989, Page(s):149 - 161
    Cited by:  Papers (91)  |  Patents (34)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1028 KB)

    A new method for generating weighted random patterns for testing LSSD logic chips and modules is described. Advantages in using weighted random versus either deterministic or random test patterns are discussed. An algorithm for calculating an initial set of input-weighting factors and a procedure for obtaining complete stuck-fault coverage are presented. View full abstract»

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  • Large-area fault clusters and fault tolerance in VLSI circuits: A review

    Publication Year: 1989, Page(s):162 - 173
    Cited by:  Papers (3)  |  Patents (1)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1133 KB)

    Fault-tolerance techniques and redundant circuits have been used extensively to increase the manufacturing yield and productivity of integrated-circuit chips. Presented here is a review of relevant statistical models which have been used to account for the effects on manufacturing yield of the large-area defect and fault clusters commonly encountered during chip fabrication. A statistical criterio... View full abstract»

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  • Small-area fault clusters and fault tolerance in VLSI circuits

    Publication Year: 1989, Page(s):174 - 177
    Cited by:  Papers (55)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (351 KB)

    In previous treatments of the manufacturing yield of fault-tolerant integrated-circuit chips, fault clusters were either assumed to be absent or relatively large in area. Presented here is a treatment in which the occurrence of small-area fault clusters is assumed. Four different types of statistical distributions are considered, and a criterion is described for determining whether small-area faul... View full abstract»

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  • Translating object specifications into a computer-generated three-dimensional graphic to be reproduced as a high efficiency, reflection photo-polymer hologram suitable for mass-production

    Publication Year: 1989, Page(s):178 - 181
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (298 KB)

    A process is described for translating the specifications of an object and its interrelationship with another object into a three-dimensional computer graphic and then into a photo-polymer hologram. The capability to translate specifications about objects and their interrelationships into accurate holograms without having to create either a physical model or the manufactured object itself opens ex... View full abstract»

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  • Recent publications by IBM authors

    Publication Year: 1989, Page(s):182 - 194
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1072 KB)

    The information listed here is supplied by the Institute for Scientific Information and other outside sources. Reprints of the papers may be obtained by writing directly to the first author cited. Information on books may be obtained by writing the publisher. Papers and books are listed alphabetically by author. View full abstract»

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  • Recent IBM patents

    Publication Year: 1989, Page(s):195 - 196
    IEEE is not the copyright holder of this material | PDF file iconPDF (173 KB)
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Aims & Scope

The IBM Journal of Research and Development is a peer-reviewed technical journal, published bimonthly, which features the work of authors in the science, technology and engineering of information systems.

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Editor-in-Chief
Clifford A. Pickover
IBM T. J. Watson Research Center