IBM Journal of Research and Development

Issue 6 • Nov. 1995

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Displaying Results 1 - 13 of 13
  • Preface

    Publication Year: 1995, Page(s): 602
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (123 KB)

    Ten years has passed since the 1986 publication of two issues of the IBM Journal of Research and Development reviewing the scanning tunneling microscopy (STM) technique. In the same year, two IBM Zurich Research Laboratory scientists, G. Binnig and H. Rohrer, shared the Nobel Prize in physics for their pioneering work in this field. Since then, the STM field has grown at a tremendous rate and has ... View full abstract»

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  • Probing electrical transport, electron interference, and quantum size effects at surfaces with STM/STS

    Publication Year: 1995, Page(s):603 - 616
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1316 KB)

    We use scanning tunneling microscopy (STM) and spectroscopy (STS) to probe electrical transport through the dangling-bond surface states of semiconductors and electron scattering and electron confinement effects in metal surface states. Specifically, we use point contacts between the STM tip and the sample to show the existence of surface electrical transport in Si(111)-7 × 7. Point contact... View full abstract»

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  • Force microscopy studies of the molecular origins of friction and lubrication

    Publication Year: 1995, Page(s):617 - 627
    Cited by:  Papers (4)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (920 KB)

    The atomic force microscope (AFM) has become a valuable instrument in recent years for studying the atomic and molecular origins of friction and lubrication. This paper reviews the effort in our laboratory using force microscopy to develop a molecular-scale understanding of friction and lubrication. Among the topics covered in this paper are 1) the nanomechanics and adhesive forces of lubricated a... View full abstract»

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  • Atomic force microscopy studies of SiGe films and Si/SiGe heterostructures

    Publication Year: 1995, Page(s):629 - 637
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (916 KB)

    Atomic force microscopy (AFM) is used to study the topography of strained SiGe films and multilayer Si/SiGe heterostructures. Strain relaxation processes are found to determine the formation of surface morphology, with distinct morphological features arising from both misfit dislocation formation and three-dimensional growth of coherent islands and pits on the surface. Studies of these features fo... View full abstract»

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  • The use of STM to study metal film epitaxy

    Publication Year: 1995, Page(s):639 - 654
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1653 KB)

    In this paper we review work we have done at the IBM Almaden Research Center using the scanning tunneling microscope to understand the epitaxial growth of metal films. In particular, we explore the important role of deposit-substrate interactions in controlling growth and film structure, both by strain of the substrate and by place-exchange intermixing. These are illustrated first by the growth tr... View full abstract»

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  • Design and applications of a scanning SQUID microscope

    Publication Year: 1995, Page(s):655 - 668
    Cited by:  Papers (7)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1468 KB)

    The scanning SQUID (Superconducting Quantum Interference Device) microscope is an extremely sensitive instrument for imaging local magnetic fields. We describe one such instrument which combines a novel pivoting lever mechanism for coarse-scale imaging with a piezoelectric tube scanner for fine-scale scans. The magnetic field sensor is an integrated miniature SQUID magnetometer. This instrument ha... View full abstract»

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  • The femtosecond field-emission camera, a device for continuous observation of the motion of individual adsorbed atoms and molecules

    Publication Year: 1995, Page(s):669 - 680
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (987 KB)

    A new instrument, the femtosecond field-emission camera (FFEC), has been developed to continuously record the motion of single adsorbed atoms or molecules, with an ultimate achievable time resolution of 10−14 s. In the FFEC, the motion of an adsorbed species modulates a strong 10−5-A field-emission current from a sharp tip. The emitted electrons are focused into... View full abstract»

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  • High-density data storage using proximal probe techniques

    Publication Year: 1995, Page(s):681 - 699
    Cited by:  Papers (28)  |  Patents (22)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1766 KB)

    We describe some of the achievements and problems associated with proximal probe-based approaches to high-density data storage. While STM-based methods have demonstrated spectacular areal densities dwarfing anything achievable with today's storage technologies, reliability and data rate issues present serious obstacles. These problems have led us to focus on techniques based on AFM and near-field ... View full abstract»

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  • Some thoughts about scanning probe microscopy, micromechanics, and storage

    Publication Year: 1995, Page(s):701 - 711
    Cited by:  Papers (1)
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (925 KB)

    Interaction and actuation mechanisms used in scanning probe microscopies (SPM) have inherent potential for storage applications, but many unresolved conceptual and technical questions have precluded a thorough assessment of this potential so far. However, the intrinsic properties of SPM instrumentation and tip/sample interactions allow a number of important parameters and their ultimate values to ... View full abstract»

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  • Recent publications by IBM authors

    Publication Year: 1995, Page(s):713 - 728
    IEEE is not the copyright holder of this material | Click to expandAbstract | PDF file iconPDF (1279 KB)

    The information listed here is supplied by the Institute for Scientific Information and other outside sources. Reprints of the papers may be obtained by writing directly to the first author cited. Journals are listed alphabetically by title; papers are listed sequentially for each journal. View full abstract»

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  • Recent IBM patents

    Publication Year: 1995, Page(s):729 - 738
    IEEE is not the copyright holder of this material | PDF file iconPDF (602 KB)
    Freely Available from IEEE
  • Author index for papers in Volume 39

    Publication Year: 1995, Page(s):739 - 743
    IEEE is not the copyright holder of this material | PDF file iconPDF (291 KB)
    Freely Available from IEEE
  • Subject index for papers in Volume 39

    Publication Year: 1995, Page(s):745 - 751
    IEEE is not the copyright holder of this material | PDF file iconPDF (430 KB)
    Freely Available from IEEE

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Editor-in-Chief
Rachel D'Annucci Henriquez
IBM T. J. Watson Research Center