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Radio and Electronic Engineer

Issue 1 • Date January 1981

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Displaying Results 1 - 6 of 6
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  • Scientific instruments makers honour radar pioneer. L. H. Bedford receives achievement award

    Page(s): 10 - 11
    Save to Project icon | PDF file iconPDF (693 KB)  
    Freely Available from IEEE
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  • Coaxial telephone cable testing using a c.w. burst method

    Page(s): 21 - 30
    Save to Project icon | Click to expandQuick Abstract | PDF file iconPDF (1292 KB)  

    The measurement of impedance irregularities in wideband coaxial telephone cables in the factory or in the field poses serious problems to the instrument engineer. This paper reviews some current measurement techniques and proposes a c.w. burst test method as an effective solution to some of the problems encountered. The c.w. burst method is explained and a commercial test set described. The advantages of this method over conventional swept frequency measurements are described, and its limitations in the cable test field noted. Results of measurements made on a length of wideband coaxial telephone cable are presented to illustrate the advantages claimed for adopting the technique for swept frequency measurements, especially on drum lengths of cable. View full abstract»

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  • Viewdata in the electronic office

    Page(s): 31 - 36
    Save to Project icon | Click to expandQuick Abstract | PDF file iconPDF (771 KB)  

    Viewdata brings together computer, telecommunications and microprocessor technology to provide the electronic office with a cheap, user-orientated information distribution and processing service. This paper describes two aspects of viewdata. The first of these is that of private viewdata systems, which are mainly applicable for larger organizations. The second aspect is that of intelligent terminals which may be used in smaller organizations singly or grouped for distributed processing applications. View full abstract»

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  • Signature analysis for board testing

    Page(s): 37 - 50
    Save to Project icon | Click to expandQuick Abstract | PDF file iconPDF (1801 KB)  

    A signature analyser detects and displays the unique digital signatures associated with the data nodes in a circuit under text. By comparing these actual signatures with the correct ones, faulty nodes can be detected. The technical details of a practical signature analyser for use in production are presented and its application to the testing of complex printed circuit boards incorporating l.s.i. devices, such as memories and microprocessors, is described. View full abstract»

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