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Radio and Electronic Engineer

Issue 10 • Date October 1982

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Displaying Results 1 - 5 of 5
  • `Big Brothers¿ wanted

    Publication Year: 1982
    Save to Project icon | PDF file iconPDF (1851 KB)  
    Freely Available from IEEE
  • Obituary

    Publication Year: 1982
    Save to Project icon | PDF file iconPDF (188 KB)  
    Freely Available from IEEE
  • Automatic noise figure measurements with computer control and correction

    Publication Year: 1982 , Page(s): 468 - 474
    Cited by:  Papers (2)
    Save to Project icon | Click to expandAbstract | PDF file iconPDF (846 KB)  

    By using computer control and correction, the noise parameters of an amplifying device can be obtained as an immediate display from system noise measurements without the need of having subsequently to make tedious calculations. The means of achieving this are described in the paper, together with results obtained by applying the facility to microwave amplifiers incorporating GaAs f.e.t.devices mou... View full abstract»

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  • A real-time fading simulator for mobile radio

    Publication Year: 1982 , Page(s): 475 - 478
    Cited by:  Papers (19)
    Save to Project icon | Click to expandAbstract | PDF file iconPDF (455 KB)  

    A test equipment for simulating the Rayleigh-distributed fading encountered in mobile radio is described. The fading is achieved by in-phase and quadrature modulation of the radio signal by two independent Gaussian noise signals. The noise formation and filtering are performed using a microprocessor for which the clock frequency can be varied to control the fade rate. The simulator has been design... View full abstract»

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  • Recent developments in scanning acoustic microscopy

    Publication Year: 1982 , Page(s): 479 - 493
    Cited by:  Papers (2)
    Save to Project icon | Click to expandAbstract | PDF file iconPDF (3766 KB)  

    The operating principles of the Quate-Lemons scanning acoustic microscope and some recent developments in the detection and interpretation of acoustic images are reviewed. In particular the measurement of elastic constants using the microscope, which may ultimately provide a new high resolution technique for material characterization, is demonstrated. View full abstract»

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