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Browse Journals & Magazines > Device and Materials Reliabili ... Volume 9 Issue 3 Help

Device and Materials Reliability, IEEE Transactions on

Issue 3 • Date Sept. 2009

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Aims & Scope

IEEE Transactions on Device and Materials Reliability provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture.

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Meet Our Editors

Editor-in-Chief
Anthony S. Oates
Taiwan Semiconductor Mfg Co.
 

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