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IEEE Transactions on Reliability

Issue 4 • Date Oct. 1987

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Displaying Results 1 - 25 of 31
  • [Front cover]

    Publication Year: 1987, Page(s): c1
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  • IEEE Reliability Society

    Publication Year: 1987, Page(s): nil1
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  • [Breaker page]

    Publication Year: 1987, Page(s): nil1
    Cited by:  Papers (1)
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  • Reliability of an Electronic Assembly: A Case History

    Publication Year: 1987, Page(s):385 - 389
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1033 KB)

    This article describes the work done in evaluating the reliability of a printed-circuit-card assembly. Some assemblies went through thermal shock, humidity, and power-temperature cycling. A model was developed for interpreting a long term, high temperature life-test. Two iterations of the life test took place as part of the evaluation. A short term, intermediate temperature life-test of a relative... View full abstract»

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  • Comment on: Sequential Tests of Hypotheses for System-Reliability Modeled by a 2-Parameter Weibull Distribution

    Publication Year: 1987, Page(s):390 - 391
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (367 KB)

    A different point of view is presented on the content of the original paper. View full abstract»

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  • Statistical Analysis of a Compound Power-Law Model for Repairable Systems

    Publication Year: 1987, Page(s):392 - 396
    Cited by:  Papers (11)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (912 KB)

    A compound (mixed) Poisson distribution is sometimes used as an alternative to the Poisson distribution for count data. Such a compound distribution, which has a negative binomial form, occurs when the population consists of Poisson distributed individuals, but with intensities which have a gamma distribution. A similar situation can occur with a repairable system when failure intensities of each ... View full abstract»

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  • MIL-STD-781C: A Vicious Circle

    Publication Year: 1987, Page(s):397 - 402
    Cited by:  Papers (11)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1177 KB)

    Reliability practitioners have confused theorists about the true area of application of MIL-STD-781C. This has occurred because theorists have neglected to explain important basic concepts to practitioners. This paper analyzes the situation in detail. View full abstract»

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  • On Estimating Component Reliability for Systems with Random Redundancy Levels

    Publication Year: 1987, Page(s):403 - 407
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (734 KB)

    Redundancy is a well understood and widely used design factor which can contribute appreciably to improve the reliability of a system. Reliability is improved, for example, when any fixed component is replaced by a parallel system of independent, identically distributed components. In this study, we discuss and treat problems in which the level of redundancy, K, is a random variable governed by a ... View full abstract»

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  • Free proceedings

    Publication Year: 1987, Page(s): 407
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  • A Preliminary Test Estimator of Reliability in a Life-Testing Model

    Publication Year: 1987, Page(s):408 - 410
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (412 KB)

    This paper proposes a preliminary test estimator for the reliability of an exponential life-testing model. The optimum critical values for preliminary test and their corresponding levels of significance are obtained based on a minimax regret function. View full abstract»

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  • A New Nonparametric Growth Model

    Publication Year: 1987, Page(s):411 - 418
    Cited by:  Papers (11)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1176 KB)

    This paper proposes a new nonparametric reliability growth model for the analysis of the failure rate of a system that is undergoing development test. The only restrictions on the actual, unknown failure distribution for each stage of testing is that it be continuous, have only one unknown parameter ¿, and have an associated unimodal likelihood function. No assumptions regarding the parametric fo... View full abstract»

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  • Correspondence Items

    Publication Year: 1987, Page(s): 418
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  • A Comparison of Several Component-Testing Plans For A Parallel System

    Publication Year: 1987, Page(s):419 - 424
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (952 KB)

    We consider a parallel (1-out-of-n:G) system of n components with constant failure rates and treat three different classes of component testing procedures all of which guarantee that the given consumer and producer risks are not exceeded. It is necessary to impose certain restrictions on the magnitude of the unknown failure rates for guaranteeing the producer risk. The three classes of component t... View full abstract»

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  • A Component-Testing Procedure For A Parallel System With Type II Censoring

    Publication Year: 1987, Page(s):425 - 428
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (614 KB)

    We consider the problem of acceptance testing for a parallel (1-out-of-n:G) system of n different components with constant failure rates. The components are individually tested and the tests are terminated as soon as a preassigned number of each component fails. This paper provides a criterion for accepting or rejecting the system based on the product of the total times on test for each component.... View full abstract»

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  • Sensitivity Study of the Cumulant Method for Evaluating Reliability Measures of Two Interconnected Systems

    Publication Year: 1987, Page(s):429 - 432
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (603 KB)

    The rationale for using the cumulant method to take advantage of its computational efficiency is well known among power system planners. However, although an analysis of the sensitivity of the univariate Gram-Charlier series has been investigated, an equivalent analysis of the sensitivity of the bivariate Gram-Charlier series has not yet been reported in the literature. This paper investigates the... View full abstract»

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  • Practical Papers

    Publication Year: 1987, Page(s): 432
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  • On the Evaluation of the Reliability of k-out-of-n Systems

    Publication Year: 1987, Page(s):433 - 435
    Cited by:  Papers (10)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (445 KB)

    The paper provides some correcting remarks on several methods to determine the k-out-of-n:G system reliability - a problem that has taken more than its share in the literature. A Jain-Gopal paper presents two algorithms JG-1 and JG-2 to evaluate the reliability of a k-out-of-n System. The comparison of the computational costs of JG-1 with those of JG-2 and with other existing algorithms, especiall... View full abstract»

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  • Reliability Analysis for a Real Non-Coherent System

    Publication Year: 1987, Page(s):436 - 439
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (587 KB)

    This paper shows a real non-coherent system, calculates its unavailability, failure frequency, some measures for the element importance, and the optimum sequence for diagnosis and repair. The unique characteristic of its non-coherence is discussed. View full abstract»

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  • Annual Reliability & Maintainability Symposium Proceedings Price List for 1987

    Publication Year: 1987, Page(s): 439
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  • Dependability Evaluation of Integrated Hardware/Software Systems

    Publication Year: 1987, Page(s):440 - 444
    Cited by:  Papers (13)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (797 KB)

    A methodology for predicting the dependability (reliability and availability) of an integrated realtime hardware/software system using a semi-Markov process is described. This methodology was used to evaluate the reliability of the shuttle mission simulators at the NASA Johnson Space Center. View full abstract»

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  • A Minimizing Algorithm for Sum of Disjoint Products

    Publication Year: 1987, Page(s):445 - 453
    Cited by:  Papers (39)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1344 KB)

    This paper describes a minimizing version of the Abraham sum-of-disjoint products (sdp) algorithm, called the Abraham-Locks-Revised (ALR) method, as an improved technique for obtaining a disjoint system-reliability formula. The principal changes are: 1) Boolean minimization and rapid inversion are substituted for time-consuming search operations of the inner loop. 2) Paths and terms are ordered bo... View full abstract»

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  • Improved Bounds for System-Failure Probability

    Publication Year: 1987, Page(s):454 - 458
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (762 KB)

    The inclusion-exclusion formula can be used to obtain upper and lower bounds on system-failure probability. This paper shows that the bounds can be improved by using information contained in them. Algorithms are provided to find the improved probability bounds, along with examples. Also discussed are the conditions under which the improved bounds are advantageous. View full abstract»

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  • Application of a Correlation Model to Analyze Dependent Variables

    Publication Year: 1987, Page(s):459 - 462
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (740 KB)

    A methodology is explained to study the dependency between two variables. The correlation coefficient between two variables is used as a measure of the degree of dependency. A bootstrap technique accounts for the statistical uncertainty in the correlation coefficient that is estimated from the data. A computer program, Correlation Coefficient Generator (CCG), was developed to perform the analysis.... View full abstract»

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  • Hazard Rates and Generalized Beta Distributions

    Publication Year: 1987, Page(s):463 - 466
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (591 KB)

    This paper considers the behavior of the hazard rates of the Generalized gamma, and beta of the first and second kind. The hazard functions include strictly decreasing, constant, strictly increasing, ¿ and ¿ shaped hazard rates. By considering the generalized distributions a unified development for such distributions as beta type 1, beta type 2, Burr types 3 and 12, power, Weibull, gamma, Lomax,... View full abstract»

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  • Optimum Ordering Policy under Random Lead-Time for Equipment with a Sensor

    Publication Year: 1987, Page(s):467 - 469
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (407 KB)

    A replacement model is presented for a single equipment with a sensing device attached, where two kinds of random lead times (one for regular order and the other for expedited order) are considered. Both the equipment and device can fail, and the state of the equipment (good or failed) is monitored by the device and also inspected manually at each ordering time (fixed). Our model shows, under cert... View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu