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Reliability, IEEE Transactions on

Issue 2 • Date June 1987

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Displaying Results 1 - 25 of 43
  • [Front cover]

    Publication Year: 1987 , Page(s): c1
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  • IEEE Reliability Society

    Publication Year: 1987 , Page(s): nil1
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  • [Breaker page]

    Publication Year: 1987
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  • On Fault-Tolerance and Fault-Avoidance

    Publication Year: 1987 , Page(s): 161
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  • Fault-Tolerant Computing Guest Editor's Preface

    Publication Year: 1987 , Page(s): 162 - 163
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  • Characterization of Fault Recovery through Fault Injection on FTMP

    Publication Year: 1987 , Page(s): 164 - 170
    Cited by:  Papers (14)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (1264 KB)  

    The statistical methods used to collect and analyze fault-recovery data affect directly the credibility of reliability estimation. To provide data on which to base the development of sampling methods and parameter estimation techniques, pin-level fault-injection was conducted on the FTMP computer. Detection time was chosen for statistical analysis because it accounted for most of the variation in ... View full abstract»

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  • Correlated Failures in Fault-Tolerant Computers

    Publication Year: 1987 , Page(s): 171 - 175
    Cited by:  Papers (1)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (951 KB)  

    In two repairable ground-based fault-tolerant computer systems in which constraints on switchover time permitted manual switching as a back-up the correlated failures were an important cause of system outage. In one of the systems a distinction could be made between outages that occurred when one computer was undergoing scheduled maintenance and outages that occurred while one computer was being r... View full abstract»

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  • Analysis of Typical Fault-Tolerant Architectures using HARP

    Publication Year: 1987 , Page(s): 176 - 185
    Cited by:  Papers (41)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (1868 KB)  

    HARP (the Hybrid Automated Reliability Predictor) is a software package that implements advanced reliability modeling techniques. We present an overview of some of the problems that arise in modeling highly reliable fault-tolerant systems; the overview is loosely divided into model construction and model solution problems. We then describe the HARP approach to these difficulties, which is facilita... View full abstract»

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  • Reliability Modeling Using SHARPE

    Publication Year: 1987 , Page(s): 186 - 193
    Cited by:  Papers (110)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (1520 KB)  

    Combinatorial models such as fault trees and reliability block diagrams are efficient for model specification and often efficient in their evaluation. But it is difficult, if not impossible, to allow for dependencies (such as repair dependency and near-coincident-fault type dependency), transient and intermittent faults, standby systems with warm spares, and so on. Markov models can capture such i... View full abstract»

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  • Workshop: R&M in Computer-Aided Engineering

    Publication Year: 1987 , Page(s): 193
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  • Calculation of Coverage Parameter

    Publication Year: 1987 , Page(s): 194 - 198
    Cited by:  Papers (4)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (865 KB)  

    Programs for calculating the reliability of fault-tolerant systems do not explicitly take into account the effect of faults in the hardware recovery mechanism. This paper shows via an example how to incorporate these failures into the fault-handling (coverage) model of CARE III. A simple fault-tolerant system is described. The required coverage parameters are determined and the reliability is calc... View full abstract»

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  • Free proceedings

    Publication Year: 1987 , Page(s): 198
    Request Permissions | Click to expandAbstract | PDF file iconPDF (144 KB)  

    Members, and only members, of the Reliability Society of IEEE and of the Electronics Division of ASQC can receive the following publications free of extra charge. Just write to the place indicated for that group and publication; you MUST state that YOU are a member of the group to which you are writing. Quantities are limited, and are available (ONLY to the above members) on a first-come first-ser... View full abstract»

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  • A Multiple-Disk System for Both Fault Tolerance and Improved Performance

    Publication Year: 1987 , Page(s): 199 - 201
    Cited by:  Papers (5)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (515 KB)  

    Many applications of computer disk systems require extremely stringent levels of reliability, typically achieved through some form of redundancy. This redundancy usually greatly increases the cost of the system. For a certain form of redundancy, the extra expense can be justified in that, not only is system reliability improved, but system performance is improved as well. View full abstract»

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  • Reliability of Systems with Limited Repairs

    Publication Year: 1987 , Page(s): 202 - 207
    Cited by:  Papers (9)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (917 KB)  

    Reliability is the probability that a system functions according to specifications over a given period of time. During this period, system specifications may allow failures and repairs to occur. This paper considers systems with specifications which limit the repair process. Such systems place a limitation on either the repair duration or the number of repairs. For example, a system controlling a ... View full abstract»

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  • Correspondence Items

    Publication Year: 1987 , Page(s): 207
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  • Effect of Maintenance on the Dependability and Performance of Mulitprocessor Systems

    Publication Year: 1987 , Page(s): 208 - 215
    Request Permissions | Click to expandAbstract | PDF file iconPDF (1261 KB)  

    This paper presents analytic models for dependability and performance evaluation of multiprocessor systems with both on-line and off-line maintenance. Markov models are developed to compute the system reliability and performance availability incorporating the reliability of the maintenance processor. The maintenance processor failure is considered separately in order to emphasize its effect on sys... View full abstract»

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  • On Optimal Redundancy of Multivalue-Output Systems

    Publication Year: 1987 , Page(s): 216 - 221
    Cited by:  Papers (3)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (915 KB)  

    This paper considers improving the reliability of multivalue-output systems by the use of n-redundant systems in which n copies of systems are used redundantly and the output is determined from the outputs of those copies by the voter. A k-out-of-n redundant system minimizes the mean loss caused by the occurrence of output errors under the condition that the voter can be composed of only two kinds... View full abstract»

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  • Seminar Proceedings

    Publication Year: 1987 , Page(s): 221
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  • Endurance of EEPROMs with On-Chip Error Correction

    Publication Year: 1987 , Page(s): 222 - 223
    Cited by:  Papers (3)  |  Patents (4)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (352 KB)  

    This paper presents an endurance model for EEPROMs utilizing an on-chip error-correction code (ECC). This is necessary to determine the effect that ECC schemes have upon endurance (and therefore, reliability) of EEPROMs. EEPROM technology is briefly discussed. View full abstract»

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  • Fault-Tolerant ICs: The Reliability of TMR Yield-Enhanced ICs

    Publication Year: 1987 , Page(s): 224 - 226
    Cited by:  Papers (2)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (501 KB)  

    The use of triple modular redundancy (TMR) for reliability enhancement is well known. This paper presents a simple method' for predicting the reliability of integrated circuits (ICs) which use TMR for yield enhancement. A simple yield-model is included as it is necessary to factor in the effect of consumption of redundancy paths due to wafer fabrication defects. TMR implementation is briefly discu... View full abstract»

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  • Practical Papers

    Publication Year: 1987 , Page(s): 226
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  • Fault-Tolerant System Using 3-Value Logic Circuits

    Publication Year: 1987 , Page(s): 227 - 231
    Cited by:  Papers (1)
    Request Permissions | Click to expandAbstract | PDF file iconPDF (717 KB)  

    A ternary decision circuit implemented in CMOS technology is proposed. It can be used in a duplex binary fault-tolerant system to replace both the matcher and the switch circuit. The resultant system is simpler than the conventional one. The reliable design of the ternary decision circuit is discussed in detail. A duplex 2-of-3-value fault-tolerant system can be formed by two 2-of-3-value processo... View full abstract»

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  • Annual Reliability & Maintainability Symposium Proceedings Price List for 1987

    Publication Year: 1987 , Page(s): 231
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  • From the Editor

    Publication Year: 1987 , Page(s): 232
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  • Our New Associate Editors

    Publication Year: 1987 , Page(s): 233
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Way Kuo
City University of Hong Kong