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By Topic

Reliability, IEEE Transactions on

Issue 4 • Date Oct. 1985

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Displaying Results 1 - 25 of 51
  • [Front cover]

    Publication Year: 1985 , Page(s): c1
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  • IEEE Reliability Society

    Publication Year: 1985 , Page(s): nil1
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  • [Breaker page]

    Publication Year: 1985 , Page(s): nil1
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  • Quality & Reliability Costs

    Publication Year: 1985 , Page(s): 289
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  • The Good Guys vs the Bad Guys

    Publication Year: 1985 , Page(s): 289
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  • Graph Theory Concepts in Frequency and Availability Analysis

    Publication Year: 1985 , Page(s): 290 - 294
    Cited by:  Papers (9)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (644 KB)  

    Steady-state availability and failure frequency are two key indices in a repairable system. They are generally evaluated from Markov models with constant transition rates. Numerical solutions can be found for relatively large systems using computer programs. It is more difficult to obtain general equations for a specific system using transition rate symbols. The determination of these equations usually involves linear simultaneous equations, either directly or using Cramer's Rule. This paper describes a general purpose graphical approach for obtaining steady-state availability and frequency expressions from a flow graph based on the Markov model. A set of generalised formulae is developed and applied to several configurations. This technique avoids the need to use matrices for developing general purpose equations. Its direct approach is useful to practising engineers and students of reliability concepts. View full abstract»

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  • Mechanism of Misalignment Failure of Liquid-Crystal Display Cells

    Publication Year: 1985 , Page(s): 295 - 299
    Cited by:  Papers (1)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (2998 KB)  

    Misalignment properties and the misalignment generation mechanism due to voltage stress in liquid crystal display cells which use Schiff base-type liquid crystal were studied. Patterns of misalignment have many different modes, depending on the applied voltage. Based on the results of voltage-stress life tests and dismantling inspections of misaligned cells, we found that misalignment is due to the electrochemical deposition on the electrode surface of compounds formed of hydrolized components of the liquid crystal and inorganic impurity ions that have become mixed in during manufacturing, regardless of the visual patterns of misalignment. View full abstract»

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  • Free proceedings

    Publication Year: 1985 , Page(s): 299
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  • Incentive Contracting Based Upon Consumer Indifference

    Publication Year: 1985 , Page(s): 300 - 302
    Cited by:  Papers (2)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (536 KB)  

    In contract purchasing, price is often negotiated, given a reliability specification. Prior to procurement a sample is taken to determine if the product meets the reliability specification. This paper considers an alternative approach in which the contract price reflects actual field performance for an item subject to two types of failures. A consumer indifference curve that specifies the predicted break-even point between price and reliability is used to establish the initial purchase price. The actual purchase price is determined by estimating the break-even point based upon a sample of failures. Both the vendor and consumer agree upon the statistical methods for revising the price at purchase time. In this manner, more reliable products yield higher prices than less reliable products, thus resulting in a quantifiable incentive contract. View full abstract»

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  • Cutset Analysis of Networks Using Basic Minimal Paths and Network Decomposition

    Publication Year: 1985 , Page(s): 303 - 307
    Cited by:  Papers (9)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (673 KB)  

    The concept of basic minimal paths has been introduced, and its use in deducing the node cutsets of a network was described. This 3 paper deals with two important aspects of basic minimal paths: 1) the deduction of link cutsets from node cutsets, and 2) reduction of computational requirements in deducing the basic minimal paths using network decomposition. View full abstract»

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  • Cut-Set Intersections and Node Partitions

    Publication Year: 1985 , Page(s): 307
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  • Element Importance and System Failure Frequency of a 2-State System

    Publication Year: 1985 , Page(s): 308 - 313
    Cited by:  Papers (12)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (783 KB)  

    This paper redefines three measures of element s-importance for 2-state systems regardless of s-coherence, presents the calculation methods of these measures, and gives a new method to calculate the system time-specific failure and recovery frequencies. A poor point in the literature in extending methods for evaluating the s-importance of elements of s-coherent system to non-coherent system is pointed out. An example illustrates these definitions and calculation methods. View full abstract»

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  • Annual Reliability & Maintainability Symposium Proceedings Price List for 1985

    Publication Year: 1985 , Page(s): 313
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  • Algorithms for Generating Minimal Cutsets by Inversion

    Publication Year: 1985 , Page(s): 314 - 319
    Cited by:  Papers (27)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (992 KB)  

    This paper studies the problem of inverting minimal paths to obtain minimal cutsets (or vice versa) for s-coherent systems. The theoretical results lead to simplified inversion by a sequential method. Strategies are discussed for implementing these simplifications efficiently. Computational results, obtained by applying the algorithms to standard problems drawn from the literature, indicate that a substantial reduction in computational effort can be achieved by such simplifications. View full abstract»

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  • On Reliability Evaluation by Network Decomposition

    Publication Year: 1985 , Page(s): 319
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  • Modularizing and Minimizing Fault Trees

    Publication Year: 1985 , Page(s): 320 - 322
    Cited by:  Papers (6)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (492 KB)  

    The analysis of a fault-tree by Locks showed that computation could be eased by modularizing the fault-tree. His process involves hand calculation and insight from the analyst. Many computer algorithms for minimizing a fault tree rely on a brute force method which leads to computational buildup. Approaches which simplify a tree by inspection and hand calculation can often be programed and form a useful tool for pre-analysis of a fault tree. This paper demonstrates that the process of modularizing can be organised by a simple computer program which can roughly analyse the fault tree prior to further analysis by a more sophisticated minimizing program. The methods allow some of the benefits of inspection to be incorporated into a computer program. View full abstract»

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  • Parameter Estimation for a Specific Software Reliability Model

    Publication Year: 1985 , Page(s): 323 - 328
    Cited by:  Papers (4)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (814 KB)  

    The problem of maximum likelihood estimation in the Jelinski-Moranda software reliability model is studied. The distribution of the stochastic variable that completely determines the maximum likelihood estimate is obtained. s-Confidence intervals for the parameter of interest can then be constructed by using the same stochastic variable. An example is given using real data. View full abstract»

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  • Book Review

    Publication Year: 1985 , Page(s): 328
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  • On Multistate System Analysis

    Publication Year: 1985 , Page(s): 329 - 337
    Cited by:  Papers (107)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (1214 KB)  

    Discrete function theory, which extends switching function theory and multiple-valued logic function theory, is introduced into multistate system analysis. Some theoretical conclusions and algorithms which play key roles in multistate system analysis are presented. The concepts of s-coherence and duality in binary-state system analysis are generalized. The set of minimal upper (maximum lower) vectors for level j, which play the role of min path (cut) set, is introduced to represent the states of a monotonic multistate system. Two approaches to computing state probability of multistate systems are given, one is based on inclusion-exclusion, the other is based on enumeration. Binary-state fault-tree is extended to multistate fault-tree. A computer code (MSTA1) has been programmed and is used to evaluate a multistate fault-tree. Multistate fault-tree and the computer code have been applied to paper-making industry; the results are consistent with the field data. View full abstract»

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  • Book Reviews

    Publication Year: 1985 , Page(s): 337
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  • Failure Distributions of Consecutive-k-out-of-n:F Systems

    Publication Year: 1985 , Page(s): 338 - 341
    Cited by:  Papers (18)
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    Most literature on consecutive-k-out-of-n:F systems gives recursive equations for computing the system reliability. This paper gives a formula for computing the system reliability directly. Using this formula, the system failure distribution is derived. Upper and lower bounds for the system reliability or the system failure distribution are given. Some numerical examples are included. View full abstract»

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  • A Test of the Equality of Survival Distributions Based on Paired Observations from Conditionally Independent Exponential Distributions

    Publication Year: 1985 , Page(s): 342 - 346
    Cited by:  Papers (11)
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    A model describes the joint distribution of paired survival times based on certain reasonable assumptions appropriate for biological data generated in a clinical trial setting or for certain failure data. An exact parametric test for equality of mean survival times for data following this distribution is developed. The power of the exact test is investigated by a computer simulation study for various sample sizes and values of the model parameters and compared to that of alternative tests. Heretofore, researchers desiring to analyze paired survival data have resorted to paired t tests or nonparametric procedures such as the sign test or signed ranks test. The t-test is invalid for non-normally distributed data although the robustness of the test might minimize the difficulty. The nonparametric tests, by their nature, fail to use the data completely. This paper presents an exact parametric test based on a distribution whose justification requires rather modest and reasonable assumptions. Critical values for the test can be obtained from a table of the chi-square distribution. This exact test appears to be a viable alternative to non-parametric approaches to the analysis of paired survival data. It is extremely easy to calculate on a hand calculator. In fact, since no data storage is required (unlike the signed ranks test), the calculations can be readily programmed on a programmable calculator. The modeling of bivariate and multivariate survival data we believe has not been adequately addressed in the statistical and engineering literature. We hope that this paper will spark additional work. View full abstract»

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  • Information about the Society

    Publication Year: 1985 , Page(s): 346
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  • Robust Estimators of the 3-Parameter Weibull Distribution

    Publication Year: 1985 , Page(s): 347 - 351
    Cited by:  Papers (3)
    Save to Project icon | Request Permissions | Click to expandQuick Abstract | PDF file iconPDF (774 KB)  

    Robust estimators of the location, scale, and shape parameters of the Weibull distribution are proposed. The estimators are easy to calculate and have few of the disadvantages associated with the maximum likelihood estimators. Their rms-errors are considerably smaller than those of the estimators available in the literature. View full abstract»

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  • Bayes Nonparametric Estimation of Time-Dependent Failure Rate

    Publication Year: 1985 , Page(s): 351
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Way Kuo
City University of Hong Kong