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Reliability, IEEE Transactions on

Issue 3 • Date Aug. 1985

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Displaying Results 1 - 25 of 44
  • [Front cover]

    Page(s): c1
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  • IEEE Reliability Society

    Page(s): nil1
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    Freely Available from IEEE
  • [Breaker page]

    Page(s): nil1
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  • Avoiding Ambiguity

    Page(s): 193
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  • Pareto Revisited

    Page(s): 193
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  • Fault Tree Analysis, Methods, and Applications ߝ A Review

    Page(s): 194 - 203
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    This paper reviews and classifies fault-tree analysis methods developed since 1960 for system safety and reliability. Fault-tree analysis is a useful analytic tool for the reliability and safety of complex systems. The literature on fault-tree analysis is, for the most part, scattered through conference proceedings and company reports. We have classified the literature according to system definition, fault-tree construction, qualitative evaluation, quantitative evaluation, and available computer codes for fault-tree analysis. View full abstract»

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  • Free proceedings

    Page(s): 203
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  • On Some Common Interests Among Reliability, Inventory, and Queuing

    Page(s): 204 - 211
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    Queuing networks can be used to model maintained systems. Under many conditions, closed-network queuing theory can be applied to ascertain the availability of such systems. Multi-echelon repairable-item inventory systems are one such class. Problems of common interest to the reliability, queuing, and inventory communities are highlighted, and solution techniques for these problems are presented. View full abstract»

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  • Chi-Square Probabilities are Poisson Probabilities in Disguise

    Page(s): 209 - 211
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    Since chi-square probabilities and Poisson probabilities are different forms of the same mathematical function, it is reasonable to use the chi-square tables for obtaining Poisson probabilities (for example, the Pearson & Hartley, Biometrica Tables). View full abstract»

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  • A Reliability-Program Case-History on Design Review

    Page(s): 212 - 215
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    This paper summarizes the investigative results of actual design reviews as an important part of reliability program, and describes several reliability engineering efforts to achieve an effective design review. Design data packages (design documentation) which indicate the basic design program and design process are important in design reviews, When attention is concentrated on a data package, the ability of the reviewers is heightened and the results of the review are enhanced. When the design review is concerned with product reliability, then the availability and quality of: 1) a data package with established reliability level objectives and predictions, 2) a Failure Mode Effect Analysis and a Fault Tree Analysis, and 3) other data packages on product reliability and related technology or engineering, all greatly influence the results of the review. The potential weak points in a design can be revealed by over-stress tests and the results of such tests are very useful in the reliability design review. The improved design which can withstand the adequate over-stress tests appreciably lessened customer complaints about reliability. View full abstract»

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  • Manuscripts Received

    Page(s): 215
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  • On the Software Reliability Models of Jelinski-Moranda and Littlewood

    Page(s): 216 - 218
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    This note provides an alternative formulation of the software reliability models of Jelinski-Moranda and Littlewood. The formulation is in terms of failure times rather than interfailure times; the models are then equivalent to observing the first n order statistics (n is random) from a random sample of size N. The models can be generalized by using a decreasing failure rate for the failure times. For the Jelinski-Moranda model, we comment on the maximum likelihood estimate and an improved estimate for the initial number of faults in the software. We discuss how to check the validity of the Jelinski-Moranda model. View full abstract»

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  • Corrections 1984 October Issue

    Page(s): 218
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  • Tables for Exact Lower Confidence Limits for Reliability and Quantiles, Based on Least-Squares Estimators of Weibull Parameters

    Page(s): 219 - 223
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    For the 2-parameter Weibull distribution, this paper gives tables to obtain exact lower s-confidence limits for reliability on the basis of the least-squares method and median plotting positions. The tables use a method based on the ancillary property of these estimators. They apply to samples of size N = 3(1)13, censored after the first m observations, m = 3(1)N. The same tables enable one to obtain lower s-confidence limits for population quantiles. The use of the tables is illustrated with a numerical example. View full abstract»

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  • Annual Reliability & Maintainability Symposium Proceedings Price List for 1985

    Page(s): 223
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  • On Shrinkage Estimation of the Exponential Scale Parameter

    Page(s): 224 - 226
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    This paper shows some simple shrunken estimators for the scale parameter of an exponential distribution and compares them with minimum MSE estimator and the estimator proposed by Pandey We have also obtained a Bayes estimator, which is a shrinkage estimator and has smaller MSE than the estimator (sample mean) n/(n + 1) if sample size, n, is small and other restrictions apply. View full abstract»

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  • Practical Papers

    Page(s): 226
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  • On the F-Distribution for Calculating Bayes Credible Intervals for Fraction Nonconforming

    Page(s): 227 - 228
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    A procedure is described for Bayes credible interval estimation of fraction nonconforming when an infinite population and a uniform prior distribution on the fraction nonconforming are assumed. The procedure uses survival function percentiles from the F-distribution to derive credible-interval limits for fraction nonconforming. View full abstract»

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  • S.ESCAF: Sequential Complex Systems are Analysed with ESCAF through an Add-on Option

    Page(s): 229 - 232
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    This article presents the new possibilities afforded by S.ESCAF for analysis of sequential systems with very complex Markov diagrams. S.ESCAF is an add-on option to the commercially available desktop ESCAF unit. The user builds an electronic simulation of the studied system in a very simple manner based directly on the system diagram. A sequential events combination generator (SCG) then inputs all allowable time sequences of events to this electronic simulation¿component failures, repairs, non-starts, etc. S.ESCAF analyzes the resulting output state to determine those sequences which result in system failure. Its originality lies in its ability to generate and analyze all events sequences, taking into account the order of occurrence of the events, even for complex systems. Maximum capacity is 80 events. View full abstract»

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  • Book Reviews

    Page(s): 232 - 228-a
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  • Evaluating the Signal-Reliability of Logic Circuits

    Page(s): 233 - 235
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    A different approach to the evaluation of signal reliability of digital logic circuits is presented. The method derives functional descriptions of each output of the circuit. In order to include the effect of faults in the function realized by the circuit, three binary variables are used to specify the state of each line in the circuit. This approach provides a different insight into the problem of digital system reliability. The difficulty of this method is the complexity of probability expression for a large circuit. The calculations will be lessened when we introduce the concept of bundling. But no existing method can reduce the calculations drastically. View full abstract»

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  • Practical Papers ߞ Computer Programs

    Page(s): 235
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  • Multistate Block Diagrams and Fault Trees

    Page(s): 236 - 240
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    This paper shows how to model a multistate system with multistate components using binary variables. This modeling technique allows current binary algorithms for block diagrams and fault trees to be applied to multistate systems. Several multistate examples are presented, and some cases in which computational efficiency can be enhanced are discussed. View full abstract»

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  • Optimal Allocation of Redundant Components for Large Systems

    Page(s): 241 - 247
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    This paper discusses allocating redundant components subject to resource constraints so as to optimize some measure of system performance. Two new exact algorithms are presented for the case where the objective and constraint functions are stagewise separable. Both are branch and bound algorithms. The first, BLE1, is based on an underlying knapsack structure, while the second, BLE2, exploits a multiple-choice knapsack structure. BLE1 can solve problems with 100 stages and 10 constraints in just a few seconds of CPU time on an IBM 3033. For larger problems, BLH, a heuristic procedure, is proposed. The heuristic is based on the ``slippery algorithm'' for knapsack problems. Computational testing indicates BLH often finds the optimal solution, and when it doesn't, the solutions are quite close to optimal. View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Way Kuo
City University of Hong Kong