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IEEE Transactions on Reliability

Issue 2 • Date June 1985

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Displaying Results 1 - 25 of 42
  • [Front cover]

    Publication Year: 1985, Page(s): c1
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  • IEEE Reliability Society

    Publication Year: 1985, Page(s): nil1
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  • [Breaker page]

    Publication Year: 1985, Page(s): nil1
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  • On Fads, Carts & Horses

    Publication Year: 1985, Page(s): 97
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  • On the Statistics of Life Testing

    Publication Year: 1985, Page(s): 97
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  • Relationship Between Tearing Strength and Electrical Resistance in Welded Microjoints

    Publication Year: 1985, Page(s):98 - 101
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (657 KB)

    The correlation between electrical resistance and mechanical strength of welded joints is derived, based on a model of the dislocation structure of the heat affected zone. This correlation is confirmed experimentally with a fairly good fit between observed and theoretical results. The possibility of using the derived relationship in the automatic detection of faulty welded elements during producti... View full abstract»

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  • Extension of the Duane Plotting Technique

    Publication Year: 1985, Page(s):102 - 106
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (809 KB)

    A Duane plot is a straight line relating the log of cumulative failure rate (or of cumulative MTBF) to the log of cumulative equipment operating hours in a series of equipment tests. The straight line provides an easy translation from the cumulative line to a line of instantaneous failure rate (or to instantaneous MTFB). This technique has also been applied to the early failure rates of operating ... View full abstract»

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  • Duane, Prince of Faultland

    Publication Year: 1985, Page(s): 106
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (144 KB)

    First Page of the Article
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  • A Bayes Explanation of an Apparent Failure Rate Paradox

    Publication Year: 1985, Page(s):107 - 108
    Cited by:  Papers (19)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (284 KB)

    For the exponential life distribution model and any prior distribution for the failure rate parameter, the predictive distribution has a decreasing failure rate. A Bayes explanation is given of why this is logically reasonable. View full abstract»

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  • Practical Papers ߞ Computer Programs

    Publication Year: 1985, Page(s): 108
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  • Bayes Nonparametric Estimation of Time-dependent Failure Rate

    Publication Year: 1985, Page(s):109 - 112
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (605 KB)

    This paper discusses Bayes nonparametric estimation of time-dependent failure rates. A point and an interval estimate of the quantiles of the failure process are given for both complete and censored samples. The prior degree-of-belief about the failure rate is expressed in the form of a hypothetical sample. A numerical example is discussed. View full abstract»

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  • A Comparison of Three Methods for Calculating Lower Confidence Limits on System Reliability Using Binomial Component Data

    Publication Year: 1985, Page(s):113 - 120
    Cited by:  Papers (13)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1331 KB)

    The Maximus, bootstrap, and Bayes methods can be useful in calculating lower s-confidence limits on system reliability using binomial component test data. The bootstrap and Bayes methods use Monte Carlo simulation, while the Maximus method is closed-form. The Bayes method is based on noninformative component prior distributions. The three methods are compared by means of Monte Carlo simulation usi... View full abstract»

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  • HPD Prediction Intervals for Rayleigh Distribution

    Publication Year: 1985, Page(s):121 - 123
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (398 KB)

    Using Jeffreys' non-informative prior, the predictive pdf of a future observation and that of the k-th order statistic of a future sample from a Rayleigh distribution have been obtained. Bayes predictive estimators and highest posterior density (HPD) prediction intervals for the future observation and the k-th order statistic are derived. A numerical example is given. View full abstract»

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  • Exact Reliability Formulas for Linear & Circular Consecutive-k-out-of-n:F Systems

    Publication Year: 1985, Page(s):124 - 126
    Cited by:  Papers (44)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (374 KB)

    A consecutive-k-out-of-n:F system, with n linearly or circularly arranged i.i.d. components is examined. The system reliability has an exact formula which is straight forward and more effective than those given elsewhere; the two formulas are given. View full abstract»

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  • Reliability of a Large Consecutive-k-out-of-n:F System

    Publication Year: 1985, Page(s):127 - 130
    Cited by:  Papers (33)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (539 KB)

    The system reliability and some bounds are obtained for a large consecutive-k-out-of-n:F system with equal component failure probabilities. View full abstract»

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  • Manuscripts Received

    Publication Year: 1985, Page(s): 130
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  • Reliability-Equivalent-Separation of a Node

    Publication Year: 1985, Page(s):131 - 135
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (718 KB)

    A criterion is obtained for separating a node into two or more nodes without changing the network reliability. If a network with exactly one input node, a network with exactly one output node or a network composed of only nonoriented lines has such a reliability-equivalent-separable node, then the network can be separated into two or more s-independent subnetworks by separating the node into two o... View full abstract»

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  • Practical Papers

    Publication Year: 1985, Page(s): 135
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  • A New Technique in Minimal Path and Cutset Evaluation

    Publication Year: 1985, Page(s):136 - 143
    Cited by:  Papers (24)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1061 KB)

    This paper presents a new technique for deducing the minimal paths and cutsets of a general network. A powerful concept of reducing the total number of minimal paths to its basic minimal paths is introduced. This concept reduces the computational time and required storage in deducing the minimal cutsets. A new technique for evaluating minimal cutsets has been adopted. Examples demonstrate the powe... View full abstract»

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  • Recursive Algorithm for Reliability Evaluation of k-out-of-n:G System

    Publication Year: 1985, Page(s):144 - 150
    Cited by:  Papers (12)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (533 KB)

    An algorithm for computing recursively the exact system reliability of k-out-of-n systems is proposed. It is simple, easy to implement, fast, and memory efficient. It gives a reliability expression with minimal number of terms, C(k, n) and involves only a few multiplications. The reduction in number of terms and multiplications is over 50 percent compared to some methods. The recursive nature of t... View full abstract»

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  • Warranty Policies For Non-Repairable Items Under Risk Aversion

    Publication Year: 1985, Page(s):147 - 150
    Cited by:  Papers (13)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (516 KB)

    An approach is presented for analyzing full replacement and linear prorated warranty policies for items receiving renewable warranties when failure occurs during the warranty interval. The model corrects a model of Thomas and then extends the methodology by describing how sellers' risk aversity influences the policy. For constant failure intensities, linear replacement policies are more attractive... View full abstract»

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  • A Philosophy for Allocating Component Reliabilities in a Network

    Publication Year: 1985, Page(s):151 - 153
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (482 KB)

    A philosophy for developing an algorithm to compute collectively the required reliabilities of the components in a network so as to satisfy the specified reliabilities of an arbitrary number of source-destination pairs is presented. This philosophy involves the formulation and solution of an entropy maximization problem. The resulting algorithm is easy to implement and can become a very valuable t... View full abstract»

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  • Optimal Selection Methods for Failure & Repair Rates Using Nomographs

    Publication Year: 1985, Page(s):154 - 161
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1137 KB)

    This paper explains the optimal selection methods using nomographs to solve two essentially different problems. The one is the problem of unit level, and the other is the one of system level. The unit level assumes that the cost information as a function of failure rate ¿ and repair rate ¿ are empirically known. The paper presents a method, by which a nomograph is used to select easily the optim... View full abstract»

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  • Optimal Age-Replacement Policy for Equipment Monitored by a Stochastically Failing Indicator

    Publication Year: 1985, Page(s):162 - 164
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (376 KB)

    An optimal age-replacement policy is presented for the system composed of a single piece of equipment and an indicator. The state of the equipment (good or failed) is monitored by the indicator, and both the equipment and the indicator can fail. Our model generalizes one of Barlow & Hunter, in that it duplicates their model when the indicator is perfect. View full abstract»

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  • Parametric Programming Applied to Reliability Optimization Problems

    Publication Year: 1985, Page(s):165 - 170
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (791 KB)

    In practical reliability optimization models, finding an optimal solution to the model is not the only requirement. One may also be interested in solutions that are close to optimum, or one may want to know what happens if a change is made in the model. This paper presents new reliability optimization models which can be formulated as parametric nonlinear integer programming problems. Solution met... View full abstract»

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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu