By Topic

IEEE Transactions on Reliability

Issue 1 • Date April 1985

Filter Results

Displaying Results 1 - 25 of 46
  • [Front cover]

    Publication Year: 1985, Page(s): c1
    Request permission for commercial reuse | PDF file iconPDF (703 KB)
    Freely Available from IEEE
  • IEEE Reliability Society

    Publication Year: 1985, Page(s): nil1
    Request permission for commercial reuse | PDF file iconPDF (179 KB)
    Freely Available from IEEE
  • [Breaker page]

    Publication Year: 1985
    Request permission for commercial reuse | PDF file iconPDF (179 KB)
    Freely Available from IEEE
  • Training & Education

    Publication Year: 1985, Page(s): 1
    Request permission for commercial reuse | PDF file iconPDF (208 KB)
    Freely Available from IEEE
  • You Can't Get There From Here

    Publication Year: 1985, Page(s): 1
    Request permission for commercial reuse | PDF file iconPDF (208 KB)
    Freely Available from IEEE
  • Electromigration in Double-Layer Metallization

    Publication Year: 1985, Page(s):2 - 7
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2545 KB)

    The electromigration of the top stripe in aluminum double-layer metallization systems was investigated. The current density dependence and the activation energy characterization are important in double-layer metallization. The step-coverage and coating effects of SiN is better than that of Si02. New phenomena associated with electromigration have been observed as follows: 1. The mean lifetime is a... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Our Past Editors

    Publication Year: 1985, Page(s): 7
    Request permission for commercial reuse | PDF file iconPDF (939 KB)
    Freely Available from IEEE
  • The Linear Software Reliability Model and Uniform Testing

    Publication Year: 1985, Page(s):8 - 16
    Cited by:  Papers (16)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1312 KB)

    The Jelinski-Moranda, Shooman, and Musa software reliability models all predict that the software error detection rate in a software system is a linear function of the detected errors. The basic differences among the models are that the error rates are, respectively, in terms of calendar-time, manpower, and computer-time. The models are simple to use for estimating the number of errors still in th... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Manuscripts Received

    Publication Year: 1985, Page(s): 16
    Request permission for commercial reuse | PDF file iconPDF (210 KB)
    Freely Available from IEEE
  • The Dependency Model: A Tool for Calculating System Effectiveness

    Publication Year: 1985, Page(s):17 - 24
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1409 KB)

    The Dependency Model (DM) is a mathematically unsophisticated but useful and practical tool for measuring the effectiveness (reliability, availability, maintainability, efficiency, etc.) of a complex system. Contrary to classical models, the DM does not require arbitrarily chosen statistical distributions or expensive simulations for its application. The large computer storage and running time req... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Units of Equipment Available Using Cannibalization for Repair-Part Support

    Publication Year: 1985, Page(s):25 - 28
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (645 KB)

    This paper presents a mathematical model to predict the number of units of equipment available in the future. The components of this equipment are subject to Poisson failures and replacements are obtained by cannibalization. A numerical example is presented, and some difficulties encountered in the practical application of this model are discussed. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Manuscripts Received

    Publication Year: 1985, Page(s): 28
    Request permission for commercial reuse | PDF file iconPDF (183 KB)
    Freely Available from IEEE
  • A System Reliability Model with Classes of Failures

    Publication Year: 1985, Page(s):29 - 33
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (941 KB)

    This paper presents an approach to system reliability involving s-dependence of the workload as well as the system configuration. Four classes of failures are described and then incorporated into the workload model. Mean time to failure and the system reliability are the functions of parameters estimated by monitoring a real system. The model allows multiple classes of users and priority requests ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Mean Time to Achieve a Failure-Free Requirement with Imperfect Repair

    Publication Year: 1985, Page(s):34 - 37
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (468 KB)

    This paper obtains expressions for the mean test time to achieve a failure-free requirement with imperfect repair, under two plans. First do complete repair (good as new) at an even number of failures and partial repair (bad as old) otherwise. Next do complete repair at every k-th failure and partial repair otherwise. Plan 1 is a special case of plan 2 (with k = 2). View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Manuscripts Received

    Publication Year: 1985, Page(s): 37
    Request permission for commercial reuse | PDF file iconPDF (163 KB)
    Freely Available from IEEE
  • A Conditional Probability Approach to Reliability with Common-Cause Failures

    Publication Year: 1985, Page(s):38 - 42
    Cited by:  Papers (11)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (665 KB)

    This paper presents a conditional probability method to evaluate the reliability or availability of a system whose components failures can be s-independent or have a common-cause. Different failure types can be in each cut-set. By applying pivotal decomposition, the chain rule of conditional probability, and the recursive rule of probability of a union of events, I obtain the steady-state system u... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Call for Papers

    Publication Year: 1985, Page(s): 42
    Request permission for commercial reuse | PDF file iconPDF (138 KB)
    Freely Available from IEEE
  • Consecutive-k-out-of-n:F System With Sequential Failures

    Publication Year: 1985, Page(s):43 - 45
    Cited by:  Papers (16)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (420 KB)

    For consecutive-k-out-of-n:F systems in which failures occur one at a time, a time-to-failure model is developed. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Optimal Consecutive-k-out-of-n:F Component Sequencing

    Publication Year: 1985, Page(s):46 - 49
    Cited by:  Papers (34)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (684 KB)

    A consecutive-k-out-of-n:F system is an ordered linear arrangement of n components that fails if and only if at least k consecutive components fail. Suppose that all components are interchangeable, that component failures are s-independent, and that component failure probabilities need not be equal. When k = 2, a certain ordering of the components minimizes the probability of system failure regard... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Manuscripts Received

    Publication Year: 1985, Page(s): 49
    Request permission for commercial reuse | PDF file iconPDF (154 KB)
    Freely Available from IEEE
  • Strict Consecutive-k-out-of-n:F Systems

    Publication Year: 1985, Page(s):50 - 52
    Cited by:  Papers (16)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (447 KB)

    A method is given for calculating the failure probability function for consecutive-k-out-of-n:F systems which operate in such a way that isolated strings of failures of length less than k (which do not cause system failure) do not occur, or are immedately corrected; ie, when system failure occurs it is because all failures present are in strings of length at least k. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Practical Papers ߞ Computer Programs

    Publication Year: 1985, Page(s): 52
    Request permission for commercial reuse | PDF file iconPDF (130 KB)
    Freely Available from IEEE
  • Estimation of Weibull Shape-Parameters for Two Independent Competing Risks

    Publication Year: 1985, Page(s):53 - 56
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (589 KB)

    This paper presents a technique to estimate Weibull shape parameters of life distribution of two components in a series system. The data consist of lifetime of the system only, that is, it is not known which component caused the system failure. The relations among cumulative hazard functions of the system at virtual observation limit are used for estimation. This technique is useful for 1) analysi... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Book Review

    Publication Year: 1985, Page(s):56 - 59
    Request permission for commercial reuse | PDF file iconPDF (361 KB)
    Freely Available from IEEE
  • Maximum Likelihood Estimation For The 2-Parameter Weibull Distribution Based On Interval-Data

    Publication Year: 1985, Page(s):57 - 59
    Cited by:  Papers (9)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (563 KB)

    MLE techniques are presented for estimating time-to-failure distributions from interval-data. Interval-data consist of adjacent inspection times that surround an unknown failure time. Censored interval-data bound the unknown failure time with only a lower time. The 2-parameter Weibull distribution is examined as the failure distribution. Parameter estimates from interval-data and from the midpoint... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.

Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu