Issue 3 • Date Aug. 1984
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Displaying Results 1 - 25 of 28
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[Front cover]
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PDF (578 KB)
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IEEE Reliability Society
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PDF (171 KB)
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[Breaker page]
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PDF (171 KB)
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M&M The Hard Way
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PDF (231 KB)
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Eternal Vigilance Is the Price
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PDF (231 KB)
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Random Tendencies and Event Dependencies
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PDF (416 KB)
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Voltage-Testing of Thin-film Capacitors
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PDF (357 KB)
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1985 Annual Reliability and Maintainability Symposium
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PDF (138 KB)
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Reliability of Liquid Crystal Display
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PDF (973 KB)
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Manuscripts Received
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PDF (187 KB)
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Manuscripts Received
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PDF (206 KB)
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Manuscripts Received
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PDF (210 KB)
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Modified Goodness-of-Fit Tests for Gamma Distributions with Unknown Location and Scale Parameters
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PDF (790 KB)
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On Being Late
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PDF (187 KB)
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Manuscripts Received
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PDF (171 KB)
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Minimal Cuts up to Third Order in a Planar Graph
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PDF (1192 KB)
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Free proceedings
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PDF (208 KB)
Aims & Scope
IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.
Meet Our Editors
Editor-in-Chief
Way Kuo
University of Tennessee


