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IEEE Transactions on Reliability

Issue 3 • Date Aug. 1984

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Displaying Results 1 - 25 of 28
  • [Front cover]

    Publication Year: 1984, Page(s): c1
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  • IEEE Reliability Society

    Publication Year: 1984, Page(s): nil1
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  • [Breaker page]

    Publication Year: 1984, Page(s): nil1
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  • M&M The Hard Way

    Publication Year: 1984, Page(s): 201
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  • Eternal Vigilance Is the Price

    Publication Year: 1984, Page(s): 201
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  • Random Tendencies and Event Dependencies

    Publication Year: 1984, Page(s):202 - 204
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (416 KB)

    Calculating the outcome-probability of a chance event is influenced by the statistical dependencies, viz, s-dependencies among the possible outcomes. This paper shows how to account for these s-dependencies, viz, it is a tutorial on s-dependence. Much of the rigor has been omitted, ie, no theorems and few definitions. Practical examples describe the use of probability statements rather than show t... View full abstract»

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  • Voltage-Testing of Thin-film Capacitors

    Publication Year: 1984, Page(s):205 - 207
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (357 KB)

    The influence of proof-test voltage and testing time on the working-life distribution of thin film capacitors is presented. The proof-test not only eliminates capacitors with low breakdown voltage, it decreases the working life of the remaining components. A short proof-test is proposed to avoid degrading the remaining components. The test method for estimating the distribution parameters is prese... View full abstract»

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  • Maturity Factors in Predicting Failure Rate for Linear Integrated Circuits

    Publication Year: 1984, Page(s):208 - 212
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (841 KB)

    There are differences between failure rates obtained from test results, and failure rates obtained from the failure rate models. In some cases, failure rates obtained from failure rate models are 10 to 50 times larger (worse) than failure rates obtained through testing of the same devices. This indicates that the available failure rate models need some modification. It is not the intent of this pa... View full abstract»

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  • 1985 Annual Reliability and Maintainability Symposium

    Publication Year: 1984, Page(s): 212
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  • Reliability of Liquid Crystal Display

    Publication Year: 1984, Page(s):213 - 218
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (973 KB)

    This paper reports the reliability of twisted nematic liquid-crystal display for basic applications such as watches and calculators. We have studied significant stress factors such as voltage, temperature and humidity, and their corresponding failure modes. The main failure mode is LCD misalignment; many different modes appear corresponding to different stress conditions as well as material and pr... View full abstract»

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  • Manuscripts Received

    Publication Year: 1984, Page(s): 218
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  • Practical Kalman Filter Software Performance Testing & Validation

    Publication Year: 1984, Page(s):219 - 226
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1305 KB)

    Several tests are described which can be used for any Kalman-type filter/smoother computer program. These tests are demonstrated by a case history on a large dimensional Kalman filter/smoother program which implements a 34-state inertial navigation system dynamic error model. The execution of a large dimensional Kalman filter/smoother (KFS) on real measurement data does not represent a software te... View full abstract»

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  • A Statistical Model for Combining Biased Expert Opinions

    Publication Year: 1984, Page(s):227 - 232
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1035 KB)

    A statistical model is developed to combine subjective estimates of an unknown parameter. The maximum likelihood estimator is a weighted geometric mean of adjusted estimates, each being adjusted to remove certain s-biases. The mean-square error of this estimator is compared to that of an unweighted geometric mean of unadjusted estimates; under the assumed model, this unweighted estimator is inferi... View full abstract»

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  • Manuscripts Received

    Publication Year: 1984, Page(s): 232
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  • Empirical Bayes Approach to Reliability Estimation for the Exponential Distribution

    Publication Year: 1984, Page(s):233 - 236
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (637 KB)

    In the empirical Bayes (EB) approach to a reliability estimation for the exponential distribution, a prior distribution is placed on the family of prior gamma distributions to produce an EB estimator. The EB estimator is asymptotically optimal and admissible. The results of a Monte Carlo study are presented to demonstrate the favorable risk behavior of the EB estimator as a Bayes estimator if the ... View full abstract»

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  • Manuscripts Received

    Publication Year: 1984, Page(s): 236
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  • Minimum Distance Estimation of the Three Parameters of the Gamma Distribution

    Publication Year: 1984, Page(s):237 - 240
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (686 KB)

    Procedures have been investigated to establish robust, adaptive estimating techniques for the 3-parameter Gamma distribution, The procedures incorporate minimum distance statistics for determining the location parameter for a range of sample sizes and shape parameters. Seven new estimators were developed of which six incorporate minimum distance estimation for determining the location parameter or... View full abstract»

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  • Experience with the IEEE Reliability Test System

    Publication Year: 1984, Page(s): 240
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (160 KB)

    First Page of the Article
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  • Modified Goodness-of-Fit Tests for Gamma Distributions with Unknown Location and Scale Parameters

    Publication Year: 1984, Page(s):241 - 245
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (790 KB)

    The common Kolmogorov-Smirnov, Anderson-Darling, and Cramer-von Mises goodness-of-fit tests require continuous underlying distributions with known parameters. This paper gives tables of critical values for these tests for gamma distributions with unknown location and scale parameters and known shape parameters. The powers of these tests are given for a number of alternative distributions. A relati... View full abstract»

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  • On Being Late

    Publication Year: 1984, Page(s): 245
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  • Confidence Intervals for Reliability From Stress-Strength Relationships

    Publication Year: 1984, Page(s):246 - 249
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (606 KB)

    A new distribution-free procedure obtains s-confidence intervals for the reliability in the stress-strength model. Based on the coverage probability and average-length criteria, a simulation study compared the procedure with other methods. Generally the proposed intervals perform best in maintaining nominal coverage probabilities. View full abstract»

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  • Manuscripts Received

    Publication Year: 1984, Page(s): 249
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  • Minimal Cuts up to Third Order in a Planar Graph

    Publication Year: 1984, Page(s):250 - 256
    Cited by:  Papers (2)  |  Patents (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1192 KB)

    This paper presents a new algorithm to determine all minimal cuts up to third order that isolate some sink node from all source nodes in a planar graph. The algorithm has the advantage of having a linear complexity, which makes the problem tractable as opposed to path oriented methods, where path determination grows exponentially with the size of the graph. This algorithm can be used when the size... View full abstract»

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  • Queuing Network Models for Aircraft Availability and Spares Management

    Publication Year: 1984, Page(s):257 - 262
    Cited by:  Papers (14)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1009 KB)

    Interactions of major activities involved in airfleet operations, maintenance, and logistics are investigated in the framework of closed queuing networks with finite number of customers. The system is viewed at three levels, namely: operations at the flying-base, maintenance at the repair-depot, and logistics for subsystems and their interactions in achieving the system objectives. Several perform... View full abstract»

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  • Free proceedings

    Publication Year: 1984, Page(s): 262
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu