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Reliability, IEEE Transactions on

Issue 2 • Date June 1983

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Displaying Results 1 - 25 of 44
  • [Front cover]

    Publication Year: 1983 , Page(s): c1
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  • IEEE Reliability Society

    Publication Year: 1983 , Page(s): nil1
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  • [Breaker page]

    Publication Year: 1983 , Page(s): nil1
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  • Quality Policies

    Publication Year: 1983 , Page(s): 129
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  • The Numbers Game

    Publication Year: 1983 , Page(s): 129
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  • Airplane Reliability in a Nutshell

    Publication Year: 1983 , Page(s): 130 - 133
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    This paper briefly covers the terms and procedures used today; in reliability engineering of commercial airplanes. View full abstract»

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  • Manuscripts Received

    Publication Year: 1983 , Page(s): 133
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  • Symbolic Reliability Analysis with the Aid of Variable-Entered Karnaugh Maps

    Publication Year: 1983 , Page(s): 134 - 139
    Cited by:  Papers (8)
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    A method for finding the symbolic reliability of a moderately complex system is presented. The method uses Bayesian decomposition to reduce the system into simpler series-parallel subsystems. The successes or failures of these subsystems are found by inspection and then recast into disjoint sum-of-product forms with the aid of the Karnaugh map. Subsequently, an almost minimal disjoint expression for the system success or failure is obtained with the aid of a variable-entered Karnaugh map (VEKM). This VEKM method is illustrated by applying it to some examples recently solved in the literature. The main advantage of the method is the pictorial insight it provides to the reliability analyst. View full abstract»

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  • Manuscripts Received

    Publication Year: 1983 , Page(s): 139
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  • Fault Tree Synthesis From a Directed Graph Model for a Power Distribution Network

    Publication Year: 1983 , Page(s): 140 - 149
    Cited by:  Papers (8)
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    The Lapp-Powers fault tree synthesis algorithm is applied to an electrical power distribution network and the cut sets are derived for a sustained loss of power on one busbar. This algorithm is based on a directed graph (digraph) representation of the system, in contrast with the method of Camarda, et al. which is based on a reliability graph. The digraph model forces an explicit evaluation of the corrective actions (negative feedback and negative feed forward) that are taken to counteract disturbances which enter the network. The presentation is tutorial and shows the disciplined application of fault-tree synthesis operators. View full abstract»

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  • Free proceedings

    Publication Year: 1983 , Page(s): 149
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  • Interval Reliability for Initiating and Enabling Events

    Publication Year: 1983 , Page(s): 150 - 163
    Cited by:  Papers (9)
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    This paper describes generation and evaluation of logic models such as fault trees for interval reliability. Interval reliability assesses the ability of a system to operate over a specific time interval without failure. The analysis requires that the sequence of events leading to system failure be identified. Two types of events are described: 1) initiating events (cause disturbances or perturbations in system variables) that cause system failure and 2) enabling events (permit initiating events to cause system failure). Control-system failures are treated. The engineering and mathematical concepts are described in terms of a simplified example of a pressure-tank system. Later these same concepts are used in an actual industrial application in which an existing chlorine vaporizer system was modified to improve safety without compromising system availability. Computer codes that are capable of performing the calculations, and pitfalls in computing accident frequency in fault tree analysis, are discussed. View full abstract»

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  • Manuscripts Received

    Publication Year: 1983 , Page(s): 163
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  • Automatically Controlled 2-Vessel Pressure-Cooker Test-Equipment

    Publication Year: 1983 , Page(s): 164 - 167
    Cited by:  Papers (3)
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    A highly accelerated humidity test for plastic encapsulated IC reliability short-term evaluation has been studied. 2-Vessel pressure cooker test (PCT) equipment capable of controlling relative humidity and temperature independently, and of keeping specimens free from water droplet condensation, has been designed. This equipment consists of a test chamber and a vapor chamber. Humidity conditions are set by controlling the temperature difference between the test chamber and the vapor chamber. Humidity levels are controlled with the direct pressure adjustment. The whole test chamber is heated in an oven, thereby obtaining temperature stability and uniformity. Using this equipment, humidity tests were carried out on plastic molded ICs. As a result, good test reproducibility and excellent correlation in test results between PCT and conventional humidity test such as 85°C/85%RH, were obtained. As a consequence, it was found possible, in a short time, to evaluate plastic molded IC reliability quantitatively in humidity ambients using this 2-vessel PCT equipment. This equipment can be used for quality assurance testing of plastic-encapsulated ICs in a short time. View full abstract»

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  • Correspondence Items

    Publication Year: 1983 , Page(s): 167
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  • Voltage-Testing of Thin-film Capacitors

    Publication Year: 1983 , Page(s): 168 - 169
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    The influence of proof-test voltage and testing time on the working-life distribution of thin film capacitors is presented. The proof-test not only eliminates capacitors with low breakdown voltage, it decreases the working life of the remaining components. A short proof-test is proposed to avoid degrading the remaining components. The test method for estimating the distribution parameters is presented. View full abstract»

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  • A Pruned Tree Approach to Reliability Computation

    Publication Year: 1983 , Page(s): 170 - 174
    Cited by:  Papers (4)
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    This paper presents a new algorithm for computing network terminal reliability from a set of paths or cut-sets. Topics include the general problem, past approaches, the algorithm of this paper, efficiency comparisons with other methods, and extensions to s-dependent failures. An appendix contains a program listing with comments. The algorithm is based on selective generation of relevant states, via mechanisms for choosing and pruning branches of a binary tree. The method is easy to implement and to understand, and has proved in practice to be more efficient than the fastest methods published heretofore. View full abstract»

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  • A New Technique to Optimize System Reliability

    Publication Year: 1983 , Page(s): 175 - 182
    Cited by:  Papers (8)
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    This paper describes an algorithm for solving reliability optimization problems formulated as nonlinear binary programming problems with multiple-choice constraints. These constraints stand for restrictions in which only one variable is assigned to each subset making up the set; thus, they are expressed by equations whose r.h.s. is unity. Different types of methods for achieving high reliability (an increase in component reliability, parallel redundancy, standby redundancy, etc.) can be easily used simultaneously as design alternatives for each subsystem. In order to solve the problem effectively, the Lawler & Bell algorithm is improved by introducing a new lexicographic enumeration order which always satisfies the multiple-choice constraints. The function for obtaining feasible solutions which give first ~ L-th minimum values of the objective function is added to the algorithm in order to make it more useful for decision making. After a numerical example assists in understanding the algorithm, the computational efficiency is compared with that of the Lawler & Bell algorithm. View full abstract»

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  • Manuscripts Received

    Publication Year: 1983 , Page(s): 182
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  • Modules in Coherent Multistate Systems

    Publication Year: 1983 , Page(s): 183 - 185
    Cited by:  Papers (8)
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    Modules in s-coherent multistate systems are presented as an extension of the binary concept of Birnbaum and Esary. A consequence of this extension is that any subset of the system components can be considered a module. Thus a measure of desirability or usefulness is important. One such measure is suggested along with modular decompositions. General definitions of k-out-of-n: G systems and dual systems are given. Several theorems relating these to modules are presented. View full abstract»

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  • Manuscripts Received

    Publication Year: 1983 , Page(s): 185
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  • Program of the IEEE IAS Power System Reliability Subcommittee

    Publication Year: 1983 , Page(s): 186 - 187
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    The IEEE Industry Application Society is active in the reliability area. Some of its recent activities are given in this letter. More information on the IAS can be obtained from the IEEE or the author. View full abstract»

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  • Historical Reference Material Is Available Sanford Rosenthal, San Diego

    Publication Year: 1983 , Page(s): 187
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    First Page of the Article
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  • Steady-State Availability of k-out-of-n:G System with Single Repair

    Publication Year: 1983 , Page(s): 188 - 190
    Cited by:  Papers (7)
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    This paper presents a solution and computer program for steady-state availability of a k-out-of-n:G system with single repair. Techniques and methodologies are commonly treated in text books to solve one and two element availabilities. This paper provides both the solution for k-out-of-n system availability and a FORTRAN source program for calculating the availability. The managers of mass transit and computer systems can put n elements on line with the assurance that, on the average, at least k elements will actually be available to complete the mission. View full abstract»

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  • Book Reviews

    Publication Year: 1983 , Page(s): 190
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
Way Kuo
City University of Hong Kong