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IEEE Transactions on Reliability

Issue 3 • Date Aug. 1982

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Displaying Results 1 - 25 of 39
  • [Front cover]

    Publication Year: 1982, Page(s): c1
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  • IEEE Reliability Society

    Publication Year: 1982, Page(s): nil1
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  • [Breaker page]

    Publication Year: 1982, Page(s): nil1
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  • Save In His Own Country

    Publication Year: 1982, Page(s): 225
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  • Reliability Engineering

    Publication Year: 1982, Page(s): 225
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  • Special Issue on Reliability of Photovoltaic Devices & Systems Preface

    Publication Year: 1982, Page(s):226 - 227
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  • Photovoltaic Module Reliability Improvement through Application Testing and Failure Analysis

    Publication Year: 1982, Page(s):228 - 234
    Cited by:  Papers (13)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (5504 KB)

    Field experience obtained through photovoltaic test and application experiments sponsored by the US Department of Energy has offered an opportunity for solar cell module reliability assessment and improvement. Through a formal problem/failure reporting and analysis system, field problems have been identified and characterized. The causes of field failures have been analyzed with respect to environ... View full abstract»

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  • Performance of Experimental Terrestrial Photovoltaic Modules

    Publication Year: 1982, Page(s):235 - 245
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (8517 KB)

    During the years 1977-1980, MIT Lincoln Laboratory (LL) placed over 11 000 photovoltaic (PV) modules at experimental PV power generating systems in a number of field test sites in the United States. Prominent among these are a 100 kW system at Natural Bridges National Monument in Utah, a 25 kW system at Mead, Nebraska, and a 15 kW system at Bryan, Ohio. The modules used in each of these systems we... View full abstract»

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  • Landmarks in R&M Engineering: 17 On Seeking Help

    Publication Year: 1982, Page(s): 245
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  • Photovoltaic Array Reliability Optimization

    Publication Year: 1982, Page(s):246 - 251
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1183 KB)

    Several statistical reliability studies have been conducted in areas of photovoltaic component design covering cell failure, interconnect fatigue, glass breakage and electrical insulation breakdown. This paper integrates the results from these studies and draws general conclusions relative to optimal reliability features for modules. The analysis is based on designing for specified low levels of c... View full abstract»

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  • Book Review

    Publication Year: 1982, Page(s): 251
    Cited by:  Papers (1)
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  • Qualification Testing of Flat-Plate Photovoltaic Modules

    Publication Year: 1982, Page(s):252 - 257
    Cited by:  Papers (12)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1251 KB)

    The placement of photovoltaic modules in various applications, in climates and locations throughout the world, results in different degrees and combinations of environmental and electrical stress. Early detection of module reliability deficiencies via laboratory testing is necessary for achieving long, satisfactory field service. This overview paper describes qualification testing techniques being... View full abstract»

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  • Accelerated Stress Testing of Terrestrial Solar Cells

    Publication Year: 1982, Page(s):258 - 265
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1480 KB)

    The development of an accelerated test schedule for terrestrial solar cells is described. This schedule, based on anticipated failure modes deduced from a consideration of IC failure mechanisms, involves bias-temperature testing, humidity testing (including both 85-85 and pressure cooker stress), and thermal-cycle thermal-shock testing. Results are described for 12 different unencapsulated cell ty... View full abstract»

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  • Book Review

    Publication Year: 1982, Page(s): 265
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  • Investigating Reliability Attributes of Silicon Photovoltaic Cells: An Overview

    Publication Year: 1982, Page(s):266 - 269
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (808 KB)

    Reliability attributes are being developed on a wide variety of advanced single-crystal silicon solar cells. Two separate investigations: cell-contact integrity (metal-to-silicon adherence), and cracked cells identified with fracture-strength-reducing flaws are discussed. In the cell-contact-integrity investigation, analysis of contact pull-strength data shows that cell types made with different m... View full abstract»

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  • Manuscripts Received

    Publication Year: 1982, Page(s): 269
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  • Environmental Testing of Single-Crystal Silicon Solar Cells with Screen-Printed Silver Contacts

    Publication Year: 1982, Page(s):270 - 275
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (995 KB)

    This paper presents the results of five different environmental tests conducted on solar cells with screen-printed contacts. Different stress levels are indicated in the results, and conclusions about the witnessed degradation relative to glass content and cell processing are drawn. Two of the five tests the thermal cycles with and without humidity proved ineffective. The remaining tests thermal s... View full abstract»

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  • From The Editors

    Publication Year: 1982, Page(s): 275
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  • Stability Analysis of Cr-MIS Solar Cells

    Publication Year: 1982, Page(s):276 - 280
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (841 KB)

    The 50 Å Cu/30 Å Cr/20 Å SiO,/Si solar cell structure has been analyzed by Auger, ESCA and ellipsometer measurements. An oxidation-reduction failure mechanism has been proposed for shelf-life degradation, and experimental evidence for such behavior is presented. The effect of this degradation is a decrease in the oxide thickness at the interface bringing about a photovoltaic performance degrada... View full abstract»

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  • Stability of Amorphous Silicon Solar Cells

    Publication Year: 1982, Page(s):281 - 284
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (736 KB)

    The present situation on the stability of amorphous silicon solar cells is discussed. Impurity diffusion is not expected to be a problem in normal cell operation. Interface contamination degrades Schottky barrier or MIS cells that are exposed to water vapor, but has no influence on p-i-n or n-i-p cells. Optically induced changes in the amorphous silicon have an influence, depending on cell structu... View full abstract»

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  • From The Editors

    Publication Year: 1982, Page(s): 284
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  • A Technique for Determining Solar Irradiance Deficits

    Publication Year: 1982, Page(s):285 - 288
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (782 KB)

    A novel analytic technique, involving the use of computer-assisted data-reduction techniques, has been developed to determine the variation of solar irradiance from long-term averages. The objective of the study was to develop a tool that would enable solar system designers to assess and improve overall system reliability by determining the amount of backup and/or storage capability required to su... View full abstract»

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  • Free proceedings

    Publication Year: 1982, Page(s): 288
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  • Reliability Terminology and Formulae for Photovoltaic Power Systems

    Publication Year: 1982, Page(s):289 - 295
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1293 KB)

    Photovoltaic (PV) solar energy systems operate in a unique environment compared with most electronic and electrical power generation systems. The input stimulus, solar radiation, is both highly variable and noncontrollable. This presents a certain amount of difficulty in measuring and reporting reliability, maintainability, and availability characteristics. Many of the terms, definitions, and perf... View full abstract»

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  • Book Review

    Publication Year: 1982, Page(s): 295
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Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu